Characterization of Low Loss Waveguides Using Bragg Gratings
Characterization of Low Loss Waveguides Using Bragg Gratings
Characterization of Low Loss Waveguides Using Bragg Gratings
Abstract—A novel approach is developed for measuring small than 0.1 dB/m were fabricated by wafer bonding a thermal ox-
losses in highly transparent Si3 N4 /SiO2 waveguides on a silicon ide layer as the upper cladding and resulted in a waveguide
chip. The approach is particularly applicable to waveguides written with ultra-low confinement and reduced scattering losses at the
by high-resolution patterning techniques, such as e-beam lithog-
raphy, whose lengths cannot be easily increased beyond several core-cladding interfaces [3]. Ring resonators with high quality
centimeters. This method is based on measuring the transmission factor Q > 106 have also been fabricated in low loss waveg-
of an optical cavity formed by two highly reflective (R at least 0.999) uides and often have been used to extract the loss coefficient in
simple Bragg gratings and a uniform waveguide between the two these waveguides [4], [11]–[13]. Applications of ultra-low loss
gratings whose length can be varied to increase the loss fitting ac- waveguides are envisioned in optical gyroscopes [14]–[16], dis-
curacy. A theoretical model based on an ABCD matrix method is
developed and used for the final loss value fitting. Experimentally, persion compensation [17], in packet-switched networks [18],
a cavity with extinction ratio over –70 dB and quality factor Q optical filters [19]–[22], optomechanical sensing [4], [11], [23],
= 1.02×106 is realized. The fitting results show a waveguide loss [24] and in astrophotonics [25]–[30].
of 0.24 ± 0.01 dB/cm and a grating loss of 0.31 ± 0.01 dB/cm. The major sources of loss in waveguides are material ab-
These results are obtained with relatively high index contrast (Δn sorption, bending loss, and light scattering. An efficient and
> 0.001) gratings with 0.1-pm wavelength scanning resolution.
It is expected that with better design and wavelength scanning reliable method to measure these losses is critical for the design
technique, this approach is applicable more generally to measure of many photonic integration applications. In the past decades,
waveguide loss coefficients as low as 0.001 dB/cm. the most used loss measurement techniques are based on ei-
Index Terms—Optical planar waveguides, gratings, waveguide ther length variation method (fabricating waveguides of differ-
filters, optical losses. ent lengths) or ring resonator method (deriving waveguide loss
from its relationship with cavity Q). In this work, we have devel-
oped a new approach for characterizing small losses in highly
I. INTRODUCTION transparent Si3 N4 /SiO2 waveguides on silicon. It relies on mea-
OW loss dielectric waveguides are critical for many ap- suring the transmission of an on-chip Fabry-Perot (FP) cavity
L plications in integrated photonics. Several groups have
demonstrated low propagation loss waveguides [1]–[10]. In fact,
formed by two Bragg gratings and a straight waveguide between
them. Indeed, additional scattering loss will be introduced by
losses as small as 0.1 dB/m and 0.9 dB/m have now been re- these Bragg gratings. However, with a proper design, it does
ported in weakly and strongly confined waveguides, respectively not compromise loss measurement accuracy (see Section V-A).
[3], [5], [11]. Ultra-low losses in long waveguides (> 1 m) have Compared with the length variation method, this approach is
been measured using a coherent optical frequency domain re- particularly applicable to waveguides written by EBL whose
flectometry technique [3], [5]. The waveguides with losses less lengths cannot be easily extended beyond several centimeters.
Compared with the ring resonator method, this approach uses a
Manuscript received November 28, 2017; revised April 3, 2018; accepted FP cavity which is formed on a straight structure. Therefore it
April 3, 2018. Date of publication April 16, 2018; date of current version May
18, 2018. This work was supported in part by W. M. Keck Foundation, and in part does not involve bending loss, and can operate equally well for
by the National Science Foundation under Grant AST1711377. (Corresponding optical modes with any confinement factor. Moreover, different
author: Mario Dagenais.) with other loss measurement methods based on FP cavity [31],
Y.-W. Hu, Y. Zhang, and M. Dagenais are with the Department of Electrical
and Computer Engineering, University of Maryland, College Park, MD 20742 [33], we use highly reflective (R > 0.999) integrated gratings as
USA (e-mail:,[email protected]; [email protected]; [email protected]). the cavity mirror and a more precise numerical fitting procedure,
P. Gatkine is with the Department of Astronomy, University of Maryland, which gives much higher loss measurement accuracy (around
College Park, MD 20742 USA (e-mail:,[email protected]).
S. Veilleux is with the Department of Astronomy, University of Maryland, 0.01 dB/cm in our experiment).
College Park, MD 20742 USA, and also with the Joint Space-Science Institute, The paper is organized as follows: Section II discusses wave-
University of Maryland, College Park, MD 20742 USA (e-mail:, veilleux@ guide design and fabrication. In Section III, the physics model
astro.umd.edu).
J. Bland-Hawthorn is with the Sydney Institute for Astronomy, School of and theoretical fitting process are introduced. In Section IV, we
Physics, University of Sydney, Sydney, NSW 2006, Australia (e-mail:, jbh@ first measure waveguide propagation loss by analyzing several
physics.usyd.edu.au). Si3 N4 /SiO2 waveguides of different lengths. After recognizing
Color versions of one or more of the figures in this paper are available online
at http://ieeexplore.ieee.org. the limitation of this approach, we characterize the waveguide
Digital Object Identifier 10.1109/JSTQE.2018.2827663 loss again using our new approach. In Section V, we demonstrate
1077-260X © 2018 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission.
See http://www.ieee.org/publications standards/publications/rights/index.html for more information.
6101508 IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, VOL. 24, NO. 4, JULY/AUGUST 2018
Fig. 5. TE propagation loss after annealing. The measurement is done with Fig. 6. PSBG grating experimental (black solid line) and theoretical fit-
the same sample in Fig. 4, after 2 hour annealing in 1150C. ting (dashed lines) results. In (a) and (c), the wavelength range is 4 nm.
In (b) and (d), the wavelength range is 20 pm. Fitting parameters: (1558
nm) n 1 = 1.47584, n 2 = 1.47691; Δn = 0.00107, κ = 10.81 cm−1 , stop-
platforms [38], [39], and they are generally attributed to O-H, band width Δλ = 0.563 nm. (1629 nm) n 1 = 1.47171, n 2 = 1.47273; Δn =
0.00102, κ = 9.85 cm−1 , Δλ = 0.561 nm.
N-H, Si-H bonds in the two materials. These peaks can be largely
removed by annealing at high temperature, as shown in Fig. 5. TABLE I
It can also be seen that the measurement error increased after PSBG (CENTERED AT 1629 NM) FINE FITTING RESULTS FOR FIG. 6
annealing. A possible reason is that the annealing process in-
troduced larger coupling efficiency fluctuation among different
waveguides. This is also a main disadvantage of this loss mea-
surement method, whose measurement error depends not only
on the waveguide fabrication stability, but also on the coupling
efficiency stability.
a
B. π Phase Shifted Bragg Grating The center peak intensity is the maximum transmission the center peak can reach. The
center peak intensity will be exactly 0 dB if both the grating loss α g and cavity loss α c
As we can see, the previous method shows a measurement are 0.
b
The linewidth measured in experiment is 2.2 pm.
error of at least 0.1 dB/cm, which is undesirable for current low
loss waveguide. Now we used two PSBG to demonstrate the plotted another two fitting curves with ± 0.1 dB/cm in Fig. 6,
loss fitting at two different wavelengths, 1558 and 1629 nm, and the fitting accuracy can actually reach about ± 0.01 dB/cm with
compare with the loss obtain in IV. A. 0.1 pm wavelength resolution, as shown in Table I.
The fitting process is as follows: first, we scale and shift the in- For the 1629 nm PSBG, the narrowest linewidth we can get
dex profile to fit the stopband position and width; next we adjust is 2.2 pm, corresponding to a Q ∼ 7.4 × 105 . The extinction
grating loss αg to find the best fitting curve, as shown in Fig. 6. ratio (ER) of the 1558 nm grating is 50 dB, and that of the
The fitting parameters are also shown in the caption. An impor- 1629 nm grating is 60 dB (limited to 50 dB in measurement by
tant criteria is that we must use the same wavelength dependent the uncoupled fiber input light). It implies a single side mirror
effective index profile for the fitting curves. The 1558 nm PSBG reflection R ∼ 0.999 around 1629 nm.
has a larger index contrast than the 1629 nm PSBG because the
shorter wavelength mode is more confined and more sensitive
C. Bragg Grating Fabry-Perot Cavity
with width variation.
From the theoretical fit, we get grating loss αg = 0.64 dB/cm We can extract the grating loss from the PSBG sample.
at 1558 nm and αg = 0.31 dB/cm at 1629 nm. Although we only However, we still cannot tell the exact straight waveguide
HU et al.: CHARACTERIZATION OF LOW LOSS WAVEGUIDES USING BRAGG GRATINGS 6101508
Fig. 8. The enlarged figure for BGFP transmissions. Red, blue and green lines
Fig. 7. Experimental and simulation curves for Bragg grating cavity with denotes cavity loss α c = 0.14 dB/cm, 0.24 dB/cm and 0.34 dB/cm. Grating loss
length (a) 1 mm, (b) 3 mm and (c) 6 mm. For the blue simulation curve, we α g is set as 0.4 dB/cm. (a) 1 mm cavity with linewidth 2.0 pm. (b) 3 mm cavity
use grating loss 0.41 dB/cm and cavity (straight waveguide) loss 0.24 dB/cm. with linewidth 1.8 pm. (c) 6 mm cavity with linewidth 1.6 pm. Note that the
The wavelength range is 4 nm in all four panels. The y axes are set to be legend in (a) also holds for (b) and (c). The x range are all 8 pm, y axes are set
the same. Fitting parameters: n 1 = 1.47860, n 2 = 1.47979; Δn = 0.00119, to be the same.
κ = 11.5 cm−1 , Δλ = 0.649 nm.
TABLE II
BGFP (CENTERED AT 1625.8 NM) FINE FITTING RESULTS FOR FIG. 8
loss. We fabricated three additional Bragg gratings with cen-
ter length 1 mm, 3 mm and 6 mm. Thus, the transmission
contains the information from both αg and αc . The fitting pro-
cess is similar to that of the PSBG, and the results are shown
in Fig. 7.
In this BGFP sample we kept the grating design parame-
ters the same as for the PSBG sample. However, ER can reach
−70 dB in experiment and −80 dB by fitting. A one-side mirror
reflectivity R ∼ 0.9999 is achieved. There are two reasons that
we get higher ER than in Fig. 6. First, we increase the offset
between the input and the output waveguides to reduce the back-
ground light intensity; secondly, we have higher index contrast
Δn due to a slightly thicker LPCVD Si3 N4 layer, which can be
confirmed in the Δn fitting parameters (0.00119 vs 0.00102). V. FURTHER DISCUSSIONS
In the enlarged plots of Fig. 8, it can be seen clearly that the
longer cavity leads to a narrower linewidth, consistent with our A. Loss Reduction
expectations. The best Q we get is 1.02 × 106 ∼ δλ = 1.6 pm. As shown in Fig. 2(b), there exists some obvious roughness
To our knowledge, this is the best Q obtained with on-chip Bragg along waveguide boundaries, which is our device’s dominant
gratings. From Table II, we can see that the resolution is still loss source. The roughness comes from e-beam lithography and
around ± 0.01 dB/cm. lift-off process, but the latter probably plays a more important
We also studied the effective cavity length Leff [illustrated role. In future work, we plan to use lift-off resist (LOR) or a
in Fig. 2(a)] of BGFP. From Fig. 7, we measured the FSR negative resist [11] to reduce the edge roughness and thereafter
for each cavity. They are 0.481 nm, 0.234 nm and 0.129 nm, the loss.
which corresponds to Leff = 1.86 mm, 3.82 mm and 6.93 mm, Another loss term in our measurement is the scattering loss
respectively. The difference between Leff and L0 is quite stable, due to mode mismatch at the interface between the straight
about 0.8-0.9 mm, which is favorable to design specific FSR waveguide and the grating. This loss will become more influ-
cavities. ential if higher width contrast grating is used. However, it can
6101508 IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, VOL. 24, NO. 4, JULY/AUGUST 2018
TABLE III
12 MM BGFP MODELING RESULTS RELATED WITH FIG. 9
C. Lower κ Grating
Another direction to optimize our approach is to use a lower κ
grating for getting lower αg . Now our grating κ is about 10 cm−1 .
If we decrease it and increase Lg to keep κLg a constant, we
will also see an improvement in the loss measurement limit.
The underlying physics is that for the center cavity, its peak
linewidth δλ depends only on the loss terms αg , αc , Leff and
grating reflection κLg . As long as κ drops and we extend Lg
to keep the mirror reflectivity the same, the cavity Q will be
Fig. 9. BGFP simulation to demonstrate its potential for measuring very low increased. In experiment, a 1/10 factor decrease (κ = 1 cm−1 )
loss coefficients. We keep the grating loss α g = 0.1 dB/cm, and set the cavity is definitely achievable [20]. Further reduced grating κ might be
loss α c = 0, 0.001 and 0.01 dB/cm.
limited by fabrication stability and accuracy.
Pradip Gatkine received the B.Tech. degree from the Sylvain Veilleux received the B.S. degree in physics
Indian Institute of Technology Bombay, Mumbai, In- from the Université de Montréal, Montréal, QC,
dia, in 2014, and the M.S. degree in astronomy from Canada, in 1984, and the Ph.D. degree in astronomy
the University of Maryland, College Park, MD, USA, from the University of California, Santa Cruz, CA,
in 2016. He is currently working toward the Ph.D. de- USA, in 1989.
gree in astronomy at the University of Maryland. In 1995, he became an Assistant Professor with
His photonic research focuses on the development the Department of Astronomy, University of Mary-
of next generation of astrophotonic instrumentation land, College Park, MD, USA. He was promoted to
for upcoming large telescopes. His current work in- Associate Professor in 2000 and to Full Professor in
volves the development of moderate resolution as- 2005. Since 2003, he has been the Optical Director at
trophotonic arrayed waveguide grating spectrographs Maryland. He is the author of more than 200 refereed
and studying OH-suppression for astronomical telescopes. On the astrophysics articles. His research interests include the physics of active galactic nuclei and
side, he is interested in studying the early universe, especially using gamma- starburst galaxies, particularly the connection between the supermassive black
ray bursts as probes. He is currently working on studying the circumgalactic hole, the starburst, and the host galaxy, and the importance of feedback on
medium in the early universe. He is a member of the International Society of galaxy evolution and the intracluster medium. He is also the lead on a num-
Optics and Photonics and American Astronomical Society. ber of instrumentation projects for large ground-based optical and near-infrared
telescopes with applications for space missions and beyond.
Prof. Veilleux was an NSERC Fellow with the Institute for Astronomy, Hon-
olulu, HI, USA, from 1989 to 1992, and a Hubble Fellow with the National
Optical Astronomy Observatory, Tucson, AZ, USA, from 1992 to 1995. He is
also a Fellow of the Joint Space-Science Institute. He was the recipient of the
NASA Hubble Fellowship, the National Science Foundation CAREER Award,
the Humboldt Prize, the John Simon Guggenheim Memorial Foundation Fel-
lowship, and the Aspen Institute Italia Award.