8K/16K 5.0V Microwire Serial EEPROM: Features

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93C76/86

8K/16K 5.0V Microwire Serial EEPROM

FEATURES PACKAGE TYPES

• Single 5.0V supply DIP Package


• Low power CMOS technology
- 1 mA active current typical
• ORG pin selectable memory configuration CS 1 8 VCC

93C76/86
1024 x 8- or 512 x 16-bit organization (93C76) CLK 2 7 PE
2048 x 8- or 1024 x 16-bit organization (93C86) 3 6 ORG
DI
• Self-timed ERASE and WRITE cycles DO 4 5 VSS
(including auto-erase)
• Automatic ERAL before WRAL
• Power on/off data protection circuitry SOIC Package
• Industry standard 3-wire serial I/O
• Device status signal during ERASE/WRITE cycles
1 8
VCC

93C76/86
• Sequential READ function CS
CLK 2 7 PE
• 10,000,000 ERASE/WRITE cycles guaranteed
DI 3 6 ORG
• Data retention > 200 years
DO 4 5 VSS
• 8-pin PDIP/SOIC package
• Temperature ranges supported
- Commercial (C): 0°C to +70°C BLOCK DIAGRAM
- Industrial -40°C to +85°C
- Automotive (E) -40°C to +125°C
VCC VSS
DESCRIPTION
Memory Address
The Microchip Technology Inc. 93C76/86 are 8K and
Array Decoder
16K low voltage serial Electrically Erasable PROMs.
The device memory is configured as x8 or x16 bits
depending on the ORG pin setup. Advanced CMOS
technology makes these devices ideal for low power Address
non-volatile memory applications. These devices also Counter
have a Program Enable (PE) pin to allow the user to
write protect the entire contents of the memory array.
The 93C76/86 is available in standard 8-pin DIP and 8- Data Output
Register Buffer
DO
pin surface mount SOIC packages.
DI

Mode
PE Decode
CS Logic

Clock
CLK
Generator

Microwire is a registered trademark of National Semiconductor Incorporated.

 1996 Microchip Technology Inc. Preliminary DS21132C-page 1

This document was created with FrameMaker 4 0 4


93C76/86
1.0 ELECTRICAL 1.2 AC Test Conditions
CHARACTERISTICS
AC Waveform:
1.1 Maximum Ratings* VLO = 2.0V

VCC ...................................................................................7.0V
VHI = Vcc - 0.2V (Note 1)
All inputs and outputs w.r.t. VSS ............... -0.6V to Vcc +1.0V VHI = 4.0V for (Note 2)
Storage temperature ..................................... -65˚C to +150˚C
Ambient temp. with power applied................. -65˚C to +125˚C
Soldering temperature of leads (10 seconds) ............. +300˚C Timing Measurement Reference Level
ESD protection on all pins................................................4 kV Input 0.5 VCC
*Notice: Stresses above those listed under “Maximum ratings” Output 0.5 VCC
may cause permanent damage to the device. This is a stress rat-
ing only and functional operation of the device at those or any
Note 1: For VCC ≤ 4.0V
other conditions above those indicated in the operational listings 2: For VCC > 4.0V
of this specification is not implied. Exposure to maximum rating
conditions for extended periods may affect device reliability

TABLE 1-1: PIN FUNCTION TABLE

Name Function
CS Chip Select
CLK Serial Data Clock
DI Serial Data Input
DO Serial Data Output
VSS Ground
ORG Memory Configuration
PE Program Enable
VCC Power Supply

TABLE 1-2: DC CHARACTERISTICS


Applicable over recommended operating ranges shown below unless otherwise noted:
VCC = +4.5V to +5.5V
Commercial (C): Tamb = 0°C to -40°C
Industrial (I): Tamb = -40°C to +85°C
Automotive (E): Tamb = -40°C to +125°C
Parameter Symbol Min. Max. Units Conditions
High level input voltage VIH1 2.0 VCC +1 V —
Low level input voltage VIL1 -0.3 0.8 V —
Low level output voltage VOL1 — 0.4 V IOL = 2.1 mA; VCC = 4.5V
VOL2 — 0.2 V IOL =100 µA; VCC = 4.5V
High level output voltage VOH1 2.4 — V IOH = -400 µA; VCC = 4.5V
VOH2 VCC-0.2 — V IOH = -100 µA; VCC = 4.5V.
Input leakage current ILI -10 10 µA VIN = 0.1V to VCC
Output leakage current ILO -10 10 µA VOUT = 0.1V to VCC
Pin capacitance CINT — 7 pF (Note Note:)
(all inputs/outputs) Tamb = +25˚C, FCLK = 1 MHz
Operating current ICC write — 3 mA FCLK = 2 MHz; VCC = 5.5V
ICC read — 1.5 mA FCLK = 2 MHz; VCC = 5.5V
Standby current ICCS — 100 µA CLK = CS = 0V; VCC = 5.5V
Note: This parameter is periodically sampled and not 100% tested.

DS21132C-page 2 Preliminary  1996 Microchip Technology Inc.


93C76/86
TABLE 1-3: AC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted:
VCC = +4.5V to +5.5V
Commercial (C): Tamb = 0°C to -40°C
Industrial (I): Tamb = -40°C to +85°C
Automotive (E): Tamb = -40°C to +125°C
Parameter Symbol Min. Max. Units Conditions
Clock frequency FCLK — 2 MHz Vcc ≥ 4.5V
Clock high time TCKH 300 — ns
Clock low time TCKL 200 — ns
Chip select setup time TCSS 50 — ns Relative to CLK
Chip select hold time TCSH 0 — ns
Chip select low time TCSL 250 — ns Relative to CLK
Data input setup time TDIS 100 — ns Relative to CLK
Data input hold time TDIH 100 — ns Relative to CLK
Data output delay time TPD — 400 ns CL = 100 pF
Data output disable time TCZ — 100 ns (Note 1)
Status valid time TSV — 500 ns CL = 100 pF
Program cycle time TWC — 10 ms ERASE/WRITE mode (Note 2)
TEC — 15 ms ERAL mode
TWL — 30 ms WRAL mode
Endurance — 10M — cycles 25°C, VCC = 5.0V, Block Mode
(Note 3)
Note 1: This parameter is periodically sampled and not 100% tested.
2: Typical program cycle is 4 ms per word.
3: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific appli-
cation, please consult the Total Endurance Model which can be obtained on our BBS or website.
TABLE 1-4: INSTRUCTION SET FOR 93C76: ORG=1 (X16 ORGANIZATION)

Instruction SB Opcode Address Data In Data Out Req. CLK Cycles


READ 1 10 X A8 A7 A6 A5 A4 A3 A2 A1 A0 — D15 - D0 29
EWEN 1 00 1 1 X X X X X X X X — High-Z 13
ERASE 1 11 X A8 A7 A6 A5 A4 A3 A2 A1 A0 — (RDY/BSY) 13
ERAL 1 00 1 0 X X X X X X X X — (RDY/BSY) 13
WRITE 1 01 X A8 A7 A6 A5 A4 A3 A2 A1 A0 D15 - D0 (RDY/BSY) 29
WRAL 1 00 0 1 X X X X X X X X D15 - D0 (RDY/BSY) 29
EWDS 1 00 0 0 X X X X X X X X — High-Z 13
TABLE 1-5: INSTRUCTION SET FOR 93C76: ORG=0 (X8 ORGANIZATION)

Req. CLK
Instruction SB Opcode Address Data In Data Out
Cycles
READ 1 10 X A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — D7 - D0 22
EWEN 1 00 1 1 X X X X X X X X X — High-Z 14
ERASE 1 11 X A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — (RDY/BSY) 14
ERAL 1 00 1 0 X X X X X X X X X — (RDY/BSY) 14
WRITE 1 01 X A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 D7 - D0 (RDY/BSY) 22
WRAL 1 00 0 1 X X X X X X X X X D7 - D0 (RDY/BSY) 22
EWDS 1 00 0 0 X X X X X X X X X — High-Z 14

 1996 Microchip Technology Inc. Preliminary DS21132C-page 3


93C76/86
TABLE 1-6: INSTRUCTION SET FOR 93C86: ORG=1 (X16 ORGANIZATION)

Instruction SB Opcode Address Data In Data Out Req. CLK Cycles


READ 1 10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — D15 - D0 29
EWEN 1 00 1 1 X X X X X X X X — High-Z 13
ERASE 1 11 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — (RDY/BSY) 13
ERAL 1 00 1 0 X X X X X X X X — (RDY/BSY) 13
WRITE 1 01 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 D15 - D0 (RDY/BSY) 29
WRAL 1 00 0 1 X X X X X X X X D15 - D0 (RDY/BSY) 29
EWDS 1 00 0 0 X X X X X X X X — High-Z 13
TABLE 1-7: INSTRUCTION SET FOR 93C86: ORG=0 (X8 ORGANIZATION)

Instruction SB Opcode Address Data In Data Out Req. CLK Cycles


READ 1 10 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — D7 - D0 22
EWEN 1 00 1 1 X X X X X X X X X — High-Z 14
ERASE 1 11 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 — (RDY/BSY) 14
ERAL 1 00 1 0 X X X X X X X X X — (RDY/BSY) 14
WRITE 1 01 A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0 D7 - D0 (RDY/BSY) 22
WRAL 1 00 0 1 X X X X X X X X X D7 - D0 (RDY/BSY) 22
EWDS 1 00 0 0 X X X X X X X X X — High-Z 14

DS21132C-page 4 Preliminary  1996 Microchip Technology Inc.


93C76/86
2.0 PRINCIPLES OF OPERATION low all programming operations. Execution of a READ
instruction is independent of both the EWEN and
When the ORG pin is connected to VCC, the x16 orga- EWDS instructions.
nization is selected. When it is connected to ground, the
x8 organization is selected. Instructions, addresses 2.4 Data Protection
and write data are clocked into the DI pin on the rising
edge of the clock (CLK). The DO pin is normally held in During power-up, all programming modes of operation
a high-Z state except when reading data from the are inhibited until VCC has reached a level greater than
device, or when checking the READY/BUSY status dur- 1.4V. During power-down, the source data protection
ing a programming operation. The READY/BUSY sta- circuitry acts to inhibit all programming modes when
tus can be verified during an Erase/Write operation by VCC has fallen below 1.4V.
polling the DO pin; DO low indicates that programming The EWEN and EWDS commands give additional pro-
is still in progress, while DO high indicates the device is tection against accidentally programming during nor-
ready. The DO will enter the high impedance state on mal operation.
the falling edge of the CS.
After power-up, the device is automatically in the
2.1 START Condition EWDS mode. Therefore, an EWEN instruction must be
performed before any ERASE or WRITE instruction can
The START bit is detected by the device if CS and DI be executed.
are both HIGH with respect to the positive edge of CLK
for the first time.
Before a START condition is detected, CS, CLK, and DI
may change in any combination (except to that of a
START condition), without resulting in any device oper-
ation (READ, WRITE, ERASE, EWEN, EWDS, ERAL,
and WRAL). As soon as CS is HIGH, the device is no
longer in the standby mode.
An instruction following a START condition will only be
executed if the required amount of opcode, address
and data bits for any particular instruction are clocked
in.
After execution of an instruction (i.e., clock in or out of
the last required address or data bit) CLK and DI
become don't care bits until a new start condition is
detected.

2.2 DI/DO
It is possible to connect the Data In and Data Out pins
together. However, with this configuration it is possible
for a “bus conflict” to occur during the “dummy zero” that
precedes the READ operation, if A0 is a logic HIGH
level. Under such a condition the voltage level seen at
Data Out is undefined and will depend upon the relative
impedances of Data Out and the signal source driving
A0. The higher the current sourcing capability of A0, the
higher the voltage at the Data Out pin.

2.3 Erase/Write Enable and Disable


(EWEN, EWDS)
The 93C76/86 powers up in the Erase/Write Disable
(EWDS) state. All programming modes must be pre-
ceded by an Erase/Write Enable (EWEN) instruction.
Once the EWEN instruction is executed, programming
remains enabled until an EWDS instruction is executed
or VCC is removed from the device. To protect against
accidental data disturb, the EWDS instruction can be
used to disable all Erase/Write functions and should fol-

 1996 Microchip Technology Inc. Preliminary DS21132C-page 5


93C76/86
3.0 DEVICE OPERATION the least significant 8 or 9 address bits are don’t care
bits, depending on selection of x16 or x8 mode. Clock-
3.1 READ ing of the CLK pin is not necessary after the device has
entered the self clocking mode. The ERAL instruction is
The READ instruction outputs the serial data of the guaranteed at Vcc = +4.5V to +5.5V.
addressed memory location on the DO pin. A dummy
The DO pin indicates the READY/BUSY status of the
zero bit precedes the 16 bit (x16 organization) or 8 bit
device if the CS is high. The READY/BUSY status will
(x8 organization) output string. The output data bits will
be displayed on the DO pin until the next start bit is
toggle on the rising edge of the CLK and are stable after
received as long as CS is high. Bringing the CS low will
the specified time delay (TPD). Sequential read is pos-
place the device in standby mode and cause the DO pin
sible when CS is held high and clock transitions con-
to enter the high impedance state. DO at logical “0” indi-
tinue. The memory address pointer will automatically
cates that programming is still in progress. DO at logical
increment and output data sequentially.
“1” indicates that the entire device has been erased and
3.2 ERASE is ready for another instruction.
The ERAL cycle takes 15 ms maximum (8 ms typical).
The ERASE instruction forces all data bits of the spec-
ified address to the logical “1” state. The self-timed pro- 3.5 Write All (WRAL)
gramming cycle is initiated on the rising edge of CLK as
the last address bit (A0) is clocked in. At this point, the The WRAL instruction will write the entire memory array
CLK, CS, and DI inputs become don’t cares. with the data specified in the command. The WRAL
cycle is completely self-timed and commences on the
The DO pin indicates the READY/BUSY status of the
rising edge of the last address bit (A0). Note that the
device if the CS is high. The READY/BUSY status will
least significant 8 or 9 address bits are don’t cares,
be displayed on the DO pin until the next start bit is
depending on selection of x16 or x8 mode. Clocking of
received as long as CS is high. Bringing the CS low will
the CLK pin is not necessary after the device has
place the device in standby mode and cause the DO pin
entered the self clocking mode. The WRAL command
to enter the high impedance state. DO at logical “0” indi-
does include an automatic ERAL cycle for the device.
cates that programming is still in progress. DO at logical
Therefore, the WRAL instruction does not require an
“1” indicates that the register at the specified address
ERAL instruction but the chip must be in the EWEN sta-
has been erased and the device is ready for another
tus. The WRAL instruction is guaranteed at Vcc = +4.5V
instruction.
to +5.5V.
The ERASE cycle takes 3 ms per word (Typical).
The DO pin indicates the READY/BUSY status of the
3.3 WRITE device if the CS is high. The READY/BUSY status will
be displayed on the DO pin until the next start bit is
The WRITE instruction is followed by 16 bits (or by 8 received as long as CS is high. Bringing the CS low will
bits) of data to be written into the specified address. place the device in standby mode and cause the DO pin
The self-timed programming cycle is initiated on the ris- to enter the high impedance state. DO at logical “0” indi-
ing edge of CLK as the last data bit (D0) is clocked in. cates that programming is still in progress. DO at logical
At this point, the CLK, CS, and DI inputs become don’t “1” indicates that the entire device has been written and
cares. is ready for another instruction.
The DO pin indicates the READY/BUSY status of the The WRAL cycle takes 30 ms maximum (16 ms typical).
device if the CS is high. The READY/BUSY status will
be displayed on the DO pin until the next start bit is
received as long as CS is high. Bringing the CS low will
place the device in standby mode and cause the DO pin
to enter the high impedance state. DO at logical “0” indi-
cates that programming is still in progress. DO at logical
“1” indicates that the register at the specified address
has been written and the device is ready for another
instruction.
The WRITE cycle takes 3 ms per word (Typical).

3.4 Erase All (ERAL)


The ERAL instruction will erase the entire memory
array to the logical “1” state. The ERAL cycle is identical
to the ERASE cycle except for the different opcode. The
ERAL cycle is completely self-timed and commences
on the rising edge of the last address bit (A0). Note that

DS21132C-page 6 Preliminary  1996 Microchip Technology Inc.


93C76/86
FIGURE 3-1: SYNCHRONOUS DATA TIMING
VIH
CS TCSS TCKH TCKL
VIL
VIH TCSH
CLK
VIL TDIH
TDIS
VIH
DI
VIL
TPD TCZ
VOH TPD
DO
(Read) VOL TCZ
TSV
VOH
DO
(Program) VOL STATUS VALID

The memory automatically cycles to the next register.

FIGURE 3-2: READ


TCSL
CS

CLK

DI 1 1 0 AN ... A0

HIGH IMPEDANCE ... ...


DO 0 DN D0 DN D0

FIGURE 3-3: EWEN


EWEN TCSL
CS

CLK

DI 1 0 0 1 1 X ... X

ORG=VCC, 8 X’s
ORG=VSS, 9 X’s

FIGURE 3-4: EWDS


TCSL
CS

CLK

DI 1 0 0 0 0 X ... X
ORG=VCC, 8 X’s
ORG=VSS, 9 X’S

 1996 Microchip Technology Inc. Preliminary DS21132C-page 7


93C76/86
FIGURE 3-5: WRITE

CS STANDBY

CLK

DI 1 0 1 AN ... A0 DN ... D0
TCZ
HIGH IMPEDANCE
DO BUSY READY

TWC

FIGURE 3-6: WRAL

CS STANDBY

CLK

DI 1 0 0 0 1 X ... X DN ... D0
TCZ
HIGH IMPEDANCE BUSY READY
DO

ORG=VCC, 8 X’s
TWL
ORG=VSS, 9 X’s Guarantee at Vcc = +4.5V to +5.5V.

FIGURE 3-7: ERASE

CS STANDBY

CLK

DI 1 1 1 AN ... ... A0

TCZ
HIGH IMPEDANCE
DO BUSY READY

TWC

DS21132C-page 8 Preliminary  1996 Microchip Technology Inc.


93C76/86
FIGURE 3-8: ERAL

CS STANDBY

CLK

DI 1 0 0 1 0 X ... X
TCZ
HIGH IMPEDANCE
DO BUSY READY

TEC
ORG=VCC, 8 X’s
ORG=VSS, 9 X’s Guarantee at VCC = +4.5V to +5.5V.

4.0 PIN DESCRIPTIONS Table 1-7 for more details). CLK and DI then become
don't care inputs waiting for a new start condition to be
4.1 Chip Select (CS) detected.

A HIGH level selects the device. A LOW level deselects


Note: CS must go LOW between consecutive
the device and forces it into standby mode. However, a
instructions, except when performing a
programming cycle which is already initiated will be
sequential read (Refer to Section 3.1 for
completed, regardless of the CS input signal. If CS is
more detail on sequential reads).
brought LOW during a program cycle, the device will go
into standby mode as soon as the programming cycle 4.3 Data In (DI)
is completed.
CS must be LOW for 250 ns minimum (TCSL) between Data In is used to clock in a START bit, opcode,
consecutive instructions. If CS is LOW, the internal con- address, and data synchronously with the CLK input.
trol logic is held in a RESET status.
4.4 Data Out (DO)
4.2 Serial Clock (CLK) Data Out is used in the READ mode to output data syn-
The Serial Clock is used to synchronize the communi- chronously with the CLK input (TPD after the positive
cation between a master device and the 93C76/86. edge of CLK).
Opcode, address, and data bits are clocked in on the This pin also provides READY/BUSY status information
positive edge of CLK. Data bits are also clocked out on during ERASE and WRITE cycles. READY/BUSY sta-
the positive edge of CLK. tus information is available when CS is high. It will be
CLK can be stopped anywhere in the transmission displayed until the next start bit occurs as long as CS
sequence (at HIGH or LOW level) and can be continued stays high.
anytime with respect to clock HIGH time (TCKH) and
4.5 Organization (ORG)
clock LOW time (TCKL). This gives the controlling mas-
ter freedom in preparing opcode, address, and data. When ORG is connected to VCC, the x16 memory orga-
CLK is a “Don't Care” if CS is LOW (device deselected). nization is selected. When ORG is tied to VSS, the x8
If CS is HIGH, but START condition has not been memory organization is selected. There is an internal
detected, any number of clock cycles can be received pull-up resistor on the ORG pin that will select x16 orga-
by the device without changing its status (i.e., waiting nization when left unconnected.
for START condition).
4.6 Program Enable (PE)
CLK cycles are not required during the self-timed
WRITE (i.e., auto ERASE/WRITE) cycle. This pin allows the user to enable or disable the ability
After detection of a start condition the specified number to write data to the memory array. If the PE pin is
of clock cycles (respectively LOW to HIGH transitions of floated or tied to VCC, the device can be programmed.
CLK) must be provided. These clock cycles are If the PE pin is tied to VSS, programming will be inhib-
required to clock in all opcode, address, and data bits ited. There is an internal pull-up on this device that
before an instruction is executed (see Table 1-4 through enables programming if this pin is left floating.

 1996 Microchip Technology Inc. Preliminary DS21132C-page 9


93C76/86
NOTES:

DS21132C-page 10 Preliminary  1996 Microchip Technology Inc.


93C76/86
93C76/86 Product Identification System
To order or obtain information, e.g., on pricing or delivery, please use the listed part numbers, and refer to the factory or the listed
sales office.

93C76/86 – \P
Package: P = Plastic DIP (300 mil Body), 8-lead
SN = Plastic SOIC (150 mil Body), 8-lead

Temperature Blank = 0°C to +70°C


Range: I = -40°C to +85°C
E = -40°C to +125°C

Device: 93C76/86 Microwire Serial EEPROM


93C76T/86T Microwire Serial EEPROM (Tape and Reel)

Sales and Support


Products supported by a preliminary Data Sheet may possibly have an errata sheet describing minor operational differences and
recommended workarounds. To determine if an errata sheet exists for a particular device, please contact one of the following:
1. Your local Microchip sales office (see below)
2. The Microchip Corporate Literature Center U.S. FAX: (602) 786-7277
3. The Microchip’s Bulletin Board, via your local CompuServe number (CompuServe membership NOT required).
Please specify which device, revision of silicon and Data Sheet (include Literature #) you are using.
For latest version information and upgrade kits for Microchip Development Tools, please call 1-800-755-2345 or 1-602-786-7302.

DS21132C-page 11 Preliminary  1996 Microchip Technology Inc.


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All rights reserved.  1996, Microchip Technology Incorporated, USA. 11/96


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of patents or other intellectual property rights arising from such use or otherwise. Use of Microchip’s products as critical components in life support systems is not autho-
rized except with express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, under any intellectual property rights. The Microchip logo and
name are registered trademarks of Microchip Technology Inc. All rights reserved. All other trademarks mentioned herein are the property of their respective companies.

DS21132C-page 12 Preliminary  1996 Microchip Technology Inc.

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