Ming Deng Metrology Services (Thailand) Co Ltd Certificate No.

: LA-1999-0160-C-1
46 Soi Serithai 81/2
Serithai Road, Kannayao Issue No. : 13
Bangkok 10230 (Thailand)
Date : 18 October 2016

Page : 1 of 42

FIELD OF TESTING : Calibration and Measurement

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

A. Dimensional
1. External Micrometer In-house Procedure MDCP -01 : 2012
0 - 300 mm / 0 - 12 inch BS 870 : 2008 0.5 µm / 20 µinch
>300 - 600 mm / 12 - 2 inch JIS B 7502:1994 1 µm / 40 µinch
>600 - 1000 mm / 24 - 40 inch ISO 3611 : 1978 3 µm / 120 µinch
Flatness BS EN ISO 3611 : 2010 0.3 µm
Parallelism 0.9 µm
(Lab/Site)

2. Caliper In-house Procedure MDCP -02 : 2010

0 - 1000 mm / 40 inch BS 887 : 2008
Resolution JIS B 7507:1993
0.01 mm / 0.0005 inch ISO 3599 : 1976 8 m / 300 inch
0.02 mm / 0.001 inch BS EN ISO 13385-1 : 2011 10 µm / 400 µinch
0.05 mm / 0.002 inch 30 µm / 1200 µinch
(Lab/Site)

3. Depth Micrometer In-house Procedure MDCP -03 : 2010

0 - 300 mm / 12 inch BS 6468:1984 1 m / 40 inch
JIS B 7544:1994

4. Stick Micrometer In-house Procedure MDCP -04 : 2010

0 – 1000 mm BS 959 : 2008 1 m / 40 inch
0 – 40 inch JIS B 7502 : 1994
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 2 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

5. Height Setting Micrometer & In-house Procedure MDCP -05 : 2010

Riser Block ISO 7863:1950
0 - 300 mm / 0 - 12 inch 0.8 m / 31 inch
0 - 600 mm / 0 - 24 inch 1.2 m / 48 inch
Parallelism / lead Screw 0.4 m / 16 inch

6. Caliper Checker In-house Procedure MDCP -06 : 2010

0 - 630 mm / 0 - 24 inch 0.8 m / 31 inch

7. Vernier Height Gauge In-house Procedure MDCP -07 : 2010

0 - 600 mm / 0 - 24 inch BS 1643 : 2008
JIS B 7517:1993
Resolution BS EN ISO 13225 : 2012
0.01 mm / 0.0005 inch 7 m / 280 inch
0.02 mm / 0.001 inch 10 m / 400 inch

8. Vernier Depth Gauge In-house Procedure MDCP -08 : 2010

0 – 600 mm / 0 - 24 inch BS 6365 : 2008 5 m / 200 inch
JIS B 7518:1993
BS EN ISO 13385-2 : 2011

9. Dial Indicator In-house Procedure MDCP -09 : 2010

Up to 100 mm / 0 - 4 inch BS 907 : 2008 0.5 m / 20 inch
AS 2103 :1978
JIS B 7503 :1997
ISO 46 3:2006
DIN 879 :1999
DIN 878 : 2006
ASME/ANSI 89.1.10M: 1987

10. Dial Test Indicator In-house Procedure MDCP -10 : 2010

Up to 3 mm / 0 - 0.02 inch BS 2795 : 1981 0.5 m / 20 inch
JIS B 7533:1990
DIN 2270:1985
AS2103:1978
ASME/ANSI 89.1.10M:1987
BS EN ISO 9493 : 2010
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Date : 18 October 2016 Page : 3 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

11. Digimatic Indicator In-house Procedure MDCP -11 : 2010

(Linear Gauge)
0 - 30 mm / 0 - 1 inch 0.6 m / 10 inch
> 30 - 100 mm / 1 - 4 inch 1.0 m / 15 inch

Resolution
0.01 m 0.04 m
(Lab/Site)

12. Plain Plug Gauge / Pin Gauge In-house Procedure MDCP -12 : 2010
Three Wire BS 969 : 2006 as a guide
JIS B 0271 : 1997
Up to 25 mm / 0 - 1 inch JIS B 7420 : 1997 0.4 m / 15 inch
25 - 100 mm / 1 - 4 inch 0.6 m / 24 inch
100 - 200 mm / 4 - 8 inch 0.8 m / 30 inch
200 - 400 mm / 8 - 16 inch 1.0 m / 40 inch
Circularity 0.06 m / 3 inch

13. Plain Ring Gauge In-house Procedure MDCP -13 : 2010

1 - 25 mm / 0 - 1 inch BS 969 : 2006 as a guide 0.6 m / 24 inch
> 25 - 75 mm / 1 - 3 inch DIN 2250 : 1989 0.6 m / 24 inch
> 75 - 200 mm / 3 - 8 inch BS 4064 : 1966 1 m / 40 inch
Circularity 0.06 m / 3 inch

14. Thread Ring Gauge In-house Procedure MDCP -14 : 2016

> M2.5 - M100 / 0.08 - 4 inch JIS B 0261 : 1992 1.1 m / 43 inch
Up to 6 mm Pitch ISO 1502:1996 1.5 m / 60 inch
>M3x0.5 ISO 3161:1999
FED - STD - H28:1978
JIS B 0251 : 2008
JIS B 0254 : 1985
JIS B 0255 : 1998
ASME/ANSI 1.16M: 1984
BS 919 Part 1 to Part 4 : 2007
BS 84:2007 (continued next page)
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

BS 1580 Part 1: 2007

BS 1580 Part 3 : 2007
BS 3643 Part 1 : 2007
BS 3643 Part 1 : 2007
JIS B 0261 : 2004
Euramet/cg-10/v.01

15. Thread Plug Gauge In-house Procedure MDCP -15 : 2010 0.8 m / 31 inch
> M1 - M100 / 0.04 – 4 inch JIS B 0261 : 2004
ISO 1502:1996
ISO 3161:1999
FED - STD - H28:1978
JIS B 0251 : 2008
JIS B 0252 : 1975
JIS B 0254 : 1985
JIS B 0255 : 1998
ASME/ANSI 1.16M: 1984
BS 919 Part 1 to Part 4: 2007
BS 84:2007
BS 1580 Part 1 : 2007
BS 1580 Part 3 : 2007
BS 3643 Part 1 : 2007
BS 3643 Part 1 : 2007

16. Feeler Gauge In-house Procedure MDCP -16 : 2010

0 - 5 mm / 0 - 0.2 inch JIS B 7524 : 2008 0.4 m / 15 inch
BS 957 : 2008

17. Surface Plate In-house Procedure MDCP -17 : 2012 2.0 m / 80 inch
(Lab/Site) BS 817 : 2008
JIS B 7513 : 1992

18. Profile Projector In-house Procedure MDCP -18 : 2014

0 – 500 mm JIS 7184 : 1999, as a guide 3.0 m
(Lab/Site)

19. Dial Thickness Gauge In-house Procedure MDCP -24 : 2010 2.0 m / 80 inch
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

20. Bore Gauge In-house Procedure MDCP -25 : 2010 1.0 m / 40 inch
JIS B 7515 : 1982

21. Setting Master for Linear In-house Procedure MDCP -26 : 2010 1.3 m / 50 inch
Height Gauge

22. Straight Edge In-house Procedure MDCP -27 : 2010

0 - 1000 mm / 0 - 40 inch BS 5204-2 : 1977 0.8 m / 31 inch

23. Linear Height Gauge In-house Procedure MDCP -29 : 2010

0 - 1000 mm / 40 inch 2.0 m / 80 inch
(Lab/Site)

24. Holtest In-house Procedure MDCP -23 : 2010

0 - 150 mm / 0 - 6 inch DIN 863 : Part 4 : 1999 & 1.0 m / 40 inch
DIN 2250 : Part 1 : 1989, as a guide

25. Universal Length Measuring In-house Procedure MDCP -36 : 2010

Machine 0.3 m
(Lab/Site)

26. Setting Rod In-house Procedure MDCP -34 : 2010

25 - 1000 mm / 1 - 40 inch BS 870 : 1950 0.6 m
JIS B 7502 : 1994
BS EN ISO 3611 : 2010
27. Bevel Protractor In-house Procedure MDCP -39 : 2010
Up to 300 mm / 12 Inch BS 1685 : 2008 1.5 m / 60 inch
0 - 360º 3 min

28. Measuring Microscope In-house Procedure MDCP -22 : 2010 2.0 m

0 – 500 mm JIS B 7153 : 1995
(Lab/Site)

29. Dial Gauge Calibrator In-house Procedure MDCP -40 : 2010

0 - 100 mm / 0 - 40 Inch 0.2 m / 8 inch
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

30. Gauge Block In-house Procedure MDCP -38 : 2010

> 0.5 - 10 mm BS 4311 : Part 1 : 2007 0.06 m / 2 inch
> 10 - 25 mm ISO 3650 : 1998 0.06 m / 2.7 inch
> 25 - 50 mm 0.08 m / 3.1 inch
> 50 - 75 mm 0.09 m / 3.5 inch
> 75 - 100 mm 0.10 m / 3.9 inch
(Dissimilar & Similar Material)
31. Sine Bar In-house Procedure MDCP -21 : 2010
0 - 300 mm / 12 inch JIS B 7523 : 1977 1.5 m / 24 inch

32. Screw Thread Micrometer In-house Procedure MDCP -28 : 2010

0 - 100 mm / 0 - 4 inch BS 870 : 2008 as a guide 1.5 m / 60 inch
BS EN ISO 3611 : 2010
33. Dial Gauge Stand In-house Procedure MDCP -45 : 2010
(Flatness Measurement Face) 0.6 m / 30 inch
(Lab / Site)

34. Layout Measurement In-house Procedure MDCP -37 : 2010

Linear (Using ULM) 0.5 m / 20 inch
Length 3.0 m / 120 inch
Angle 3 mins
Radius 3.0 m / 120 inch
Circularity 0.06 m / 3 inch

35. Vee Block In-house Procedure MDCP -41: 2010

Up to 150 mm / 4 inch BS 3731 : 1987 2.0 m / 80 inch
JIS B 7540 : 1972

36. MU Checker In-house Procedure MDCP -42 : 2010

Up to 5 mm / Up to 0.2 inch JIS B 7536 : 1982 0. 2 m / 10 inch

37. Precision Square In-house Procedure MDCP -43 : 2010

0 - 450 mm / 18 inch BS 939 : 2007 3.0 m / 120 inch
JIS B 7526 : 1995

38. Calibration Tester In-house Procedure MDCP -46 : 2010

0 - 50 mm / 0-2 inch 0. 4 m / 20 inch
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

39. Precision Levels In-house Procedure MDCP -33 : 2015

Up to 300 mm / 12 inch BS 958: 1968 001 Division
- Spirit Level JIS B 7510 : 1993 0.01 degree
- Inclinometer Level Guage

40. Caliper Gauge In-house Procedure MDCP -44 : 2010 1.0 m / 40 inch
(Lab/Site)

41. Internal Micrometer In-house Procedure MDCP -47 : 2010

(2 leg type) 1.0 m / 40 inch

42. Steel Rule In-house Procedure MDCP -49 : 2010

0 - 1500 mm / 60 inch BS 4372 : 1968 5 m X L mm / 50
JIS B 7516: 2005

43. Centre Bench In-house Procedure MDCP -50 : 2010 2.1 m / 83 inch

44. Coating Thickness Gauge In-house Procedure MDCP -54 : 2010

Up to 1000 m / 40 inch 0.5 m / 20 inch

45. Measuring Tape / Textile Tape In-house Procedure MDCP -55 : 2010
Up to 50 m JIS B 7512 : 1993 20 m
JIS B 7522 : 1993

46. Roughness Machine In-house Procedure MDCP -56 : 2010 0.021 m

(Lab/Site)

47. Roughness Specimen In-house Procedure MDCP -56 : 2010 0.021 m

(Not intended for calibration
use)

48. Roundness Machine In-house Procedure MDCP -57 : 2010 0.03 m

(Lab/Site) JIS B 7451 : 1997

49. Parallel Bars In-house Procedure MDCP -58 : 2010 2.0 m

BS 906 : 1972
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

50. Co-ordinate Measuring In-house Procedure MDCP -59 : 2014

Machine ISO 10360 : Part 2 : 2001
1500 mm 0.8 m
(Lab/Site)

51. Micrometer Head In-house Procedure MDCP -63 : 2010

0 – 100 mm DIN 863 : Part 4 : 1999 0.9 m

52. Gauge Block Comparator In-house Procedure MDCP -65 : 2010 0.03 µm
EAL-G21 : 1996

53. Optical Flat / Optical Parallel In-house Procedure MDCP -66 : 2010 0.1 µm
MOY/SCMI/54(Issue 4) : 2001
JIS B 7430 : 1977
JIS B 7431 : 1977

54. Contour Measuring Machine In-house Procedure MDCP -67 : 2010 3 µm

(Lab/Site)

55. Air Gauge / Air Micrometer In-house Procedure MDCP -64 : 2012 0.5 µm
(Lab/Site) JIS B 7535 : 1982

56. Dial Depth Gauge In-house Procedure MDCP -53 : 2010 3 µm

57. Taper Thread Plug Gauge In-house Procedure MDCP -71 : 2013 1.8 µm
ANSI/ASME B1.20.1 : 1983
ASME B1.20.5 : 1991
JIS B 0253 : 1985
58. Taper Thread Ring Gauge In-house Procedure MDCP -72 : 2012 1.5 µm
ANSI/ASME B1.20.1 : 1983
ASME B1.20.5 : 1991
JIS B 0253 : 1985
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

59. Taper Plug Gauge In-house Procedure MDCP -73 : 2013 0.9 µm
JIS B 3301 : 2008

60. Taper Ring Gauge In-house Procedure MDCP -74 : 2013 1.1 µm

JIS B 3301 : 2008

61. Geometrical Dimensional In-house Procedure MDCP-78: 2016

Measurement of Jigs and
Fixtures, Gauges and FA
Measurements – using:
a) Profile projector 3.0 µm
b) CMM 1.6 µm
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

B. Mechanical
1. Weighing Scale In-house Procedure MDCP -20 : 2010
0 - 100 g UKAS Lab 14 0.01 mg
> 100 - 200 g 0.03 mg
> 200 - 1000 g 0.1 mg
> 1 - 100 kg 2 mg
>100 – 1000 kg 2 g
(Lab/Site)

2. Hand Torque Tool In-house Procedure MDCP -31 : 2012

0 - 1000 Ib.ft ISO 6789 : 2003 (E) 0.2 % of full scale
(Lab/Site) BS EN 2789 : 2003

3. Torque Meter/Gauge In-house Procedure MDCP -30 : 2010

0 - 1000 Ib.ft 0.08 % of full scale

4. Tension Gauge In-house Procedure MDCP -32 : 2010

0 - 100 Kg 0.1 % of full scale

5. Push / pull Gauge In-house Procedure MDCP -19 : 2010

0 - 500 Kg 0.1 % of full scale

6. Hardness Testing Machine In-house Procedure MDCP -48 : 2011

(In-direct verification) JIS B 7726 : 1997 0.6 HRA
Rockwell A, B, C JIS B 7725 : 1997 0.6 HRB / HRC
Vicker JIS B 7724 : 1999 1.8 Hv
Brinell 1.8 Hb
(Lab/Site)

7. Durometers In-house Procedure MDCP -51 : 2010 0.2 degree

ASTM D 2240 - 91
ISO 868 : 2003
JIS K 6301 : 1995
JIS K 6253 : 2006
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

8. Pressure Gauge / Pressure In-house Procedure

Transmitter(Lab/Site)
0-100 bar MDCP -52 : 2010 0.05 % of reading
100-1500 bar BS EN 837-1 to 3 : 1998 0.025% of reading (using
deadweight tester)
Vacuum Gauge (Lab/Site)
0 - (-1) Bar 0.25 % of full scale

9. Standard Weights In-house Procedure

1 mg MDCP -60 : 2012 0.004 mg
2 mg OIML R111 : 2004 0.004 mg
5 mg 0.004 mg
10 mg 0.005 mg
20 mg 0.007 mg
50 mg 0.008 mg
100 mg 0.01 mg
200 mg 0.02 mg
500 mg 0.02 mg
1g 0.02 mg
2g 0.03 mg
5g 0.04 mg
10 g 0.04 mg
20 g 0.05 mg
50 g 0.07 mg
100 g 0.1 mg
200 g 0.2 mg
500 g 0.5 mg
1 kg 1 mg
2 kg 2 mg
5 kg 5 mg
10 kg 10 mg
20 kg 61 mg
40 kg 86 mg

10. Tensile Testing Machine In-house Procedure

Up to 250 kN MDCP -61 : 2010 0.01 % of full scale
(Lab/Site) BS EN ISO 7500-1 : 2004
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

11. Load Cell In-house Procedure

Up to 250 kN MDCP -62 : 2010 0.01 % of full scale
(Lab/Site) ISO 376 : 2004

12. Tachometer In-house Procedure

RPM Meter MDCP -68 : 2010
0 – 99999 rpm
Non-Contact Type 0.6 rpm
Contact Type 1.7 rpm

13. Gas Flow Meter In-house Procedure 3.5 % of reading

Rotameter MDCP -69 : 2011

14. Volumetric Flow rate (Air) In-house Procedure

Range : 0 to 500 ml/min MDCP -75 : 2013 1.5%
0.5 to 500 L/min 1.5%
(Lab/Site)

15. Mass Flow Rate (Air) In-house Procedure

Range : 0 to 592 mg/min MDCP -75 : 2013 1.4%
0.5 to 592 g/min 1.3%
(Lab/Site)

16. Liquid Flow Meter In-house Procedure

Verification MDCP-76 : 2014 4.2% of reading
3
Range : 0 to 140 m /min
Pipe Internal Diameter:
0.05 to 1 m
Fluid Temperature:
0 to 60 °C

(Site)
1
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

C Temperature
1. Thermocouple Indicator/
Calibrator (Measure/ Simulate)

Type B In-house Procedure

600 to 1000 °C MDCPT-03 : 2013 1.8 ºC
1000 to 1550 °C 1.7 ºC
1550 to 1820 °C 1.8 ºC

Type C
0 to 1000 °C 1.7 ºC
1000 to 1800 °C 1.8 ºC
1800 to 2316 °C 1.9 ºC

Type E
-250 to -100 °C 0.5 ºC
-100 to 1000 °C 0.3 ºC

Type J
-210 to 1200 °C 0.3 ºC

Type K
-200 to -100 °C 0.4 ºC
-100 to 1000 °C 0.3 ºC
1000 to 1372 °C 0.4 ºC

Type L
-200 to -100 °C 1.8 ºC
-100 to 900 °C 1.7 ºC

Type N
-200 to 120 °C 0.5 ºC
120 to 1300 °C 0.4 ºC
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

1. Thermocouple Indicator/
Calibrator (Measure/ Simulate)

Type R In-house Procedure

o
0 to 250 C MDCPT-03 : 2013 1.0 ºC
250 to 1767 °C 0.9 ºC

Type S
0 to 250 °C 0.8 ºC
250 to 1000 °C 0.8 ºC
1000 to 1767 °C 0.8 ºC

Type T
-250 to -150 °C 0.6 ºC
-150 to 400 °C 0.3 ºC

Type U
-200 to 0 ºC 1.9 ºC
0 to 600 ºC 1.8 ºC

2. Enclosures In-house Procedure

MDCPT-05 : 2016
2.1 Chamber/ Oven/ Freezer/ and MDCPT-05a : 2012
Incubator/ Refrigerator/
System Accuracy Test

Range :
-40 to 100 °C 0.12 % of Reading + 0.8 ºC
100 to 200 °C 0.06 % of Reading + 1.8 ºC
200 to 600 ºC 0.47 % of Reading + 1.7 ºC

2.2 Enclosure/ Furnace/ System

Accuracy Test

Range :
-40 to 100 °C 0.12 % of Reading + 0.8 ºC
100 to 200 °C 0.06 % of Reading + 1.7 ºC
200 to 600 ºC 0.47 % of Reading + 1.7 ºC
600 to 1200 ºC 0.13 % of Reading + 2.4 ºC
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

3. RTD Sensor with or without In-house Procedure MDCPT-02 : 2012

Indicator

Range :
-20 to 95 °C 0.05 ºC
95 to 200 °C 0.07 ºC
200 to 600 °C 0.37 ºC

4. Thermohygrometer / In-house Procedure MDCPT -06 : 2012

Thermohygrograph

Range :
30 to 95 % R.H. at 25 °C 3.8 % R.H.
15 to 45 °C 0.6 ºC

5. Surface Probe In-house Procedure MDCPT -07 : 2012

Range :
35 to 350 °C 2.3 ºC

6. Dry Block Calibrator In-house Procedure MDCPT -08 : 2013

Range :
-20 to 140 ºC 0.10 ºC
140 to 650 ºC 0.28 ºC
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

7. RTD Indicator/ Calibrator

(Measure and Simulate)

Pt 385, 100  In-house Procedure

-200 to 0 °C MDCPT -04 : 2013 0.07 ºC
0 to 100 °C 0.08 ºC
100 to 300 °C 0.09 ºC
300 to 400 °C 0.10 ºC
400 to 630 °C 0.11 ºC
630 to 800 °C 0.19 ºC

Pt 3926, 100 
-200 to 0 °C 0.07 ºC
0 to 100 °C 0.08 ºC
100 to 300 °C 0.09 ºC
300 to 400 °C 0.10 ºC
400 to 630 ºC 0.11 ºC

Pt 3916, 100 
-200 to -190 °C 0.20 ºC
-190 to 100 °C 0.07 ºC
100 to 300 °C 0.08 ºC
300 to 400 °C 0.09 ºC
400 to 600 ºC 0.10 ºC
600 to 630 ºC 0.19 ºC

Pt 385, 200 
-200 to 300 °C 0.07 ºC
300 to 400 ºC 0.11 ºC
400 to 600 ºC 0.12 ºC
600 to 630 ºC 0.14 ºC
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

Pt 385, 500 
-200 to 260 °C 0.07 ºC
260 to 400 ºC 0.08 ºC
400 to 600 ºC 0.09 ºC
600 to 630 ºC 0.10 ºC

Pt 385, 1000 
-200 to 0 °C 0.06 ºC
0 to 300 ºC 0.07 ºC
300 to 600 ºC 0.08 ºC
600 to 630 ºC 0.19 ºC

Ni120, 120 
-80 to 100 ºC 0.08 ºC
100 to 260 ºC 0.12 ºC

Cu 427, 10 
-100 to 260 ºC 0.24 ºC

8. Thermocouple Sensor

8.1 Thermocouple Sensor In-house Procedure

with Indicator MDCPT -11 : 2016

Range:
-20 to 95 °C Base Metal Thermocouple 0.17% of Reading + 0.1 ºC
95 to 200 °C Type E, J, K, N, T 0.2% of Reading + 0.1 ºC
200 to 650 °C 0.2% of Reading + 0.3 ºC
650 to 1200 °C 0.2% of Reading + 1.1 ºC

-20 to 95 °C Noble Metal Thermocouple 0.02% of Reading + 0.1 ºC

95 to 200 °C Type B, R, S 0.04% of Reading + 0.1 ºC
200 to 600 °C 0.05% of Reading + 0.4 ºC
600 to 1200 °C 0.02% of Reading + 1.6 ºC
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MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

8.2 Thermocouple Sensor In-house Procedure

without Indicator MDCPT -11 : 2016

Type E
-20 to 140 °C 0.17% of Reading +0.11ºC
140 to 600 °C 0.19% of Reading +0.4ºC
600 to 1000 °C 0.16% of Reading +1.7ºC

Type J
-20 to 140 °C 0.17% of Reading +0.12ºC
140 to 600 °C 0.19% of Reading +0.4ºC
600 to 1200 °C 0.18% of Reading +1.2ºC

Type K
-20 to 140 °C 0.27% of Reading +0.12ºC
140 to 600 °C 0.19% of Reading +0.4ºC
600 to 1200 °C 0.18% of Reading + 1.2ºC

Type N
-20 to 140 °C 0.27% of Reading +0.12ºC
140 to 600 °C 0.19% of Reading +0.4ºC
600 to 1200 °C 0.18% of Reading + 1.2 ºC

Type R
-20 to 140 °C 0.03% of Reading +0.11ºC
140 to 600 °C 0.03% of Reading +0.5ºC
600 to 1200 °C 0.02% of Reading + 1.6ºC

Type S
-20 to 140 °C 0.03% of Reading +0.12ºC
140 to 600 °C 0.03% of Reading +0.5 ºC
600 to 1200 °C 0.02% of Reading +1.6 ºC
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 19 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

8.2 Thermocouple Sensor In-house Procedure

without Indicator MDCPT -11 : 2016
Type T
-20 to 140 °C 0.17% of Reading +0.11ºC
140 to 400 °C 0.2% of Reading +0.3ºC

9. Analog and Digital Thermometer In-house Procedure

Range: MDCPT -09 : 2012
-20 to 95 °C 0.1 ºC
95 to 200 °C 0.1 ºC
200 to 600 °C 0.6 ºC
600 to 1200 °C 1.7 ºC

10. Glass Thermometer In-house Procedure

10.1 Total Immersion MDCPT -10 : 2013
LIG Thermometer

Scale Graduation : 0.1°C

-20 to 200 °C 0.1 ºC

Scale Graduation : 0.2°C

-20 to 200 °C 0.1 ºC

Scale Graduation : 0.5°C

-20 to 200 °C 0.2 ºC
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 20 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

10. Glass Thermometer In-house Procedure

10.1 Total Immersion MDCPT -10 : 2013
LIG Thermometer
Scale Graduation : 1°C
-20 to 200 °C 0.5 ºC

Scale Graduation : 2°C

-20 to 200 °C 1 ºC

10.2 Partial Immersion

LIG Thermometer

Scale Graduation : 0.1°C

-20 to 200 °C 0.1 ºC

Scale Graduation : 0.2°C

-20 to 200 °C 0.1 ºC

Scale Graduation : 0.5°C

-20 to 200 °C 0.2 ºC

Scale Graduation : 1°C

-20 to 200 °C 0.5 ºC

Scale Graduation : 2°C

-20 to 200 °C 1 ºC
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 21 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

D Electrical
1. DC Voltage (Measure) Direct measurement with a
(Lab) DC voltage source
0 to < 220 mV 7.0 ppm + 0.63 µV
220 mV to <2.2 V 6.2 ppm + 1.1 µV
2.2 V to < 11 V 6.2 ppm + 6.6 µV
11 V to < 22 V 6.2 ppm + 8.5 µV
22 V to < 220 V 7.0 ppm + 97 µV
220 V to 1100 V 8.6 ppm + 0.75 mV

(On-site)
0 to <330 mV Direct measurement with a 16 ppm + 1.4 µV
0.33V to <3.3 V DC Voltage Source 8.6 ppm + 1.7 µV
3.3 to <33 V In-house Procedure MDCPE-01 : 2013 9.3 ppm + 17 µV
33 to <330 V In-house Procedure MDCPE-02 : 2013 14 ppm + 0.13 mV
330 V to 1000 V 14 ppm + 1.4 mV

2. DC Current (Measure) Direct measurement with a

(Lab) DC current source
0 to < 220 µA 47 ppm + 7.8 nA
220 µA to < 2.2 mA 47 ppm + 7.9 nA
2.2 mA to < 22 mA 47 ppm + 78 nA
22 mA to < 220 mA 55 ppm + 0.92 µA
220 mA to < 2.2 A 74 ppm + 24 µA
1.1 A to <3 A 0.030 % + 31 µA
3 A to <11 A 0.039 % + 0.39 mA
11A to 20.5 A 0.078 % + 0.59 mA

(On-site)
0 to <330 µA Direct measurement with a 0.012 % + 0.016 µA
0.33 mA to <3.3 mA DC Current source 78 ppm + 0.039 µA
3.3 mA to <33 mA In-house Procedure MDCPE-01 : 2013 78 ppm + 0.20 µA
33 mA to <330 mA In-house Procedure MDCPE-03 : 2013 78 ppm + 2.0 µA
0.33 A to <1.1 A 0.016 % + 31 µA
1.1 A to <3 A 0.030 % + 31 µA
3 A to <11 A 0.039 % + 0.70 mA
11 A to 20.5 A 0.078 % + 0.59 mA
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 22 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

3. Resistance (Measure) (Lab) Direct measurement with a

0  to <11  resistance source 31 ppm + 0.78 mΩ
11  to <33  24 ppm + 1.2 mΩ
33 to <110  22 ppm + 1.1 mΩ
110  to <1.1 k 22 ppm + 1.7 mΩ
1.1 k to <11 k 22 ppm + 17 mΩ
11 k to <110 k 22 ppm + 0.17 Ω
110 k to <1.1 M 25 ppm + 1.7 Ω
1.1 M to <3.3 M 47 ppm + 24 Ω
3.3 M to <11 M 0.011 % + 40 Ω
11 M to <33 M 0.020 % + 2.0 kΩ
33 Mto <110 M 0.039 % + 2.6 kΩ
110 M to <330 M 0.24 % + 78 kΩ
330 M to <1100 M 1.2 % + 0.39 MΩ
0Ω 40 µΩ
1Ω 86 ppm + 8.6 µΩ
1.9 Ω 86 ppm + 7.6 µΩ
10 Ω 26 ppm + 16 µΩ
19 Ω 24 ppm + 8.6 µΩ
100 Ω 16 ppm + 76 µΩ
190 Ω 16 ppm + 58 µΩ
1 kΩ 12 ppm + 0.70 mΩ
1.9 kΩ 12 ppm + 0.58 mΩ
10 kΩ 11 ppm + 7.6 mΩ
19 kΩ 11 ppm + 7.0 mΩ
100 kΩ 13 ppm + 58 mΩ
190 kΩ 13 ppm + 71 mΩ
1 MΩ 18 ppm + 1.4 Ω
1.9 MΩ 19 ppm + 0.58 Ω
10 MΩ 36 ppm + 54 Ω
19 MΩ 43 ppm + 51 Ω
100 MΩ 0.011 % + 0.94 kΩ

(On-site)
0 to <11 Ω Direct measurement with a 31 ppm + 7.8 mΩ
11 Ω to <33 Ω resistance source 24 ppm + 1.2 mΩ
33 Ω to <110 Ω In-house Procedure 22 ppm + 12 mΩ
110 Ω to <330 Ω MDCPE-01 : 2013 22 ppm + 16 mΩ
0.33 kΩ to <1.1 kΩ MDCPE-04 : 2013 22 ppm + 16 mΩ
1.1 kΩ to <3.3 kΩ 22 ppm + 0.16 Ω
3.3 kΩ to <11 kΩ 22 ppm + 0.078 Ω
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 23 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

3. Resistance (Measure)
(On-site) Direct measurement with a
11 kΩ to <33 kΩ resistance source 22 ppm + 0.78 Ω
33 kΩ to <110 kΩ In-house Procedure 22 ppm + 0.78 Ω
110 kΩ to <330 kΩ MDCPE-01 : 2013 25 ppm + 7.8 Ω
0.33 MΩ to <1.1 MΩ MDCPE-04 : 2013 25 ppm + 7.8 Ω
1.1 MΩ to <3.3 MΩ 47 ppm + 0.12 kΩ
3.3 MΩ to <11 MΩ 0.011 % + 0.20 kΩ
11 MΩ to <33 MΩ 0.020 % + 2.0 kΩ
33 MΩ to <110 MΩ 0.039 % + 2.4 kΩ
110 MΩ to <330 MΩ 0.024 % + 0.078 MΩ
330 MΩ to<1100 MΩ 1.2 % + 0.39 MΩ

4. AC Voltage (Measure)
(Lab) Direct measurement with a
AC voltage source
0.22 mV to <2.2 mV 10 Hz to 20 Hz 0.047 % + 3.9 µV
>20 Hz to 50 Hz 0.019 % + 3.9 µV
>50 Hz to 10 kHz 93 ppm + 3.9 µV
>10 kHz to 20 kHz 93 ppm + 4.0 µV
> 20 kHz to 50 kHz 0.032 % + 3.9 µV
>50 kHz to 100 kHz 0.074 % + 6.3 µV
>100 kHz to 300 kHz 0.11 % + 12 µV
>300 kHz to 500 kHz 0.14 % + 24 µV
>500 kHz to 1 MHz 0.38 % + 31 µV

2.2 mV to <22 mV 10 Hz to 20 Hz 0.047 % + 4.7 µV

>20 Hz to 30 Hz 0.19 % + 4.7 µV
>30 Hz to 40 Hz 0.019 % + 4.7 µV
>40 Hz to 20 kHz 93 ppm + 4.7 µV
>20 kHz to 50 kHz 0.032 % + 4.7 µV
>50 kHz to 100 kHz 0.074 % + 6.2 µV
>100 kHz to 300 kHz 0.11 % + 12 µV
>300 kHz to 500 kHz 0.14 % + 24 µV
>500 kHz to 1 MHz 0.38 % + 31 µV
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 24 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

4. AC Voltage (Measure) (Lab)

22 mV to <220 mV 10 Hz to 20 Hz 0.047% + 13 µV
>20 Hz to 40 Hz 0.019% + 7.8 µV
>40 Hz to 20 kHz 86 ppm + 7.8 µV
>20 kHz to 50 kHz 0.028% + 7.8 µV
> 50 kHz to 100 kHz 0.070 % + 24 µV
>100 kHz to 300 kHz 0.086 % + 24 µV
>300 kHz to 500 kHz 0.14 % + 31 µV
>500 kHz to 1 MHz 0.28 % + 78 µV

220 mV to <2.2 V 10 Hz to 20 Hz 0.047 % + 78 µV

>20 Hz to 40 Hz 0.014 % + 24 µV
>40 Hz to 50 Hz 66 ppm + 6.2 µV
>50 Hz to 60 Hz 66 ppm + 5.7 µV
>60 Hz to 10 kHz 66 ppm + 5.6 µV

>10 kHz to 20 kHz 66 ppm + 5.7 µV

> 20 kHz to 50 kHz 0.011 % + 16 µV
>50 kHz to 100 kHz 0.022 % + 62 µV
>100 kHz to 300 kHz 0.038 % + 0.12 mV
>300 kHz to 500 kHz 0.093 % + 0.31 mV
>500 kHz to 1 MHz 0.19 % + 0.78 mV

2.2 V to <22 V 10 Hz 0.047 % + 0.79 mV

>10 Hz to 20 Hz 0.047 % + 0.78 mV
>20 Hz to 30 Hz 66 ppm + 59 µV
>30 Hz to 40 Hz 66 ppm + 56 µV
>40 Hz to 50 Hz 66 ppm + 59 µV
>50 Hz to 60 Hz 66 ppm + 57 µV
>60 Hz to 400 Hz 66 ppm + 58 µV
>400 Hz to 1 kHz 66 ppm + 56 µV
>1 kHz to 5 kHz 66 ppm + 57 µV
>5 kHz to 10 kHz 66 ppm + 55 µV
>10 kHz to 20 kHz 66 ppm + 57 µV
> 20 kHz to 30 kHz 0.011 % + 0.16 mV
> 30 kHz to 100 kHz 0.022 % + 0.31 mV
>100 kHz to 300 kHz 0.047 % + 1.4 mV
>300 kHz to 500 kHz 0.11 % + 3.9 mV
>500 kHz to 1 MHz 0.24 % + 7.0 mV
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 25 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

4. AC Voltage (Measure) (Lab)

22 V to <220 V 10 Hz to 20 Hz 0.047 % + 7.8 mV
>20 Hz to 40 Hz 0.014 % + 2.4 mV
>40 Hz to 50 Hz 70 ppm + 1.2 mV
>50 Hz to 60 Hz 70 ppm + 0.81 mV
>60 Hz to 400 Hz 70 ppm + 0.78 mV
>400 Hz to 1 kHz 70 ppm + 0.79 mV
>1 kHz to 5 kHz 70 ppm + 0.81 mV
>5 kHz to 10 kHz 70 ppm + 0.79 mV
>10 kHz to 20 kHz 70 ppm + 0.80 mV
>20 kHz to 50 kHz 0.020 % + 3.1 mV
>50 kHz to 100 kHz 0.047 % + 7.8 mV

33 V to 330 V 45 Hz to 1 kHz 0.015 % + 1.6 mV

>1 kHz to 10 kHz 0.016 % + 4.7 mV
>10 kHz to 20 kHz 0.020 % + 4.7 mV
>20 kHz to 50 kHz 0.024 % + 4.7 mV
>50 kHz to 100 kHz 0.16 % + 39 mV

330 V to 1000 V 45 Hz to 1 kHz 0.024 % + 7.8 mV

>1 kHz to 5 kHz 0.020 % + 8.4 mV
>5 kHz to 10 kHz 0.024 % + 8.0 mV

(On-site) Direct measurement with a

AC Voltage source
In-house Procedure MDCPE-01 : 2013
In-house Procedure MDCPE-02 : 2013
1.0 mV to <33 mV 10Hz to 45 Hz 0.062 % + 4.7 µV
45Hz to 10 kHz 0.012 % + 4.7 µV
10kHz to 20 kHz 0.016 % + 4.7 µV
20kHz to 50 kHz 0.078 % + 4.8 µV
50kHz to 100 kHz 0.28 % + 9.7 µV
100kHz to 500 kHz 0.62 % + 39 µV

33 mV to <330 mV 10Hz to 45 Hz 0.024 % + 6.3 µV

45Hz to 10 kHz 0.012 % + 6.3 µV
10kHz to 20 kHz 0.013 % + 6.3 µV
20kHz to 50 kHz 0.028 % + 6.3 µV
50kHz to 100 kHz 0.062 % + 25 µV
100kHz to 500 kHz 0.16 % + 55 µV
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 26 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

4. AC Voltage (Measure) (On-Site)

0.33 V to < 3.3 V 10Hz to 45 Hz 0.024 % + 43 µV
45Hz to 10 kHz 0.012 % + 49 µV
10kHz to 20 kHz 0.015 % + 50 µV
20kHz to 50 kHz 0.024 % + 40 µV
50kHz to 100 kHz 0.055 % + 99 µV
100kHz to 500 kHz 0.19 % + 0.47 mV

3.3 V to <33 V 10Hz to 45 Hz 0.024 % + 0.51 mV

45Hz to 10 kHz 0.012 % + 0.47 mV
10kHz to 20 kHz 0.019 % + 0.47 mV
20kHz to 50 kHz 0.028 % + 0.47 mV
50kHz to 100 kHz 0.072 % + 1.5 mV

33 V to <330 V 10Hz to 45 Hz 0.015 % + 1.6 mV

45Hz to 10 kHz 0.016 % + 4.7 mV
10kHz to 20 kHz 0.020 % + 4.7 mV
20kHz to 50 kHz 0.024 % + 4.7 mV
50kHz to 100 kHz 0.16 % + 39 mV

330 V to 1020 V 45 Hz to 1 kHz 0.024 % + 7.9 mV

1kHz to 5 kHz 0.020 % + 7.9 mV
5kHz to 10 kHz 0.024 % + 8.0 mV

5. AC Current (Measure) (Lab) Direct measurement with a

AC Current Source
0 µA to 220 µA 10 Hz to 20 Hz 0.062 % + 30 nA
>20 Hz to 40 Hz 0.033 % + 21 nA
>40 Hz to 1 kHz 0.013 % + 19 nA
>1 kHz to 5 kHz 0.055 % + 40 nA
>5 kHz to 10 kHz 0.14 % + 78 nA

>220 µA to 2.2 mA 10 Hz to 20 Hz 0.062 % + 40 nA

>20 Hz to 30 Hz 0.033 % + 32 nA
>30 Hz to 40 Hz 0.033 % + 32 nA
>40 Hz to 1 kHz 0.013 % + 33 nA
>1 kHz to 5 kHz 0.055 % + 0.39 µA
>5 kHz to 10 kHz 0.14 % + 0.78 µA
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 27 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

5. AC Current (Measure) (Lab)

>2.2 mA to 22 mA 10 Hz 0.062 % + 0.41 µA
>10 Hz to 20 Hz 0.062 % + 0.51 µA
>20 Hz to 40 Hz 0.033 % + 0.32 µA
>40 Hz to 1 kHz 0.013 % + 0.32 µA
>1 kHz to 5 kHz 0.055 % + 3.9 µA
>5 kHz to 10 kHz 0.14 % + 7.8 µA

>22 mA to 220 mA 10 Hz to 20 Hz 0.062 % + 3.9 µA

>20 Hz to 40 Hz 0.033 % + 3.1 µA
>40 Hz to 1 kHz 0.014 % + 3.1 µA
>1 kHz to 5 kHz 0.055 % + 39 µA
>5 kHz to 10 kHz 0.14 % + 78 µA

33 mA to 330 mA 10 Hz to 20 Hz 0.14 % + 16 µA
>20 Hz to 45 Hz 0.070 % + 16 µA
>45 Hz to 1 kHz 0.031 % + 16 µA
>1 kHz to 5 kHz 0.078 % + 39 µA
>5 kHz to 10 kHz 0.16 % + 78 µA
>10 kHz to 30 kHz 0.32 % + 0.16 mA

0.33 A to 3 A 10 Hz to 45 Hz 0.14 % + 0.13 mA

>45 Hz to 1 kHz 0.047 % + 0.085 mA
>1 kHz to 5 kHz 0.47 % + 0.78 mA
>5 kHz to 10 kHz 2.0 % + 3.9 mA

3 A to 11 A 45 Hz to 100 Hz 0.047 % + 1.6 mA

>0.1 kHz to 1 kHz 0.078 % + 1.6 mA
>1 kHz to 5 kHz 2.4 % + 1.6 mA

11 A to 20.5 A 45 Hz to 100 Hz 0.14 % + 5.8 mA

>0.1 kHz to 1 kHz 0.18 % + 5.8 mA
>1 kHz to 5 kHz 3.5 % + 5.8 mA
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 28 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

5. AC Current (Measure) (On-site) Direct measurement with a AC

Current source
In-house Procedure MDCPE-01 : 2013
In-house Procedure MDCPE-03 : 2013
29.00 µA to <330 µA 10 Hz to 20 Hz 0.16 % + 0.080 µA
20 Hz to 45 Hz 0.12 % + 0.079 µA
45 Hz to 1 kHz 0.097 % + 0.079 µA
1 kHz to 5 kHz 0.24 % + 0.12 µA
5 kHz to 10 kHz 0.62 % + 0.16 µA
10 kHz to 30 kHz 1.3 % + 0.31 µA

0.33 mA to <3.3 mA 10 Hz to 20 Hz 0.16 % + 0.12 µA

20 Hz to 45 Hz 0.097 % + 0.12 µA
45 Hz to 1 kHz 0.078 % + 0.12 µA
1 kHz to 5 kHz 0.16 % + 0.16 µA
5 kHz to 10 kHz 0.39 % + 0.24 µA
10 kHz to 30 kHz 0.78 % + 0.47 µA

3.3 mA to <33 mA 10 Hz to 20 Hz 0.14 % + 1.6 µA

20 Hz to 45 Hz 0.070 % + 1.6 µA
45 Hz to 1 kHz 0.031 % + 1.6 µA
1 kHz to 5 kHz 0.062 % + 1.6 µA
5 kHz to 10 kHz 0.16 % + 2.4 µA
10 kHz to 30 kHz 0.31 % + 3.1 µA

33 mA to < 330 mA 10 Hz to 20 Hz 0.14 % + 16 µA

20 Hz to 45 Hz 0.070 % + 16 µA
45 Hz to 1 kHz 0.031 % + 16 µA
1 kHz to 5 kHz 0.078 % + 39 µA
5 kHz to 10 kHz 0.16 % + 78 µA
10 kHz to 30 kHz 0.31 % + 0.16 mA

0.33 A to < 3 A 10 Hz to 45 Hz 0.14 % + 0.23 mA

45Hz to 1 kHz 0.047% + 0.11 mA
1kHz to 5 kHz 0.47 % + 0.78 mA
5kHz to 10 kHz 2.0 % + 3.9 mA

3 A to < 11 A 45Hz to 100 Hz 0.047 % + 0.17 mA

100Hz to 1 kHz 0.078 % + 1.7 mA
1kHz to 5 kHz 2.4 % + 1.7 mA
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 29 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

5. AC Current (Measure) (On-site)

11 A to 20.5 A 45Hz to 100 Hz 0.093 % + 3.9 mA
100Hz to 1 kHz 0.12 % + 3.9 mA
1kHz to 5 kHz 2.4 % + 3.9 mA

6. Capacitance (Measure) (Lab) Direct measurement with a calibrator

0.19 nF to 1.1 nF 10 Hz to 10 kHz 0.39 % + 7.8 pF

1.1 nF to 3.3 nF 10 Hz to 3 kHz 0.39 % + 7.8 pF
3.3 nF to 11 nF 10 Hz to 1 kHz 0.20 % + 9.7 pF
11 nF to 110 nF 10 Hz to 1 kHz 0.20 % + 0.10 nF
110 nF to 330 nF 10 to 1 kHz 0.20 % + 0.63 nF
0.33 µF to 1.1 µF 10 to 600 Hz 0.20 % + 0.97 nF
1.1 µF to 3.3 µF 10 to 300 Hz 0.20 % + 6.3 nF
3.3 µF to 11 µF 10 to 150 Hz 0.20 % + 9.7 nF
11 µF to 33 µF 10 to 120 Hz 0.32 % + 24 nF
33 µF to 110 µF 10 to 80 Hz 0.35 % + 97 nF
110 µF to 330 µF 50 Hz 0.35 % + 0.63 µF
0.33 mF to 1.1 mF 20 Hz 0.35 % + 1.1 µF
1.1 mF to 3.3 mF 6 Hz 0.35 % + 6.3 µF
3.3 mF to 11 mF 2 Hz 0.35 % + 9.7 µF
11 mF to 33 mF 0.6 Hz 0.59 % + 24 µF
33 mF to 110 mF 0.2 Hz 0.85 % + 78 µF
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 30 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

6. Capacitance (Measure) (On-Site) Direct measurement with a

Capacitance source
In-house Procedure MDCPE-01 : 2013
In-house Procedure MDCPE-03 : 2013
0.4 nF to <1.0999 nF 10 Hz to 10 kHz 0.39 % + 7.8 pF
1.1 nF to 3.2999 nF 10 Hz to 3 kHz 0.39 % + 7.8 pF
3.3 nF to 10.9999 nF 10 Hz to 1 kHz 0.20 % + 9.7 pF
11 nF to 32.9999 nF 10 Hz to 1 kHz 0.20 % + 0.097nF
33 nF to 109.999 nF 10 Hz to 1 kHz 0.20 % + 0.097nF
110 nF to 329.999 nF 10 Hz to 1 kHz 0.20 % + 0.63 nF
0.33 µF to 1.09999 µF 10 Hz to 600 Hz 0.20 % + 0.97 nF
1.1 µF to 3.29999 µF 10 Hz to 300 Hz 0.20 % + 6.3 nF
3.3 µF to 10.9999 µF 10 Hz to 150 Hz 0.20 % + 9.7 nF
11 µF to 32.9999 µF 10Hz to 120 Hz 0.31 % + 24 nF
33 µF to 109.999 µF 10Hz to 80 Hz 0.35 % + 97 nF
110 µF to 329.999 µF 0 to 50 Hz 0.35 % + 0.63 µF
0.33 mF to1.09999mF 0 to 20 Hz 0.35 % + 1.1 µF
1.1 mF to 3.2999 mF 0 to 6 Hz 0.35 % + 6.3 µF
3.3 mF to 10.9999 mF 0 to 2 Hz 0.35 % + 9.7 µF
11 mF to 32.9999 mF 0 to 0.6 Hz 0.59 % + 24 µF
33 mF to 110 mF 0 to 0.2 Hz 0.86 % + 78 µF

7. Frequency (Measure) (Lab) Direct measurement with a

calibrator
0.01 Hz to 99.99 Hz 1.6 ppm + 8.6 µHz
100 Hz to 119.9 Hz 1.6 ppm + 71 µHz
120 Hz to 1199.9 Hz 1.6 ppm + 0.49 mHz
1.2 kHz to 11.99 kHz 1.6 ppm + 4.9 mHz
12 kHz to 119.99 kHz 1.6 ppm + 40 mHz
120 kHz to 1199.99 kHz 1.6 ppm + 0.49 Hz
1.2 MHz to 2.0 MHz 1.6 ppm + 0.80 Hz
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 31 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD/ FREQUENCY MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

7. Frequency (Measure) (On-Site) Direct measurement with a

0.01 Hz to 99.99 Hz Mutiproduct Calibrator 1.6 ppm + 8.6 µHz
100 Hz to 119.9 Hz In-house Procedure MDCPE-01 : 2013 1.6 ppm + 71 µHz
120 Hz to 1199.9 Hz 1.6 ppm + 0.90 mHz
1.2 kHz to 11.99 kHz 1.6 ppm + 4.9 mHz
12 kHz to 119.99 Hz 1.6 ppm + 40 mHz
120 kHz to1199.99 kHz 1.6 ppm + 0.49Hz
1.2 MHz to 2.0 MHz 1.6 ppm + 0.80Hz

8. DC Power (Measure)
(Lab) Direct measurement with a calibrator
0 to 90 W 0.018 % + 13 mW
>90W to 150W 0.019 % + 0.12 W
>150W to 600W 0.018 % + 58 mW
>600W to 6kW 0.055 % + 0.58 W
>6kW to 12kW 0.070 % + 0.58 W

(On-site)
0 to 90 W Direct measurement with a 0.018 % + 13 mW
>90W to 150W Multiproduct Calibrator 0.019 % + 0.12 W
>150W to 600W In-house Procedure MDCPE-16 : 2013 0.018 % + 58 mW
>600W to 6kW 0.055 % + 0.58 W
>6kW to 12kW 0.070 % + 0.58 W

9. AC Power (Measure)
(Lab) Direct measurement with a calibrator
0 W to 33 W 45 Hz to 65 Hz 0.062 % + 0.76 mW
>33 W to 90 W 45 Hz to 65 Hz 0.086 % + 0.22 mW
>90 W to 150 W 45 Hz to 65 Hz 0.070 % + 7.6 mW
>150 W to 900 W 45 Hz to 65 Hz 0.070 % + 12 mW
>900 W to 9 kW 45 Hz to 65 Hz 0.078 % + 58 mW
>9 kW to 12 kW 45 Hz to 65 Hz 0.078 % + 0.58 W

(On-site) Direct measurement with a

0 W to 33 W Mutiproduct Calibrator 0.062 % + 0.76 mW
>33 W to 90 W In-house Procedure MDCPE-16 : 2013 0.086 % + 0.22 mW
>90 W to 150 W 0.070 % + 7.6 mW
>150 W to 900 W 0.070 % + 12 mW
>0.9 kW to 9 kW 0.078 % + 58 mW
>9 kW to 12 kW 0.078 % + 0.58 W
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 32 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO METHOD MEASUREMENT CAPABILITY
BE CALIBRATED (CMC*)

10. DC Voltage (Source)

(Lab) Direct measurement with a
0 to <220 mV precision Multimeter 5.1 ppm + 0.094 µV
220 mV to <2.2 V 3.5 ppm + 0.70 µV
2.2 V to <22 V 3.5 ppm + 4.0 µV
22 V to <220 V 5.5 ppm + 40 µV
220 V to 1100 V 5.5 ppm + 0.75 mV

(On-site) Direct measurement with a

0 to 30 mV DC Voltage source 52 ppm + 4.3 µV
>30mV to 300 mV In-house Procedure MDCPE-08 : 2013 41 ppm + 45 µV
>300mV to 3V In-house Procedure MDCPE-09 : 2013 29 ppm + 7.0 µV
>3V to 30V 47 ppm + 0.22 mV
>30V to 300V 64 ppm + 0.70 mV
>300 V to 1000 V 0.12 % + 0.24 V

11. DC Current (Source)

(Lab) Direct measurement with a
0 to <200 µA precision multimeter 13 ppm + 0.31 nA
220 µA to <2 mA 13 ppm + 3.1 nA
2 mA to <20mA 14 ppm + 31 nA
20 mA to <200 mA 47 ppm + 0.62 µA
200 mA to <2 A 0.018 % + 13 µA
2 A to 20 A 0.039 % + 0.32 mA

(On-site) Direct measurement with a

0 to 300 µA DC Current source 0.047 % + 0.012 µA
>0.30 mA to 3.0 mA In-house Procedure MDCPE-10 : 2013 0.047 % + 0.12 µA
>3.0 mA to 30 mA 0.047 % + 1.2 µA
>30 mA to 300 mA 0.093 % + 24 µA
>300 mA to 1A 0.093 % + 0.70 mA
>1 A to 10 A 0.058 % + 0.58 mA
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 33 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO METHOD MEASUREMENT CAPABILITY
BE CALIBRATED (CMC*)

12. Resistance (Source) Direct measurement with a

(Lab) precision multimeter
Normal
0 to <2 Ω 17 ppm + 3.9 µΩ
2 Ω to <20 Ω 9.3 ppm + 31 µΩ
20 Ω to <200 Ω 7.8 ppm + 50 µΩ
200 Ω to <2kΩ 7.8 ppm + 0.49 mΩ
2 kΩ to <20 kΩ 7.8 ppm + 4.8 mΩ
20 kΩ to <200 kΩ 7.8 ppm + 46 mΩ
200 kΩ to <2 MΩ 9.3 ppm + 0.94 Ω
2 MΩ to <20 MΩ 20 ppm + 93 Ω
20 MΩ to <200 MΩ 0.012 % + 9.4kΩ
200 MΩ to 2 GΩ 0.15 % + 0.94 MΩ

High Voltage
2 MΩ to <20 MΩ 16 ppm + 9.3 Ω
20 MΩ to <200 MΩ 62 ppm +0.93 kΩ
200 MΩ to <2 GΩ 0.018 % + 0.093 MΩ
2 GΩ to 20 GΩ 0.15 % + 9.3 MΩ

(On-site) Direct measurement with a

0Ω resistance source 3.9 mΩ
>0 to 30 Ω In-house Procedure MDCPE-11 : 2013 87 ppm + 3.7 mΩ
>30 to 300Ω 64 ppm + 4.0 mΩ
>300 to 3kΩ 58 ppm + 7.0 mΩ
>3kΩ to 30kΩ 58 ppm + 70 mΩ
>30kΩ to 300kΩ 58 ppm + 0.82 Ω
>300 kΩ to 3 MΩ 76 ppm + 14 Ω
>3 MΩ to 30 MΩ 0.047 % + 0.93 Ω
>30 MΩ to 300 MΩ 0.70 % + 0.12 MΩ
>300 MΩ to 1GΩ 7.0 % + 1.2 MΩ
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 34 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

13. AC Voltage (Source) Direct measurement with a

(Lab) precision multimeter
<200 mV 10 Hz to 40 Hz 0.013 % + 3.9 µV
>40 Hz to 100 Hz 0.011 % + 3.9 µV
>100 Hz to 2 kHz 0.011 % + 1.9 µV
>2 kHz to 10 kHz 0.013 % + 3.9 µV
>10 kHz to 30 kHz 0.031 % + 7.8 µV
>30 kHz to 100 kHz 0.067 % + 19 µV

200 mV to <2 V 10 Hz 0.0014 % + 0.11 mV

>10 Hz to 40 Hz 0.011 % + 19 µV
>40 Hz to 100 Hz 85 ppm + 30 µV
>100 Hz to 2 kHz 70 ppm + 19 µV
>2 kHz to 10 kHz 0.011 % + 19 µV
>10 kHz to 30 kHz 0.021 % + 39 µV
>30 kHz to 50 kHz 0.051 % + 0.19 mV
>50 kHz to 100 kHz 0.051 % + 0.19 mV
>100 kHz to 300 kHz 0.24 % + 1.9 mV
>300 kHz to 1 MHz 0.78 % + 19 mV

2 V to <20 V 10 Hz 0.015 % + 1.1 mV

>10 Hz to 40 Hz 0.011 % + 0.20 mV
>40 Hz to 100 Hz 86 ppm + 0.26 mV
>100 Hz to 2 kHz 70 ppm + 0.19 mV
>2 kHz to 10 kHz 0.011 % + 0.26 mV
>10 kHz to 30 kHz 0.021 % + 0.39 mV
>30 kHz to 50 kHz 0.051 % + 1.9 mV
>50 kHz to 100 kHz 0.24 % + 19 mV

20 V to <200 V 40 Hz to 100 Hz 86 ppm + 1.9 mV

>100 Hz to 2 kHz 70 ppm + 1.9 mV
>2 kHz to 10 kHz 0.011 % + 1.9 mV
>10 kHz to 30 kHz 0.021 % + 3.9 mV
>30 kHz to 100 kHz 0.051 % + 19 mV

200 V to <1000 V 40 Hz to 10 kHz 0.011 % + 20 mV

Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 35 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

13. AC Voltage (Source) Direct measurement with a

(On-site) Direct measurement with a
AC Voltage source
In-house Procedure MDCPE-09 : 2013

1.0 mV to <30 mV 20Hz to 45 Hz 0.70 % + 16 µV

45Hz to 100Hz 0.29 % + 16 µV
100Hz to 400Hz 0.20 % + 16 µV
400Hz to 20 kHz 0.21 % + 16 µV
20kHz to 100 kHz 0.81 % + 27 µV
100kHz to 300 kHz 3.7 % + 0.12 mV
300kHz to 1MHz 12 % + 0.77 mV

30 mV to <300 mV 20Hz to 45 Hz 0.70 % + 0.16 mV

45Hz to 100Hz 0.29 % + 0.16 mV
100Hz to 400Hz 0.20 % + 0.16 mV
400Hz to 20 kHz 0.21 % + 0.16 mV
20kHz to 100 kHz 0.81 % + 0.27 mV
100kHz to 300 kHz 3.7 % + 1.2 mV
300kHz to 1MHz 12 % + 7.7 mV

0.3 V to < 3.0 V 20Hz to 45 Hz 0.70 % + 1.6 mV

45Hz to 100Hz 0.29 % + 1.6 mV
100Hz to 400Hz 0.20 % + 1.6 mV
400Hz to 20 kHz 0.21 % + 1.6 mV
20kHz to 100 kHz 0.81 % + 2.7 mV
100kHz to 300 kHz 3.7 % + 12 mV
300kHz to 1MHz 12 % + 77 mV

3 V to <30 V 20Hz to 45 Hz 0.70 % + 16 mV

45Hz to 100Hz 0.29 % + 16 mV
100Hz to 400Hz 0.20 % + 16 mV
400Hz to 20 kHz 0.21 % + 16 mV
20kHz to 100 kHz 0.81 % + 27 mV
100kHz to 300 kHz 3.7 % + 0.12 V
300kHz to 1MHz 12 % + 0.77 V

30 V to <300 V 20Hz to 45 Hz 0.77 % + 0.16 V

45Hz to 100Hz 0.36 % + 0.16 V
100Hz to 400Hz 0.27 % + 0.16 V
400Hz to 20 kHz 0.28 % + 0.16 V
20kHz to 100 kHz 1.3 % + 0.45 V

300 V to 1000 V 45 Hz to 1 kHz 0.47 % + 4.7 V

1kHz to 10 kHz 0.47 % + 4.7 V
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 36 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

14. AC Current (Source) Direct measurement with a

(Lab) precision multimeter

<200 µA 10 Hz to 10 kHz 0.049 % + 0.019 µA

<2 mA 10 Hz 0.031 % + 0.19 µA

>10 Hz to 10 kHz 0.029 % + 0.19 µA

<20 mA 10Hz 0.031 % + 1.9 µA

>10 Hz to 10 kHz 0.029 % + 1.9 µA

<200 mA 10 Hz 0.031 % + 19 µA
>10 Hz to 10 kHz 0.028 % + 19 µA

<2 A 10 Hz to 2 kHz 0.057 % + 0.19 mA

>2 kHz to 10 kHz 0.067 % + 0.19 mA

<20 A 50 Hz to 2 kHz 0.072 % + 1.9 mA

>2 kHz to 10 kHz 0.20 % + 1.9 mA

(On-site) Direct measurement with a

AC Current source
In-house Procedure MDCPE-10 : 2013
0 µA to <30mA 20Hz to 45 Hz 1.1 % + 3.3 mA
46Hz to 100Hz 0.44 % + 3.3 mA
101Hz to 400Hz 0.39 % + 3.3 mA
401Hz to 20 kHz 0.39 % + 3.3 mA
21kHz to 100 kHz 1.3 % + 3.3 mA

30 mA to <300 mA 20Hz to 45 Hz 1.1 % + 3.3 mA

46Hz to 100Hz 0.44 % + 3.3 mA
101Hz to 400Hz 0.39 % + 3.3 mA
401Hz to 20 kHz 0.39 % + 3.3 mA
21kHz to 100 kHz 1.3 % + 3.3 mA

300 mA to <1A 20Hz to 45 Hz 1.2 % + 3.3 mA

46Hz to 100Hz 0.56 % + 3.3 mA
101Hz to 400Hz 0.50 % + 3.3 mA
401Hz to 20 kHz 0.50 % + 3.3 mA

1 A to 10 A 45 Hz to 1k Hz 1.8 % + 5.8 mA
1k Hz to 20k Hz 1.8 % + 12 mA
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 37 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

15. High Voltage

15.1 AC High Voltage (Source) Direct measurement with a

AC DIGITAL HIGH VOLTMETER
0 kV to 10 kV In-house Procedure MDCPE-18 : 2013 1.2 % + 6.0 V
(Lab/Site) 50Hz to 60Hz

15.2. DC High Voltage (Source)

0 kV to 5 kV Direct measurement with a 0.58 % + 3.5 V

(Lab/Site) DC DIGITAL HIGH VOLTMETER
In-house Procedure MDCPE-18 : 2013

16. Timer/Sweep time/Stopwatch In-house procedure MDCPE-13 : 2013

(Lab)
1 to 60 Sec 4.2 ppm + 6.6 msec
>1 min to 2 min 4.2 ppm + 6.8 msec
>2 min to 3 min 4.4 ppm + 8.6 msec
>3 min to 4 min 4.3 ppm + 8.1 msec
>4 min to 5 min 4.3 ppm + 7.6 msec
>5 min to 10 min 4.3 ppm + 9.0 msec
>10 min to 30 min 4.2 ppm + 8.2 msec
>30 min to 60 min 4.2 ppm + 8.2 msec
>60 min to 90 min 4.2 ppm + 8.5 msec
>90 min to 120 min 4.2 ppm + 9.8 msec

(On-site)
1 to 60 Sec Direct measurement with a 4.2 ppm + 6.6 mSec
>1 min to 2 min Frequency counter/Stop watch 4.2 ppm + 6.8 mSec
>2 min to 3 min In-house Procedure MDCPE-13 : 2013 4.2 ppm + 8.6 mSec
>3 min to 4 min 4.2 ppm + 8.1 mSec
>4 min to 5 min 4.2 ppm + 7.6 mSec
>5 min to 10 min 4.2 ppm + 9.0 mSec
>10 min to 30 min 4.2 ppm + 8.2 mSec
>30 min to 60 min 4.2 ppm + 8.2 mSec
>60 min to 90 min 4.2 ppm + 8.5 mSec
>90 min to 120 min 4.2 ppm + 9.8 mSec
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 38 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

17. Clamp Meter (Measure) (Lab) Direct measurement with a calibrator

20 A – 55 A DC 0.29 % + 61 mA
55 A – 150 A DC 0.30 % + 0.58 A
150 A – 1025 A DC 0.30 % + 0.59 A
20 A – 150 A 45 Hz – 65 Hz 0.34 % + 0.065 A
20 A – 55 A 65 Hz – 440 Hz 0.95 % + 0.066 A
55 A – 150 A 65 Hz – 440 Hz 0.95 % + 0.58 A
150 A – 1025 A 45 Hz – 65 Hz 0.34 % + 0.59 A
150 A – 550 A 65 Hz – 440 Hz 1.2 % + 0.59 A

(On-site)
DC (Measure) Direct measurement with a
20 A to 5 5A Mutiproduct Calibrator 0.29 % + 61 mA
55 A to 150 A In-house Procedure MDCPE-07 : 2013 0.29 % + 0.58 A
150 A to 1025 A 0.30 % + 0.58 A

AC (Measure) Direct measurement with a

Mutiproduct Calibrator
In-house Procedure MDCPE-07 : 2013
20 A to 150 A 45 Hz to 65 Hz 0.34 % + 0.065 A
20 A to 55 A 65 Hz to 440 Hz 0.95 % + 0.066 A
55 A to 150 A 65 Hz to 440Hz 0.95 % + 0.58 A
150 A to 1025 A 45 Hz to 65 Hz 0.34 % + 0.59 A
150 A to 550 A 65 Hz to 440 Hz 1.2 % + 0.59 A
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 39 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

18. Insulation / High Ohm / Tester, In-house Procedure MDCPE -19 : 2016
Surface Resistivity Tester
(Lab)
>0 to 1 kΩ 0.12 % + 0.58 Ω
>1 to 10 kΩ 0.12 % + 5.8 Ω
>10 to 100 kΩ 0.12 % + 58 Ω
>0.1 to 1 MΩ 0.12 % + 0.58 kΩ
>1 to 10 MΩ 1.2 % + 5.8 kΩ
>10 to 100 MΩ 1.2 % + 58 kΩ
>0.1 to 1 GΩ 1.2 % + 0.58 MΩ
>1 to 10 GΩ 1.2 % + 5.8 MΩ
>10 to 100 GΩ 3.5 % + 58 MΩ

(On-site) Direct measurement with a

>0 to 1 kΩ Standard Resistor 0.12 % + 0.58 Ω
>1 to 10 kΩ In-house Procedure MDCPE-19 : 2016 0.12 % + 5.8 Ω
>10 to 100 kΩ 0.12 % + 58 Ω
>0.1 to 1 MΩ 0.12 % + 0.58 kΩ
>1 to 10 MΩ 1.2 % + 5.8 kΩ
>10 to 100 MΩ 1.2 % + 58 kΩ
>0.1 to 1 GΩ 1.2 % + 0.58 MΩ
>1 to 10 GΩ 1.2 % + 5.8 MΩ
>10 to 100 GΩ 3.5 % + 58 MΩ
Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 40 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)
19. Oscilloscope (Measure) In-house Procedure MDCPE-20 : 2013
Time Mark
1 nS 12 ppm + 0.58 pS
2 nS 12 ppm + 0.58 pS
5 nS 12 ppm + 0.58 pS
10 nS 12 ppm + 5.8 pS
20 nS 12 ppm + 5.8 pS
50 nS 12 ppm + 5.8 pS
0.1 µS 12 ppm + 58 pS
0.2 µS 12 ppm + 58 pS
0.5 µS 12 ppm + 58 pS
1 µS 12 ppm + 0.58 nS
2 µS 12 ppm + 0.58 nS
5 µS 12 ppm + 0.58 nS
10 µS 12 ppm + 5.8 nS
20 µS 12 ppm + 5.8 nS
50 µS 12 ppm + 5.8 nS
0.1 mS 12 ppm + 58 nS
0.2 mS 12 ppm + 58 nS
0.5 mS 12 ppm + 58 nS
1 mS 12 ppm + 0.58 µS
2 mS 12 ppm + 0.58 µS
5 mS 12 ppm + 0.58 µS
10 mS 12 ppm + 5.8 µS
20 mS 12 ppm + 5.8 µS
50 mS 12 ppm + 5.8 µS
0.1 S 12 ppm + 5.8 µS
0.2 S 12 ppm + 58 µS
0.5 S 12 ppm + 58 µS
1S 12 ppm + 0.58 mS
2S 12 ppm + 0.58 mS
5S 12 ppm + 0.58 mS

Bandwidth
50 kHz to 20 MHZ 0.70 dB
100 kHz to 500 MHz 0.30 dB
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 41 of 42

MEASURED QUANTITIES/ CALIBRATION AND

INSTRUMENT/ RANGE TO BE METHOD MEASUREMENT
CALIBRATED CAPABILITY (CMC*)

20. Capacitance and Resistance In-house Procedure MDCPE-06 : 2013

(Measure)
1pF 1kHz to 10kHz 0.12%+0.00014 pF
1pF 10.01kHz to 100kHz 0.58%+0.00014 pF
10pF 100Hz to 999.9Hz 0.12%+0.00021 pF
10pF 1kHz to10kHz 0.12%+0.00014 pF
10pF 10.01kHz to100kHz 0.47%+0.0013 pF
100pF 100Hz to 999.9Hz 0.12%+0.014 pF
100pF 1kHz to 10kHz 0.12%+0.013 pF
100pF 10.01kHz to 100kHz 0.35%+0.013 pF
1000pF 100Hz to 999.9Hz 0.12%+0.013 pF
1000pF 1kHz to10kHz 0.12%+0.015 pF
1000pF 10.01kHz to100kHz 0.35%+0.014 pF
10nF 100Hz to 10kHz 0.12%+0.0013 nF
10nF 10.01kHz to 100kHz 0.35%+0.0014 nF
100nF 100Hz to 10 kHz 0.12%+0.013 nF
1uF 100Hz to 10 kHz 0.12%+0.14 nF
10Ω 100Hz to 999.9Hz 0.18%+0.0013 Ω
10Ω 1kHz 0.12%+0.0013 Ω
10Ω >1kHz to100kHz 0.70%+0.0013 Ω
100Ω 100Hz to 999.9Hz 0.081%+0.0013 Ω
100Ω 1kHz 0.047%+0.0013 Ω
100Ω >1kHz to100kHz 0.29%+0.0013 Ω
1kΩ 100Hz to 999.9Hz 0.070%+0.13 Ω
1kΩ 1kHz 0.035%+0.13 Ω
1kΩ >1kHz to 100kHz 0.43%+0.016 Ω
10kΩ 100Hz to 999.9Hz 0.070%+0.14 Ω
10kΩ 1kHz 0.035%+0.13 Ω
100kΩ 1kHz 0.070%+1.4 Ω

 CMC is expressed as an expanded uncertainty estimated at a level of confidence of approximately

95%.

NOTE : Direct conversion of the metric units to imperial units will be applied for imperial measurement
 Certificate No. : LA-1999-0160-C-1 Issue No. : 13

Date : 18 October 2016 Page : 42 of 42

Approved signatories

Mr John Peh - Item A (1-11, 16-23, 26-28, 30, 33, 36-39, 42, 43, 45-49, 53-56) and
Item B

Mr Ashley Chin - Item A except (50), Item B (except 6, 13-15), item C (except C8, C10)
1
and Item D (excluding insulation tester), Multimeter (4 /2 digits only) & only
for “Measure” including stop watch and clamp meter

Ms Jantaraporn Suwanchai - Item A (9 -16, 24, 25 and 30 )

Mr Sarawut Nooplien - Item C (1-7, 9-10)

Mr Weerasak Jokthong - Item A (1-11, 17, 18-20, 22, 24, 26--30, 31-45, 49, 51-53, 55-56, 61) and
Item B (1, 9-11)

1
Mr Jetsada Rungcharoenmongkhon - Item B (1-5, 7-9) and Multimeter (4 /2 digits only), Wrist Strap Tester and
only for “Source” for AC/DC Voltage / Current, Resistance and Stop Watch/
Timer

Mr Phusit Phetampai - Item A (46-48, 50, 54, 61)

Ms Peh Woon Teng - Item A (1-2, 7, 9-13, 16, 19-20, 26, 30, 40)

Mr Apichai Thepmaneerat - Item A (4, 12-16, 18, 24-25, 28, 34, 57-61)

Mr Sakchai Kongsom - Item D (1-18)

Mr Robert Aggangan - Item B (13-16), Item C and Item D (1 to 19 (Bandwidth up to

20MHz) & 20)

Ms Inthira Wanwong - Item A (1-3, 7-11, 19-20, 22, 24, 26, 27, 41, 42, 45 and 56)

Ms Chonticha Kittiwettayanusorn - Item A (12-14, 16, 24)

Note :

This laboratory is accredited in accordance with the recognised International Standard ISO/IEC 17025:2005. A
laboratory's fulfilment of the requirements of ISO/IEC 17025:2005 means the laboratory meets both the technical
competence requirements and management system requirements that are necessary for it to consistently
deliver technically valid calibration results. The management system requirements in ISO/IEC 17025:2005
(Section 4) are written in language relevant to laboratory operations and meet the principles of ISO 9001:2008
Quality Management Systems — Requirements and are aligned with its pertinent requirements.