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Standard Test Method for Calibration and Accuracy
Verification of Wideband Infrared
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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TB

Designation: E2847 − 14

Standard Test Method for

Calibration and Accuracy Verification of Wideband Infrared
Thermometers 1
This standard is issued under the fixed designation E2847; the number immediately following the designation indicates the year o
original
original adoption or, in the case of revis
revision,
ion, the year of last revision.
revision. A number in paren
parenthese
thesess indicates the year of last reappr
reapproval.
oval.
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.

1. Sco
Scope
pe  Development of International Standards, Guid
1.1 This test method covers electronic
electronic instruments
instruments intended mendations issued by the World Trade Organiz
for measurement of temperature by detecting the intensity of   Barriers to Trad
Tradee (TBT) Committee.
thermal radiation exchanged between the subject of measure- 2. Referenc
Referenced
ed Documents
ment and the sensor.
2.1   ASTM Standards: 2
1.2 The devices covered
covered by this test method are referred
referred to E344 Terminology
E344  Terminology Relating to Thermometr
as infrared thermometers in this document. etry
1.3 The infrared thermometer
thermometerss covered in this test method E1256 Test Method
Methodss for Radiati
Radiation
on Thermo
are ins
instru
trumen
ments
ts tha
thatt are int
intend
ended
ed to mea
measur
suree temp
tempera
eratur
tures
es Waveband Type)
below 1000°C, measure thermal radiation over a wide band- E2758 Gu Guid
idee fo
forr Se
Selec
lectio
tion
n an
andd Us
Usee of
width in the infrared region, and are direct-reading in tempera- Temperature Infrared Thermometers
ture.
3. Terminology
1.4 This guide covers best practice in calibrcalibrating
ating infrared
infrared
thermom
thermometer
eters.
s. It add
addres
resses
ses con
concer
cerns
ns tha
thatt will hel
help
p the use
userr 3.1  Definitions of Terms Specific to This Sta
perform more accurate calibrations. It also provides a structure 3.1.1   cavity bottom, n— the
the portion of the c
for calc
calcula
ulatio
tion
n of unc
uncerta
ertaint
inties
ies and rep
report
orting
ing of cal
calibr
ibratio
ation
n source forming the end of the cavity.
results to includ
includee uncer
uncertainty
tainty.. 3.1.1.1   Discussion— The
The cavity bottom is th
where
whe re an infinfrar
rared
ed the
thermo
rmomete
meterr bei
being
ng cali
1.5 De
1.5 Detai
tails
ls on th
thee de
desig
sign
n an
andd co
cons
nstr
truc
uctio
tion
n of in
infr
frar
ared
ed radiation.
thermometers are not covered in this test method.
3.1.2   cavity radiation source, n— a concave
1.6 This test method does not cover infrared thermometry
thermometry etry approximating a perfect blackbody of cont
above
abo ve 100
1000°C
0°C.. It doe
doess not address
address the use of nar
narrow
rowban
band
d turee and defi
tur defined
ned emis
emissiv
sivity
ity use
usedd for cali
calibra
bra
infrared
infrared thermometers
thermometers or infrared thermometers
thermometers that do not thermometers.
indicate temperature directly. 3.1.2.1   Discussion— A cavity radiation sour
1.7 The values
values stated in SI uni
units
ts are to be reg
regard
arded
ed as the thermal radiation sources.
standard. The values given in parentheses are for information 3.1.2.2   Discussion— To be a ca cavi
vity
ty ra
only. practical value for calibration, at least 90 % of th
1.8 The values stated in inch-pound units are to be regarded 
regarded  of a radiation thermometer is expected to be
as standard. The values given in parentheses are mathematical cavity bottom. In addition, the ratio of the leng
conversions to SI units that are provided for information only versus the cavity diameter is expected to be
and are not considered standard. equal to 5:1.
1.9   This int
intern
ernati
ationa
onall sta
standa
ndard
rd was dev
develo
eloped
ped in accaccor
or-- 3.1.3   cavity
cavity wall
walls,
s, n— the
the ins
inside
ide surfaces
surfaces
dance with internationally recognized principles on standard- shape forming a cavity radiation source.
izatio
ization
n esesta
tabl
blis
ishe
hed
d in th
thee De
Decis
cisio
ion
n on Pr
Prin
incip
ciple
less fo
forr th
thee 3.1.4  customer, n— the
the individual or instituti
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3.1.6   effective emissivity, n— t he ratio of the amount of  5. Significance and Use
energy over a given spectral band exiting a thermal radiation 5.1 This guide provides guidelines and bas
source to that predicted by Planck’s Law at a given tempera- for the accuracy verification of infrared
ture. includes test set-up and calculation of unc
3.1.7   field-of-view, n— a usually circular, flat surface of a intended to provide the user with a consistent
measured object from which the radiation thermometer re- remaining flexible in the choice of calibration
ceives radiation. (1)3 understood that the uncertainty obtained depen
3.1.7.1   Discussion— Many handheld infrared thermometers upon the apparatus and instrumentation used. T
manufacturers include distance-to-size ratio (D:S) in their this guide is not prescriptive in approach, it pr
specifications. Distance-to-size ratio relates to the following instruction in uncertainty evaluation to
physical situation: at a given distance (D), the infrared ther- variety of apparatus and instrumentation
mometer measures a size (S) or diameter, and a certain ployed.
percentage of the thermal radiation received by the infrared
5.2 This guide is intended primarily for calib
thermometer is within this size. Field-of-view is a measure of 
infrared thermometers. However, the techniqu
the property described by distance-to-size ratio. (1)
this guide may also be appropriate for calibrati
3.1.8   flatplate radiation source, n— a planar surface of  of radiation thermometers. It may also be
controlled temperature and defined emissivity used for calibra- calibrating thermal imagers.
tions of radiation thermometers.
5.3 This guide specifies the necessary eleme
3.1.8.1   Discussion— A flatplate radiation source is a subset
of calibration for an infrared thermome
of thermal radiation sources.
elements are intended as a communication tool
3.1.9   measuring temperature range, n— temperature range user of these instruments make accurate meas
for which the radiation thermometer is designed.  (1) elements also provide enough information, so th
3.1.10  purge, n— a process that uses a dry gas to remove the the calibration can be reproduced in a separate
possibility of vapor on a measuring surface.
6. Sources of Uncertainty
3.1.11   radiance temperature, n— temperature of an ideal (or
perfect) blackbody radiator having the same radiance over a 6.1 Uncertainties are present in all calibra
given spectral band as that of the surface being measured.  (2) ties are underestimated when their effects are
3.1.12   thermal radiation source, n— a geometrically shaped or omitted. The predominant sources of unc
object of controlled temperature and defined emissivity used scribed in Section 10  and are listed in  Table 1
for calibration of radiation thermometers. of   Appendix X1.

3.1.13   usage temperature range, n— temperature range for 6.2 Typically, the most prevalent sources of
which a radiation thermometer is designed to be utilized by the this method of calibration are: ( 1) emissivity e
end user. calibration source, ( 2 ) size-of-source
thermometer, (3) temperature gradients on the r
4. Summary of Practice (4) improper alignment of the infrared
respect to the radiation source, ( 5) calibration
4.1 The practice consists of comparing the readout tempera-
the radiation source, (6 ) ambient temperature a
ture of an infrared thermometer to the radiance temperature of  temperature. The order of prevalence of the
a radiation source. The radiance temperature shall correspond may vary, depending on use of proper procedu
to the spectral range of the infrared thermometer under test.
of thermal radiation source used. Depending o
4.2 The radiation source may be of two types. Ideally, the ture of the radiation source, the calibration
source will be a cavity source having an emissivity close to radiation source, the optical characteristics
unity (1.00). However, because the field-of-view of some thermometer and the detector and filter charac
infrared thermometers is larger than typical blackbody cavity
apertures, a large-area flatplate source may be used for these
calibrations. In either case, the traceable measurement of the TABLE 1 Components of Uncertain
radiance temperature of the source shall be known, along with Uncertainty Component Discussion Ev
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Thermometers1 Full description
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E2847 − 14

infrared thermometer, the contribution of these uncertainties will result in a smaller uncertainty. A smaller c
may change significantly in the overall uncertainty budget. will also result in a smaller uncertainty.
7.1.3.2 The location of a reference or a
7. Apparatus
both, and the thermal conductivity of the ca
7.1   Thermal Radiation Source: important considerations in cavity source
7.1.1 There are two different classes of thermal radiation general, a reference or control probe should
sources which can be used for infrared thermometer calibra- practical to the center of the area where the infr
tions: a cavity source and a flatplate source. Some sources may eter will typically measure, typically the cavity
be considered a hybrid of both categories. Each of these is a separation between the location of the refer
sources has advantages and disadvantages. The cavity source the cavity surface, cavity walls with a higher th
provides a source of radiation that has a more predictable tivity will result in a smaller uncertainty due
emissivity. However, the flatplate source can usually be made gradients in this region.
less expensively, and can be made with a diameter large
7.1.3.3 The walls of the cavity source
enough to calibrate infrared thermometers with low distance to
several different ways. A painted or ceram
size ratios (D:S).
generally result in higher emissivity than
7.1.2 Ideally, the size of the thermal radiation source should
surface. By the same measure an oxidized me
be specified by the infrared thermometer manufacturer. In
generally result in higher emissivity than a non
many cases, this information may not be available. In these
surface. In some cases, it may be impossible to
cases a field-of-view test should be completed as discussed in
source surface. This is especially true at high t
E1256. The portion of signal incident on the infrared thermom-
eter that does not come from the source should be accounted 7.1.3.4 The effective emissivity of the cavity
for in the uncertainty budget. calculated to determine the radiance temperatu
7.1.3   Cavity Source: Calculation of effective emissivity is beyond th
7.1.3.1 A cavity source can be constructed in several shapes standard. Determination of effective emissivit
as shown in Fig. 1. In general, a high length-to-diameter ratio ematically calculated or modeled.
(L:D) or radius-to-diameter ratio (R:D) in the spherical case 7.1.4   Flatplate Source:
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7.1.4.1 A flatplate source is a device that consists of a 7.3.1 The thermal radiation source shall be c
painted circular or rectangular plate. The emissivity is likely to transfer standard traceable to a national metro
be less well defined than with a cavity source. This can be such as the National Institute of Standards
partially overcome by performing a radiometric transfer (see (NIST) or National Research Council (NRC)
Scheme II in   7.3.7) to the flatplate source. However, the thermometer (radiometric or contact) is used
radiometric transfer should be carried out with an instrument bration of the unit-under-test, this serves as th
operating over a similar spectral band as the infrared thermom- the radiation source. In this case, the referenc
eter under test. shall have a calibration traceable to a nat
7.1.4.2 A cavity source is the preferred radiometric source institute.
for infrared thermometer calibrations. The cavity source has 7.3.2 This calibration of the thermal radiat
two main advantages over a flatplate source. First, the cavity take place in the calibration laboratory, or it m
source has better defined emissivity and an emissivity much third party calibration laboratory. The interval
closer to unity due to its geometric shape. Second, along with is determined by the calibration laboratory. The
the emissvity being closer to unity, the effects of reflected the calibration interval is part of the calibratio
temperature are lessened. Temperature uniformity on the flat- for the infrared thermometer calibration.
plate source may be more of a concern as well. However, a 7.3.3 Regardless of whether a cavity sourc
flatplate source has a main advantage over a cavity source. The source is used, there are two approaches
temperature controlled flatplate surface can be much larger source: contact calibration (Fig. 3, Scheme I) a
than a typical cavity source opening, allowing for much calibration (Fig. 3, Scheme II). (3)
smaller D:S ratios (greater field-of-view).
7.3.4 In Fig. 3 the arrows show the path of tr
7.2   Aperture: International System of Units (SI) through a n
7.2.1 An additional aperture may not be needed for all logical institute (NMI). The reference radiatio
calibrations. An aperture is typically used to control scatter. If  cavity source or blackbody source used to calibr
used, the aperture should be temperature-controlled or reflec- thermometer. In Scheme I, it is shown that th
tive. An aperture should be used if recommended by the ment and the emissivity correction shall
infrared thermometer manufacturer. If an aperture is used for temperature calculation. The ∆T measurement
calibration, this information should be stated in the report of  difference in temperature between the referenc
calibration. The information that shall be included is the and the cavity walls. The emissivity correction
aperture distance, the aperture size, and the measuring dis- radiation source not having the same emissiv
tance. A possible configuration for aperture use is shown in Fig. thermometer’s emissivity setting. The symbo
2. wavelength and bandwidth of the transfer radia
7.2.2 In Fig. 2, dapr  is the aperture distance. The measuring eter and the infrared thermometer.
distance is shown by d meas. 7.3.5 In either scheme, the transfer standar
7.3   Transfer Standard: able to a national metrological institute.
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7.7  Calibrations Below the Dew-Point or Fr

7.7.1 For calibrations where the set-point
source is below the dew or frost point, it may b
purge the area around the source with a dry ga
nitrogen or dried air to prevent ice buildup. It
to use a vacuum for this purpose. It is beyond th
standard to recommend a specific design or me
purge.
8. Preparation of Apparatus
8.1   Infrared Thermometer:
8.1.1 The infrared thermometer should be
ambient temperature before any measurements
amount of time may be specified by the manuf
not the case, experimentation may need to be
mine the proper time for the device to thermally
uncertainty should be accounted for in the ambi
section of the uncertainty budget.
8.1.2 If a lens cleaning is required, it sha
following the manufacturer’s guidelines.
FIG. 3 Calibration Schemes I and II
8.2   Radiation Source:
8.2.1 The radiation source should be set
calibration temperature and allowed to stab
7.3.6 In Scheme I, a contact thermometer is used as the
calibration temperature. Any effects due to settl
transfer standard. The emissivity uncertainties become of 
be accounted for in the uncertainty budget.
greater concern. This is especially the case when using a
8.2.2 If a purge device is used with the radi
flatplate source.
the calibration, it should be in place before the r
7.3.7 In Scheme II, a radiation thermometer is used as the
is stabilized.
transfer standard. In this scheme, the emissivity and heat
exchange uncertainties are greatly reduced. This is especially 9. Procedure
significant in the case of using a flatplate source. the radiation 9.1   Calibration Points:
thermometer should operate over a similar spectral range as the 9.1.1 The number of calibration points used
infrared thermometer to be calibrated. Any differences in bration should be determined by the customer
spectral range will result in additional uncertaintes. For does not know what points to use for a calibr
instance, if the radiation source is calibrated with an 8 to 14 µm mendation may be made. For an infrared
radiation thermometer, and an infrared thermometer with a 7 to over a narrow range of temperature, one point m
14 µm spectral response is being calibrated, even this differ- For an infrared thermometer used over
ence in bandwidth shall be accounted for in the uncertainty temperature, a minimum of three calibration p
budget, since the radiance temperature (due mostly to the chosen. These points should represent at least
effective emissivity) will be different. maximum and midpoint temperature of the infr
7.4   Ambient Temperature Thermometer: eter usage temperature range. The usage range
7.4.1 The ambient temperature should be monitored during same as the measuring temperature rang
the calibration to ensure that it is within the laboratory’s limits. thermometer.
This should be done using a calibrated thermometer. At a 9.1.2 The order of calibration points
minimum, the laboratory’s ambient temperature limits should However, it is important to note that heating
be recorded on the report of calibration. thermometer by the calibration source may ca
7.5   Mounting Device: similar to thermal shock. This is especially tr
7.5.1 The infrared thermometer may be mounted on a tripod from a calibration source at a higher temperatu
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reflected temperature setting may be called background tem- 9.5.3  ‘X’- and ‘Y’-Axes Alignment:
perature or ambient temperature on some devices. Many 9.5.3.1 Alignment in the ‘X’ and ‘Y’directio
infrared thermometers do not have a manual reflected tempera- using lasers provided with the infrared thermo
ture setting. On these devices, reflected temperature is com- be done by maximizing the signal. Use of las
pensated for internally. quicker method, but the laser pointer may no
9.4   Emissivity Setting: optical center of the infrared thermometer. A
9.4.1 The emissivity setting of the infrared thermometer thermometer may have some other optical al
should match the emissivity or emissivity setting of the such as light-emitting diodes that may
radiation source. Maximizing the signal is the preferred method
9.4.2 Some infrared thermometers have a fixed emissivity 9.5.3.2 If using laser alignment, center
setting and some radiation sources have a fixed emissivity. In center of the radiation source.
a case where both settings are fixed and are not equal, a 9.5.3.3 If maximizing the signal, for
mathematical adjustment shall be made. An example of such an above ambient, the position of the infrared the
adjustment can be found in  X2.3. be adjusted vertically and horizontally to prod
9.4.3 The preferred method is to adjust the infrared ther- temperature while also maintaining the line o
mometer emissivity setting to the radiation source’s emissivity. dicular to the source. This is illustrated
If the radiation source receives a contact calibration (Fig. 3, example in Fig. 5, the maximum temperature o
Scheme I), this emissivity would be the emissivity of the infrared thermometer’s readout is 300.3°C.
surface. If the radiation source receives a radiometric calibra- points below ambient, the temperature shall be
tion (Fig. 3, Scheme II), the emissivity would be the emissivity 9.5.3.4 In cases where the size of the rad
setting of the transfer standard. If the emissivity setting of the much larger than the field-of-view of
infrared thermometer cannot be set exactly to the effective thermometer, the temperature may plateau inst
emissivity of the thermal radiation source, then a correction a simple maximum or minimum. In such
may be made as is shown in  X2.3. change in temperature should be observed wh
infrared thermometer along an axis. Then
9.5   Alignment: mometer should be centered midway between th
9.5.1   Preparation: This shall be done for both axes. This is illustr
9.5.1.1 If an additional aperture is used for the calibration, this case, the infrared thermometer is moved fr
ensure that the aperture is properly emplaced at the specified A plateau in the temperature readout of 300.3°C
distance as shown in   Fig. 2.  If the aperture is temperature- this case the user shall observe a drop-off in t
controlled, ensure that the aperture is within its specified readout of 3.0°C. This means the user should b
temperature limits. reading of 297.3°C. Points ‘A’ and ‘B’ indic
9.5.1.2 In   Fig. 4, the measuring distance is designated by drop-off occurs. Point ‘C’ represents the mid-p
‘d’. The ‘X’ axis refers to the horizontal direction; the ‘Y’ axis ‘B’.
refers to the vertical direction; and the ‘Z’ axis refers to the 9.5.3.5 The defined change should be at
direction coming out of the cavity or flat plate. In the case of  infrared thermometer plateau reading in °C or 1
the flatplate, the ‘Z’ axis is always normal to the flatplate is greater. For example, if the infrared thermom
surface. 120.0°C, the defined change should be at lea
9.5.1.3 If a fixture is being used to hold the infrared infrared thermometer readout is 50.0°C, the
thermometer for calibration, mount the infrared thermometer. should be at least 1.0°C.
9.5.1.4 If the infrared thermometer calibration mounting is
manual, hold the infrared thermometer in front of the radiation 9.6   Measurement:
source at the specified distance. 9.6.1 Perform measurements according to
9.5.1.5 Ensure that the infrared thermometer is roughly er’s procedures. The measurement time sho
level and normal to the target surface. Ideally, the angle significantly longer than the infrared thermom
between the normal to a flatplate source and the line of sight of  time. It may be necessary to take more than on
the infrared thermometer should be less than 5°. When using a to determine repeatability and reduce uncertain
cavity source, the angle of incidence should be small enough to Record the measured temperature.
allow for the infrared thermometer’s field-of-view to see the 9.7   Adjustment:
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FIG. 4 Calibration Setup Showing Measuring Devices

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E2847 − 14

FIG. 6 X-Y Alignment in the Plateau Case

10. Measurement Uncertainty ] S 

10.1   Overview: ] T meas ~ T meas!

] S 
U  REFL~ T meas! 5 ~ T  ! 5
10.1.1 While it is beyond the scope of this document to ] T  W 
] S  ~ T  ! W 
] S 

provide tests and methods to determine each element of the

uncertainty budget, the format shown here should provide a 10.2.3 Uncertainty due to Emissivity.
basic framework for uncertainty budget calculations. Any 10.2.3.1 To evaluate for source emissivity u
calculations of measurement uncertainty should follow local is differentiated to get  Eq 4. This number is th
uncertainty budget calculation guidelines such as the “U.S. to get the uncertainty due to reflected temperatu
Guide to the Expression of Uncertainty in Measurement” or the of this calculation is shown in  X2.4.
“Evaluation of Measurement Data – Guide to the Expression of 
~ T 
] S  meas ! 1
Uncertainty in Measurement.” 5 @ S ~ T  ! 2 S ~ T 
S  W 
] ϵ S  ϵ instr 
10.1.2 The uncertainties as presented in this guide are listed
in Table 1. ~ T 
] S  meas

] T meas ] ϵ S 
10.2   Measurement Equation: U  ~ T meas! 5 U ~ ϵ S ! 5
ϵ
] ϵ S  ~ T 
] S  meas
10.2.1 The measurement equation is shown in Eq 1. Uncer-
] T 
tainty in the calibration temperature is accounted for by
evaluating TS. The uncertainty in reflected ambient radiation is 10.3   Source Related Uncertainties:
accounted for by evaluating by S(T W). The effects of uncer- 10.3.1 The uncertainties listed in  10.4 – 10
tainty in source emissivity are accounted for by evaluating εS. thermal radiation source.

~1 2 ϵ ! ~ϵ 2 ϵ instr  ! 10.4   Calibration Temperature:

instr  S 
S ~ T meas! 5 S ~ T S ! 1 @ S ~ T  ! 2 S ~ T  ! # 1
W  d  @ S ~ T  !
S  10.4.1 The calibration temperature of
ϵ instr  ϵ instr 
temperature of the source as indicated by the so
2 S ~ T W ! # (1 )
In Scheme I, this is the uncertainty of the temp
where: as determined by contact traceability. In Schem
S(T) = implementation of the Sakuma-Hattori Equation uncertainty of the radiance temperature readou
εS  = emissivity of the measured surface by radiometric traceability.
ε INST  = instrument emissivity setting
10.5   Source Emissivity:
T  MEAS  = infrared thermometer readout temperature
10.5.1   Calibration Scheme I – Flatplate
T S  = expected radiation temperature of the thermal ra-
case, the emissivity of the surface is determined
diation source
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E2847 − 14

spectral bandwidth. However, these uncertainties are reduced a steady-state housing temperature. This is esp
significantly compared to those in Scheme I. after the infrared thermometer is introd
10.6   Reflected Ambient Radiation: environment. The effects of ambient temperatu
in detector temperature on radiometric measu
10.6.1 Reflected radiation is sometimes referred to as back-
be determined for each specific model of infrare
ground radiation. The cause of its effect is sometimes referred
under test.
to as background temperature. This uncertainty is much more
of a concern when calibrating instruments with a flatplate 10.13   Atmospheric Absorption:
source than it is with a cavity source. It is especially a concern 10.13.1 The uncertainties related to atmosp
when measuring objects at temperatures below ambient. To are typically very low. Nevertheless, they shou
calculate this uncertainty, utilize Eq 2 and 3. for. The calculations outlined in this standard
 Bureau international des poids et mesures  (BI
10.7   Source Heat Exchange:
(4)
10.7.1 Source heat exchange is the uncertainty of the
10.13.2 For measuring distances greater tha
difference between the source’s control sensor or readout
of standard atmosphere shall be consulted
temperature and the source’s actual surface temperature. This
distances of 1 m or less, the expanded uncert
uncertainty is due to heat flow between the sensor location and
normally 0.0006.
the source’s surface. If the flatplate source is calibrated with a
10.13.3   Table X2.1 in  X2.6  gives calculate
radiometrically, this uncertainty is minimized. However, there
atmospheric absorption uncertainties at variou
still is some uncertainty since the heat flow may be different
This table is specific to the 8 to 14 µm spec
from time to time.
calculations for other spectral bands, consult
10.8   Ambient Conditions:
10.14   Noise:
10.8.1 This uncertainty largely accounts for variances due to
10.14.1 Noise is unwanted signal experienc
convection, although other factors may play a role. For a
red thermometer’s measurement system. The
flatplate source, the effects of convection are minimal. For a
noise can be from both electrical and physica
cavity source, the effects of convection should be even less.
uncertainty can be taken from the infrar
However, if a source of forced air is close to the source, this
specifications or determined by experimentati
uncertainty may be more of an issue. Essentially, when a forced
air source is placed close to the surface, the uniformity pattern 10.15   Display Resolution:
of the surface may be changed. This may be a very difficult 10.15.1 This is the contribution due to quan
uncertainty to determine. The conditions of air flow may have the infrared thermometer readout.
to be exaggerated to get a true idea of this effect. 10.15.2 To calculate display resolution unce
display resolution and divide by two. Th
10.9   Source Uniformity:
rectangular distribution. Use standard practice t
10.9.1 Source uniformity is uncertainty due to temperature
expanded uncertainty of a rectangular
non-homogeneity on the calibrator surface. Since an infrared
example, if an infrared thermometer has a displ
thermometer averages the temperatures within its field-of-
0.1°C, then the rectangular distribution is
view, this uncertainty is calculated by considering how much
expanded uncertainty is 0.058°C.
the uniformity will cause a difference in measurement between
a measurement of a small spot at the center of the source and 10.16   Sample Uncertainty Budget:
a larger spot corresponding to the infrared thermometer under 10.16.1 A sample uncertainty budget for
test. mometer calibration is shown in Table X1.1
no manner represents an uncertainty bud
10.10   Infrared Thermometer Related Uncertainties:
model of infrared thermometer or a specific cal
10.10.1 The uncertainties listed in   10.11 – 10.15  relate to Note that all uncertainties listed in this tab
the infrared thermometer under test. uncertainties (k = 2).
10.11   Size-of-Source Effect:
10.11.1 Size-of-source effect uncertainty is caused by any 11. Report
radiation measured from the source or its surroundings not 11.1 Report the calibration results in any co
accounted for by the source uniformity uncertainty in   10.9 This may be a table of values of nominal tempe
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the measurement uncertainties. The infrared thermometer read- 13. Precision and Bias
ing versus corrected source temperature is best represented in 13.1 Due to the varying nature of the equipm
a table. Supplementary information, including a concise de- test method, no statement can be made about th
scription of the calibration method, a list of the reference bias of this test method. Instead, an estimate
instruments used, a statement regarding the traceability of the otherwise known as an uncertainty budg
calibration, a reference to or a description of the uncertainty uncertainty evaluation shall follow the metho
budget, and a citation of this guide, may be requested by Measurement Uncertainty section.
customers.
11.3 A sample report is included in  Appendix X4. 14. Keywords

12. Recordkeeping Requirements 14.1 accuracy verifications; background

bodies; calibrations; cavity radiation sources;
12.1 A record system of all calibrations shall be kept. This ratios; emissivities; fields-of-view; flatplate rad
system shall contain sufficient information to permit regenera- handheld thermometers; infrared; infrared
tion of the certificate, however named, and shall include the diation thermometers; reflected radiations;
identity of personnel involved in preparation and calibration. fects; spot sizes; temperature measurements
12.2 Calibration records shall be retained for the period of  thermal radiation sources; thermometries; tran
time defined by the laboratory’s quality system. uncertainties

APPENDIXES

(Nonmandatory Information)

X1. SAMPLE UNCERTAINTY BUDGET

X1.1

TABLE X1.1 Sample Uncertainty Budget

Uncertainty Desig. Type U(0°C) U(100°C) U
(°C) (°C)
Source
Calibration Temperature U1 B 0.300 0.380
Source Emissivity U2 B 0.090 0.198
Reflected Ambient Radiation U3 A 0.186 0.090
Source Heat Exchange U4 B 0.016 0.049
Ambient Conditions U5 B 0.019 0.054
Source Uniformity U6 A 0.100 0.180
Infrared Thermometer
Size-of-Source Effect U7 B 0.002 0.006
Ambient Temperature U8 A 0.100 0.100
Atmospheric Absorption U9 B 0.033 0.059
Noise U10 A 0.125 0.125
Display Resolution U11 A 0.058 0.058
Combined Expanded Uncertainty (k=2) 0.416 0.512

X2. UNCERTAINTY CALCULATION

X2.1 General doing the mathematics using these equations, K

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] S 

] T 
5
~
 Ac2
@ S ~ T ! # C   AT 1 B exp  AT 1 B
2

! 2 S c2
D   (X2.3)
X2.3.3 Using  Table X2.1 S(TS) = 0.020292
0.0076966. These values are used in  Eq X2.8
X2.2.2 In Eq X2.1, Eq X2.2, and Eq X2.3, c2  is a physical X2.9.
constant. A, B, and C are constants derived from the infrared @ 0.97 2 0.95#
S ~ T  MEAS ! 5 0.02029201 @ 0.0202920
thermometer’s relationship between signal received and tem- 0.95
perature. A and B are derived from the infrared thermometer’s 5 0.0205572
spectral response. C is a scalar based on infrared thermometer
X2.3.4 To determine what the measured tem
gain and can be considered as unity for this analysis. Calcula-
be, use Eq X2.2. This results in a temperature
tion for these constants is shown in  Eq X2.4, Eq X2.6, Eq X2.6,
and Eq X2.7. The value for ∆λ   is the infrared thermometer’s 101.28°C.
bandwidth. The value for λ 0   is the infrared thermometer’s
center wavelength based on a simple average of the infrared X2.4 Emissivity Uncertainty
thermometer’s high and low bandwidth limits. X2.4.1 For this calculation, Eq 4 and Eq

S
 A 5 λ 0 1 2
∆λ 2
2 λ  2
0
D   (X2.4)
X2.4.2 For this example, an 8 to 14 µm infr
eter is being calibrated. The true temperature of
c 2 ∆λ 2 is 200.00°C. The emissivity setting of the infrar
 B 5   (X2.5) (εIRT) is 0.95. The nominal emissivity of the su
24λ 20
0.95 with an expanded uncertainty of U(
C  5 1.0 (X2.6)
reflected temperature (TREFL) is 23°C.
c 2 5 14387.752 µ mK    (X2.7)
X2.4.3 Using  Table X2.1, S(T S) = 0.046116
X2.2.3 For example, the 8 to 14 µm spectral band is 0.0076966. These values are used in  Eq 4 to g
considered. For the 8 to 14 µm spectral band, λ 0=11 µm and Eq X2.10.
∆λ = 6 µm. Using   X2.4 and   X2.5,  A=9.364 µm and B=178.4
µmK. ~ T 
] S  !
meas
1 1
] ϵ S 
5 @ S ~ T  ! 2 S ~ T  ! # 5 0.95 @ 0.046116
ϵ instr  S  W 

X2.2.4   Table X2.1  shows computed values for the 8 to 14

5 0.0404415
X2.4.4 This value is used in Eq 5   wi
TABLE X2.1 Sakuma-Hattori Calculations for the 8 to 14 µm -1
Spectral Band ∂S(Tmeas)/  ∂T = 0.000305968 K obtained fro
This calculates the expanded uncertainty in ter
T )S/ )T
S(T) ture as shown in  Eq X2.11.
(°C) (K-1)
-50 0.0017606 0.000046195
] S  ~ T 
meas !
-25 0.0031919 0.000068911 ] ϵ S  0.0404415
0 0.0052311 0.000094630 U  ~ T meas! 5 U ~ ϵ S ! 5
ϵ
] S  ~ T 
meas ! 0.000305968 K 
23 0.0076966 0.000119945
] T 
50 0.0113476 0.000150582
100 0.0202920 0.000206805
200 0.0461160 0.000305968
300 0.0807067 0.000382129 X2.4.5 A graphical representation of a sim
400 0.1218801 0.000438476 shown in Fig. X2.1 in with TS ranging from -5
500 0.1679132 0.000480126
750 0.2969221 0.000544734 In this example, U( εS) = 0.01.
1000 0.4378341 0.000579281
X2.5 Reflected Temperature Uncertainty
X2.5.1 To calculate the uncertainty due to
µm spectral band for S(T) and  ∂ S/ ∂T. The computed values are perature use Eq 2 and Eq 3.
based on the parameters discussed in  X2.2.3.
X2.5.2 In this example, the emissivity sett
X2.3 Infrared Thermometer with a Fixed Emissivity Set- 8 to 14 µm infrared thermometer is correctly s
ting true temperature of the source (TS) is 0°
thermometer calculates the reflected temperatur
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FIG. X2.1 Emissivity Uncertainty Contribution to Total Uncertainty

~ T  !
] S  W 
X2.6.2 For example, consider calculating
~ T  ! ] T 
] S  meas due to atmospheric absorption. An 8 to
U  REFL~ T meas! 5 U ~ T  !
] S ~ T  ! ] S ~ T  !
W  meas
W 
thermometer is calibrated using a 200°C (473
] T  Using   Eq X2.1, S = 0.0461160, and   Eq
0.00019945 K 2 1 0.000305968 K -1.
5 0.052632 3.0 K  5 0.20 k 
0.000094630 K 2 1
X2.6.3 Apply these data to Eq X2.14. The so
(X2.13)
in Eq X2.15.
X2.5.5 A graphical representation of a similar example is
1 U ~ S !
shown in Fig. X2.2 with TS ranging from -50°C to 1000°C. In U ~ T ! 5 S 
this example, U(TW) = 1.0 K. S D
] S 

] T 
S 

X2.6 Atmospheric Absorption Uncertainty 0.0006

U ~ T ! 5 0.0461160 5
X2.6.1 To determine the uncertainty due to atmospheric 0.000305968 K 2 1
absorption,  Bureau international des poids et mesures  (Inter- X2.6.4   Table X2.2   shows calculated unc
national Bureau of Weights and Measures or BIPM) provides
atmospheric absorption for the 8 to 14 µm spe
values in uncertainty in terms of signal strength. The normal
value for this uncertainty in terms of expanded uncertainty (k 
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FIG. X2.2 Reflected Temperature Uncertainty Contribution to Total Uncertainty

TABLE X2.2 Uncertainties for Atmospheric Absorption for the 8

to 14 µm Spectral Band
Atmospheric
T )S/ )T
S Absorption
(°C) (K-1)
(K)
-50 0.0017606 0.000046195 0.023
-25 0.0031919 0.000068911 0.028
0 0.0052311 0.000094630 0.033
23 0.0076966 0.000119945 0.039
50 0.0113476 0.000150582 0.045
100 0.0202920 0.000206805 0.059
200 0.0461160 0.000305968 0.090
300 0.0807067 0.000382129 0.127
400 0.1218801 0.000438476 0.167
500 0.1679132 0.000480126 0.210
750 0.2969221 0.000544734 0.327
1000 0.4378341 0.000579281 0.453
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X3. DETECTOR TEMPERATURE DETERMINATION ( 5)

X3.1 A point of difficulty throughout in determining tem- ambient temperature do not need to be kn
perature uncertainty is that the value of T d  is not known to the required is that these values are constan
user. It is measured internally by the instrument, but is not measurements. The detector temperature, T d
displayed on the readout. The best assumption is that T d will be from the  Eq X3.1
the same as, or close to, ambient temperature, and this may
ϵ INSTR1 S ~ T  MEAS 1 ! 2 ϵ INSTR2 S ~
require some conditioning of the instrument before use. S ~ T d ! 5
ϵ INSTR1 2 ϵ INSTR2
However, there are some situations where ensuring that T d =
Tamb is not practicable. One is where the infrared thermometer where:
is used for an extended period in front of a hot source (for T  MEAS1 – T  MEAS2 = the two infrared th
example, during calibration at high temperatures), where the ings corresponding
radiation from the source may heat the detector above ambient εINSTR2, respectively
temperature. The second is where the infrared thermometer is ε INSTR1 and  ε INSTR2 = the emissivity setting
used inside a walk-in freezer, where the ambient temperature is
X3.4 The accuracy of calculations made
well below the specified operating temperature for the ther-
best when  ε INSTR1  and  ε INSTR2  are widely space
mometer. In these cases, the thermometer can still be used
and 1 are usually adequate.
successfully, but the detector shall be maintained above a
defined temperature, usually above 0°C. X3.5 For example, two readings of a blackb
to 14 µm thermometer might be T meas1  = 141
X3.2 Dependence on the detector temperature is removed if  instrumental emissivity is set to εinstr1   = 1,
the instrumental emissivity is set to 1 (this is precluded in fixed 219.4°C when εinstr2   = 0.5. Substituting these
emissivity instruments). On the other hand, relatively large X3.1 gives Td  = 21.5°C.
errors in the estimate (guess) of the detector temperature can
usually be tolerated without significant error in the reading. X3.6 Calculations of this sort are useful for
expected variation of detector temperature as
X3.3 For adjustable emissivity instruments, the detector inside the laboratory change. While it is not po
temperature can be inferred from two measurements of the for fixed emissivity instruments, it may be po
same target using two different instrumental emissivity set- their behavior from measurements on similar a
tings. The temperature and emissivity of the target and the sivity instruments.
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X4. SAMPLE REPORT FOR AN INFRARED THERMOMETER

See Fig. X4.1.
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FIG. X4.1 Sample Report for an Infrared Thermometer  (continued) 

REFERENCES

(1)  IEC/TS 62492-1, Industrial process control devices -Radiation ther- M., Bloembergen, P., “Uncertainty budgets for calib
mometers -Part 1: Technical data for radiation thermometers, IEC, thermometers below the silver point”, CCT-WG5
Geneva, Switzerland, 2008. Available from International Electrotech- CCT-WG508-03, BIPM, Sèvres, France, May 2008
nical Commission (IEC), 3, rue de Varembé, P.O. Box 131, CH-1211 the BIPM website, http://www.bipm.org.
Geneva 20, Switzerland, http://www.iec.ch. (5)  Saunders, P., MSL Technical Guide 22 -Calibration
(2)   DeWitt, D. P., and Nutter, G. D., eds., “Theory and Practice of  ture Infrared Thermometers, Measurement Standa
Radiation Thermometry,” John Wiley and Sons, New York, NY, 1988. New Zealand, 2008, http://msl.irl.cri.nz/traini
(3)   VDI 3511 Blatt 4.4 / Part 4.4, Technische Temperaturemessung technical-guides.
Strahlungsthermometrie Kalibrierung von Strahlungsthermometern,
(6)   Evaluation of Measurement Data – Guide to
Temperature measurement in industry Radiation thermometry Cali-
Uncertainty in Measurement,  JCGM 100, BIPM, Sè
bration of radiation thermometers.
2008. Available from the BIPM website, http://ww
(4)  Fischer, J., Saunders, P., Sadli, M., Battuello, M., Park, C. W., Yuan,
(7)   U. S. Guide to the Expression of Uncertain
Z., Yoon, H., Li, W., van der Ham, E., Sakuma, F., Yamada, Y.,
National Conference of Standards Laboratories, B
Ballico, M., Machin, G., Fox, N., Hollandt, J., Ugur, S., Matveyev,
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