IR-drop Reduction Through Combinational Circuit Partitioning

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IR-drop Reduction Through Combinational

Circuit Partitioning
Hai Lin, Yu Wang, Rong Luo, Huazhong Yang, and Hui Wang
EE Department, Tsinghua University, Haidian District
Beijing, 100084, P.R. China
{linhai99, wangyuu99}@mails.tsinghua.edu.cn,
{luorong, yanghz, wangh}@tsinghua.edu.cn

Abstract. IR-drop problem is becoming more and more important.


Previous works dealing with power/ground (P/G) network peak current reduction to reduce the IR-drop problem only focus on synchronous
sequential logic circuits which consider the combinational parts as unchangeable [4],[5]. However, some large combinational circuits which
work alone in one clock cycle can create large current peaks and induce considerable IR-drops in the P/G network. In this paper, we propose a novel combinational circuit IR-drop reduction methodology using
Switching Current Redistribution (SCR) method. A novel combinational
circuit partitioning method is proposed to rearrange the switching current in dierent sub-blocks in order to reduce the current peak in the
P/G network, while circuit function and performance are maintained.
Experimental results show that, our method can achieve about 20% average reduction to the peak currents of the ISCAS85 benchmark circuits.
Keywords: IR-drop, circuit partitioning, Static Timing Analysis.

Introduction

With technology stepping into submicron region, circuit design for single-chip
integration of more complex, higher speed, and lower supply voltage systems has
made the on-chip signal-integrity (SI) problem to be a tough task. Among all
the sources of SI problem, the dynamic voltage drop caused mainly by Ldi/dt
and IR-drop draws much attention in recent years.
As the supply voltage goes down continuously, ignoring the dynamic voltage
drop through supply networks will cause run-time errors on real chips. These
errors may include that transistors may not turn on with an unexpected voltage drop, and a timing constraint violation because of a delay increase of the
standard gates with lower supply voltage. Some publications have already paid
attention to reduce the voltage variation on P/G network for all kinds of purposes. Early publications focus directly on the optimization of the P/G network
of the circuit, such as supply wire sizing [1] and P/G network decoupling capacitance (DC) insertion [2], [3] strategies. However as the technology feature


This work was sponsored in party by NSFC under grants #90207001 and #90307016.

J. Vounckx, N. Azemard, and P. Maurine (Eds.): PATMOS 2006, LNCS 4148, pp. 370381, 2006.
c Springer-Verlag Berlin Heidelberg 2006


IR-drop Reduction Through Combinational Circuit Partitioning

371

scales down, such eorts become insucient and suer from the drawback of
large on-chip resource occupation.
In recent years, a few researchers have focused on the optimization of the logic
blocks of the circuit[4],[5]. In publication [5], a synchronous digital circuit is rst
divided into clock regions and then these regions are assigned with dierentphase clocks, in this case the author tried to spread the original simultaneous
switching activities on the time axis to reshape the switching current waveform
and reduce the current peak.
However, those algorithms using clock as the controlling signal to distribute
the switching activity have an essential defect. As mentioned in [4], these algorithms lack the ability to control combinational circuit. Even in sequential
circuits, the combinational part which triggered by ip-ops works alone in one
clock cycle and draw corresponding currents from power network. When these
combinational parts are large enough, the current peak created by one single
combinational part is quite considerable. This problem cannot be settled by
algorithms dealing with clock skew assignment.
In this paper, we present our IR-drop reduction method in combinational
circuits. And the paper mainly has three contributions:
1. We derive a formal problem denition of IR-drop reduction in the combinational circuits and propose a novel combinational circuit IR-drop reduction
methodology using Switching Current Redistribution (SCR) method based on
circuit partitioning.
2. We give out a combinational circuit decomposition algorithm with better
circuit slack utility to support our SCR method. Combinational block is partitioned into sub-graphs based on a new partitioning criterion called slack subgraph partitioning to rearrange the switching time of dierent parts. STA tool
is used to insure the original timing constraints and critical paths, in this way
the exact logic function and the highest working frequency are both preserved.
3. A simple and proper additional delay assignment strategy is proposed. Then
we compare some methods which modify the decomposed circuits to redistribute
the switching current while the logical function and the performance constraints
of the circuit are maintained.
The paper is organized as follows. The denition of combinational circuit IRdrop reduction problem is proposed in Section 2. Our novel circuit decomposition
method is presented in Section 3. In Section 4 we present the additional delay
assignment and the exact circuit modication strategy to achieve the additional
delay. The implementation and experimental results are shown and analyzed in
Section 5. In Section 6, we give the conclusion.

2
2.1

Problem Denition of Combinational Circuit IR-drop


Reduction
Preliminary

Our research focuses on gate level combinational circuits. At the gate level, a
combinational circuit can be represented by a directed acyclic graph (DAG),

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H. Lin et al.

G=(V, E). A vertex vV represents a CMOS transistor network which realizes a single output logic function (a logic gate), while an edge(i; j)E, i, jV
represents a connection from vertex i to vertex j.
We dene three attributes for every vertex vV, they are , the arrival time
ta (v), the required time treq (v), and the slack time tslk (v). The arrival time ta (v)
is the worst case signal transfer time from the primary inputs to vertex v. treq (v)
is the latest time the signal needs to arrive at vertex v. We dene them as:


t0 given time of arrival if v is the primary input

ta (v) =

max

if anin(v)

{ta (i) + d(i)} otherwise

(1)

ta (v) if v is the virtual output

treq (v) =

min

if anin(v)

{treq (i) d(v)} otherwise

(2)

The signal propagation delay of a vertex d(v) can be respectively represented as:
d(v) =

KCL VDD
(VDD VT H )

(3)

Where CL and VT H are the output load capacitance and the transistor threshold
voltage of the gate, respectively; K and are technology dependent constants.
The slack time of a gate v is dened as the dierence of its arrival time and
required time.
(4)
tslk (v) = treq (v) ta (v)
The slack time of a gate v represents the timing laxity of the graph at this point.
The performance will not be harmed if a circuit modication still maintains the
tslk (v) 0. We can call it a slack time limitation.
If we dene a working frequency, the critical path of the circuits is constituted
by the set of gates that has the minimum slack time value. And with the highest
working frequency, this minimum slack value is zero. Our analysis focuses on the
highest working frequency situation to ensure the original best performance of
the circuit.
2.2

Problem Denition

The IR-drop V (t) under a certain input can be represented as:



Iv (t, inputv , ta (v), d(v))) RP/G
V (t) = I(V, t) RP/G = (

(5)

vV

Where RP/G is the P/G network resistance; I(V,t) is the current of the combinational circuits; Iv is the switching current of the individual gate v V , which
is determined by its input state inputv , input signal arrival time ta (v) and propagation delay d(v). From the equation (5), we can modify Iv through ta (v) and
d( v) in order to minimize the current peak of the combinational circuit. However

IR-drop Reduction Through Combinational Circuit Partitioning

373

if we adjust every gate to get the optimal result, the IR-drop reduction problem
will be unacceptably dicult.
As a result, in our method the combinational circuit G=(V, E) is partitioned
into independent blocks Gsub = G1 , G2 , , Gn in order to simplify the IR-drop
problem. Thus the IR-drop can have an alternative denition as below:

(t, inputk , Ta,k , Dk ) RP/G


(6)
V (t, Gk , Dk ) =

1kn

Where Ik is the switching current of block Gk = (Vk , Ek ),Gk G , 1 k n;


inputk is the input state of block Gk ; Ta,k = {ta (vi n), vin Vk } and Dk =
{d(vin ), vin Vk } are the arrival time set and the propagation delay set for
all the input vertexes of block Gk respectively. Therefore we only need to modify
the delay value of all the input vertexes of the independent blocks to redistribute
the switching current. Thus the IR-drop reduction problem of a combinational
circuit can be dened as:


min max {V (t, Gk , Dk )}
(7)
Gk ,Dk

while satises the circuit performance constraints:


ta (m) = 0, m Primary input, m V
ta (u) + d(u) Tcritical , u Primary input, u V
ta (i) + d(i) ta (j), (i, j) E, i, j V
where Tcritical is the delay of the circuit critical path.
2.3

Switching Current Distribution Methodology

As in the problem denition, the IR-drop reduction problem can not be easily
solved. Based on circuit partition we presented our own method to solve the
problem in a smart way of combinational blocks switching current distribution.
wI / wt
12

Original circuit
Modified circuit

-4

-8

-12

(a) Current amplitude comparison (b) di/dt comparison


Fig. 1. Switching current redistribution

time

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H. Lin et al.

Shown by Fig. 1, if the combinational circuit are partitioned into two independent blocks without signal dependence, their switching current can be adjusted
independently, by separate the switching time of the two blocks the current peak
can be considerably reduced. Moreover, as mentioned above, the Ldi/dt noise is
becoming signicant in the P/G network. To smooth the currents waveforms in
this way may also help reduce such noise when inductance of the P/G network is
considered (see Fig. 1). We call this Switching Current Redistribution. To achieve
this specic partitioning goal, we present a new algorithm combining static timing analysis (STA) information into the partitioning algorithm and make sure to
maintain the critical paths after partitioning to ensure the circuit performance.
And a simple and proper additional delay time assignment method is proposed
to realize the redistribution of the switching current of dierent blocks.

Combinational Circuit Partitioning Method

The combinational circuit should be partitioned into independent blocks. These


blocks should have no signal dependence between each other and their switching
current can be modied independently to reduce the total switching current
peak of the circuit. However, traditional partitioning algorithms [8], [9] are not
capable for this specic partitioning requirement. First, traditional partitioning
algorithms focus mainly on mini-cut or weighted mini-cut, while our partitioning
requires awareness of signal independent characteristics of each block. Second,
random assignment and element exchanging strategy in traditional partitioning
algorithms can easily break critical paths of a combinational circuit. We develop
our partitioning algorithm through which the critical paths are not cut o or
modied in order to preserve original performance.
We rst propose a concept of slack sub-graph. A sub-graph is called slack
sub-graph if and only if all of its vertexes (gates) are of non-zero slack time at
highest working frequency situation. And on the contrary, sub-graphs that consist of all zero slack time vertexes are dened as critical sub-graphs. According
to this denition, critical sub-graphs consist of all the critical paths. If we only
modify the slack sub-graphs under the timing constraints-all vertexes obey the
slack time limitation discussed in the preliminary part, then the original critical
paths in the circuit will not be aected, which conditionally satisfy our requirement of the independence characteristics between sub-graphs. Therefore our
algorithm proposed a way to divide the combinational circuit into slack subgraphs (GSLK ) and critical sub-graphs (GCRI ) which are independent under the
timing constraints obtained by STA.
With the denition of slack sub-graph, our specic partitioning process is
expressed as below:
Combinational-circuit-partitioning (G)
1 Perform STA to G and get the slack time of all the vertexes;
2 VCRI = {v | tslk (v) = 0};
3 Get all the critical edges ECRI ;
4 GCRI = (VC RI, ECRI ); // construct the critical block

IR-drop Reduction Through Combinational Circuit Partitioning

375

5 VSLK = V VCRI ;
6 While ( VSLK not empty)
Begin while:
vi VSLK ; //randomly choose a vertex vi
Get all the vertexes connected with vi in VSLK , and put them in set VSLK (i);
Get all the edges generated by vertexes in VSLK (i), and put them in set ESLK (i);
GSLK (i) = ( VSLK (i), ESLK (i)); // construct a slack sub graph
VSLK = VSLK VSLK (i);
End while;
7 Return Gsub = {GCRI , {GSLK (i)}}; // return the independent blocks

Therefore, we obtain two kinds of blocks. One independent block consists of


GCRI s, which should not be modied in order to maintain the circuit performance. We consider this block as critical block. And we obtain the other kind of
independent blocks- slack blocks, consists of GSLK (i) s. The Switching Current
Redistribution can be implemented through modications of GSLK (i) s. From
our partitioning algorithm, at least one slack block can be obtained. And always,
the slack blocks whose size is comparable to the critical block are targeted to be
modied, in this way we can achieve a high eciency of current redistribution.

Strategy of Switching Current Redistribution

After circuit decomposition, it is important to modify the targeted slack blocks


so as to redistribute their currents. Our attempt can be illustrated in Fig. 2.
For combinational circuits, there is no controlling signal like clock, so referring
to equation (6), the slack block current I(VSLK , t) is determined by Ta,SLK ,
DSLK . Thus in our method, we modify the input vertexes delay in the slack
block to modify the switching time of this block. We articially delay the input
signal transferring from the input to the next stage , in this way the switching
time of this block is controlled. A simple and eective delay time assignment
method is proposed to determine the amount of additional time that the input
signal should be delayed.

Fig. 2. Modify the input gates through two strategies

376

4.1

H. Lin et al.

Additional Delay Assignment

Currents of dierent blocks are estimated using a simplied switching current


estimation model similar with the one used in [10]. The switching current model
of every logic gate is represented as a production of the switching activity
multiplied by the current waveform which is modeled as a trapezoid starting from
the earliest possible switch time of the gate and ends at the latest. The trapezoid
wave model is derived from the gates original switching current waveform -a
i
(t) for gate i is
triangle representation. (see Fig. 3). The current model Imodel
presented as follow, is the switching activity of gate i.
i

(t) = Igi
(t)
Imodel

(8)

The total current from one slack block is the sum of all the gates current
within it. And we can easily calculate the peak when we actually store the
current waveform by discrete value at each time interval.
We perform a simple but practical additional delay time assignment strategy
to achieve a considerable large reduction in the switching current peak of the
combinational circuit.
Here, we propose the experimental based assignment of the articial additional
delay value of input gate in every targeted sub-graph. We assign the additional
delay of input vertex to the amount of its slack time to form the initial solution
SOLDLY , so that we may spread more switching current to the entire circuit
switching period and reduce the overlapping of switching currents of critical block
and the targeted slack blocks. Then a small nearby region search for better solution of this assignment is made based on the evaluation of Ipeak . Experimental results show that little change of the initial solution is needed and this
simple and practical additional delay assignment strategy can appropriately redistribute the switching current of the blocks, utilize the total circuit switching
period more equably and reduce the peak current of the whole circuit to a considerably lower value.
The circuit performance is maintained since the critical block is not changed
and the slack blocks are adjusted following the timing constraints. In the slack
time assignment, slack information is extracted by our STA tool [7]. The nal
delay time information of each input gate is saved in specic data le for circuit
modication procedure.
4.2

Additional Delay Achievement

One practical strategy to realize in circuit the additional delay insertion is to


change the transistor threshold voltage VT H of the input gates so as to change
d(v) of them. Referring to equation (3), signal transfer delay of a logic gate
is related to the threshold voltage of its transistors and the adequate threshold voltage can be calculated according to the required delay. However, as the
threshold values of transistors can not be continuously changed in reality and are
often xed to several threshold levels in multi-threshold design due to process

IR-drop Reduction Through Combinational Circuit Partitioning

I'gi(t)

delay

377

current model waveform for gate i

I'peak=

t2
t1
latest possible sw itch time
earliest possible sw itch time

delay
t2-t1

Ipeak

time

Igi(t)
Ipeak

actual switch current waveform of gate i

delay
t3
a possible sw itch time in application

tim e

I'gi(t)=0 0 0 0 0 0 1 2 3 4 4 4 4 4 4 4 4 4 4 4 4 4 4 3 2 1 0 0 0 0 0 0 0
Igi(t)=0 0 0 0 0 0 0 0 0 1 2 3 4 3 2 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0

Fig. 3. Current model for logic gate

limitation, it is necessary to adjust VT H of input gates to acceptable discrete


values.
Therefore, here we propose a three-level discrete VT H assignment to achieve
the additional delay.
Discrete VT H assignment
1 Set discrete VT H value: VT HO , VT HO + VT HL , VT HO + VT HH ;
2 Read the required additional delay di for vi , vi input vertexes of slack blocks;
3 Vinput ={vi | vi input vertexes of slack blocks}
4 While (Vinput ! = )
Begin while:
Random select vi Vinput ,
VT H =f(di ) //calculate actual VT H required for gate i according to equation(3)
Set VT H : if 0 VT H < VT HL , VT H = 0
if VT HL VT H < VT HH , VT H = VT HL
Else if VT HH VT H
(1) Set VT H = VT HH
(2) d = d(VT H ) d(VT HH ) Calculate the delay dierence caused by VT H and
VT HH ;
(3) Get all the output vertexes of vi , assign d information to all them and put them
in set Vo ut; //propagate the overow delay to the next stage.
End while;

As in our experiment we are using TSMC 0.18m standard cell library for
simulation, the three discrete VT H values are set to VT HO , VT HO + VT HL and
VT HO + VT HH . VT HO is the library determining original transistor threshold
voltage. And in our experiment, we set VT HL = 0.2V , VT HH = 0.4V . In
reality, the actual discrete values can be determined by process limitation. First
of all, the input gate is assigned one of the discrete VT H values that is just below
the calculated value. Then, if the required additional delay exceed the maximum
value that can be achieved by a single input gate, the overow delay would be
assigned to gates in the following stage of the slack block. In our experiment, we

378

H. Lin et al.

only allow two stages of the slack block to be modied (input stage and the stage
following that) to reduce the modication complexity. The simulation result of
this circuit modication strategy is presented in Table.1 and compared to buer
insertion strategy.
Buer insertion strategy is a backup strategy for multi-threshold strategy, and
reduces the fabrication process cost. Instead of change d(v) of the input gates,
specialized buers are inserted right after original input gates, thus change the
arrival time of the other gates in the slack block. However, this strategy has two
major drawbacks: additional area occupation and more power dissipation. Thus
we consider using it only if we can not use the multi-threshold strategy.

Implementation and Experimental Results

The implementation of our algorithm can be illustrated in Fig. 4. Our gate level
netlists are synthesized using Synopsys Design Compiler and a TSMC 0.18m
standard cell library. The DAG extraction and customized circuit partitioning
procedure have been implemented in C++ under a customized STA environment
according to the TSMC standard cell delay library. We implemented a small tool
to automatically generate the modied gate list including the delay time assignment and the two circuit modication strategies. Both the original and modied
circuits are simulated using HSPICE with TSMC 0.18m CMOS process and a
1.67V supply condition. The P/G network is modeled as RC network.
As our algorithm focuses on the redistribution of switching current from logic
blocks, the architecture of P/G network model does not have much inuence in

Gate level
netlist

Customized STA
tool

DAG
extraction

TSMC delay
library

Customed Circuit
partition program
Multilevel
threshold
strategy
Delay buffer
insertion
strategy

Circuit
modification
strategy
Modified gate
level netlist

Spice input
converting
program
Spice input
file

Tsmc18.cdl

Tsmc18core.lib
tsmc18.lb

Hspice
simulation

Fig. 4. Implementation procedure

Output
result

IR-drop Reduction Through Combinational Circuit Partitioning

379

the peak current reduction ability. We actually compared the simulation results
from the circuit with simple model(single R and C) and complex model(multiple
R and C connected as a mesh) of P/G network in several circuits. It shows that
the detailed waveform of the current is changing slightly with the P/G network
variation but the reduction rate remains approximately the same (see Fig. 5).
As a result, in our simulation we simply model the P/G network as a 100
resistance connected between VDD and the logic block, and a capacitance of
0.3pf parallel connected to the logic block to reduce the simulation complexity.
We apply the proposed method to ISCAS85 benchmark circuits and all the
circuits are simulated with large number of random input vectors. And we are
running the program on a PC with P4 2.6GHz and 512M memory.
We show in Fig. 5 the transient on-chip current waveform in one processing
cycle of the modied circuit compared with the original circuit of C1355 simulated with both simple P/G network and complex P/G network. As we expected,
the current waveform of both unmodied (gures above) and modied (gures
below) circuit with complex P/G network (dotted line) are dierent from the
ones with simple P/G network (real line). However the peak current reduction
rate remains approximately the same. And comparing the waveforms with the
same P/G model, we can nd that the current curves with single peak in one processing cycle change into curves with two or more lower swing peaks after circuit
modication. Thus the switching current of the two major kinds of blocks (the
slack blocks and the critical block ) is actually separated and the peak current of
the circuit is signicantly reduced.
Table.1 shows the current peak reduction results of both multi-threshold and
buer insertion strategies. We can see that the reduction of current peak varies
with the circuit structures, from 15% up to 33% by multi-threshold and from
12% up to 32% by buer insertion, which are very impressive. The circuits with
more slack to be utilized get a better optimization result through our algorithm.

Fig. 5. Simulation current waveforms of C1355

380

H. Lin et al.
Table 1. Comparison of the multi-threshold and buer insertion strategies

ISCAS85 Original
Circuit

Multi-VT H

Buer insertion

Average
Average
Ipeak
Average
Ipeak
Area Overload
Ipeak (mA) Ipeak (mA) Reduction Ipeak (mA) Reduction (Nbuf /Ntotalgates )
C432
C499
C880
C1355
C1908
C2670
C3540
C5315
C6288
C7552

2.45
4.27
3.05
4.21
3.96
3.68
2.78
4.94
4.78
5.26

average

2.08
2.98
2.28
3.01
3.07
2.95
2.27
3.29
3.87
4.43

15%
31%
25%
29%
22%
20%
18%
33%
19%
16%
23%

2.15
3.01
2.31
2.85
3.04
2.98
2.33
3.75
3.98
4.46

12%
29%
24%
32%
23%
19%
16%
24%
17%
15%

6/160
14/202
38/383
22/545
31/880
49/1269
84/1669
170/2307
119/2416
201/3513

21%

Here, we comment that the algorithm would have a limit of applicability if the
slack blocks have too little slack amount to be utilize, which would be very rare
for functional combinational circuits. Even in that case, we suggest a circuit slow
down be induced to achieve more slack utility if reducing switching current peak
is the most urgent problem for a application.
Although the peak current reduction is nearly the same, the average current
of the circuit shows that buer insertion strategy induces more on-chip current
besides the draw back of on chip area overload due to the insertion of buers.
Some other strategies, such as gate sizing or transistor stacking, can also be considered in order to avoid large addition current meanwhile achieve the equivalent
required delay.

Conclusions

IR-drop reduction is becoming essential in deep submicron circuit design today.


The ecient reduction methodology needs to be improved imperatively. In this
paper, we have presented a novel methodology for IR-drop reduction in combinational circuits through circuit partitioning and switching current redistribution.
The original circuit is partitioned into independent blocks and the switching
time of the blocks is carefully arranged to ensure that switching current redistribution is achieved for IR-drop reduction. The additional delay assignment
and insertion is achieved without aecting the circuit performance under timing
constraints. The experimental results for ISCAS85 benchmark circuits show an
average current peak reduction on P/G network around 20%. The only drawback
of this switching current redistribution method is that as the slack in the circuit
is used for current redistribution, the circuit is going to lose some tolerance ability to process variations which aect the path delay. As the statistic eect on

IR-drop Reduction Through Combinational Circuit Partitioning

381

physical design is becoming not neglectableto induce a slight circuit slow down
or to maintain a certain amount of the original slack according to the specic
manufacturing technique would be both applicable in order to insure a process
variation tolerance ability. Since our method does not have any performance loss
and do not require modications on P/G network or circuit clock trees, it can
be used with other commonly used methods such as P/G network DC insertion
and clock skew assignment in synchronous circuits to achieve further reduction
ability of on-chip IR-drop.

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