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ORCIDAlessandro Paccagnella
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2020 – today
- 2023
[j13]Elisabetta Pasqualotto, Erica Cretaio
, Lara Franchin, Alessandro De Toni, Alessandro Paccagnella, Stefano Bonaldo, Matteo Scaramuzza:
SPECTRA: A Novel Compact System for Surface Plasmon Resonance Measurements. Sensors 23(9): 4309 (2023)- [j12]Sarah Tonello, Tiziano Fapanni, Stefano Bonaldo, Giada Giorgi, Claudio Narduzzi, Alessandro Paccagnella, Mauro Serpelloni, Emilio Sardini, Sandro Carrara:
Amperometric Measurements by a Novel Aerosol Jet Printed Flexible Sensor for Wearable Applications. IEEE Trans. Instrum. Meas. 72: 1-12 (2023) - [c22]Stefano Bonaldo, Lara Franchin, Erica Cretaio, Elisabetta Pasqualotto, Matteo Scaramuzza, Alessandro Paccagnella:
Electrochemical Biosensor for Timely Detection of Lactococcus Lactis Bacteriophage in Milk Samples. SENSORS 2023: 1-4 - [c21]Stefano Bonaldo, Sarah Tonello, Lara Franchin, Arben Merkoçi, Giulio Rosati, Alessandro Paccagnella:
Multiphysics simulations of screen-printed electrodes for electrochemical biosensing. MetroInd4.0&IoT 2023: 320-325
2010 – 2019
- 2019
- [c20]Giulia Cisotto, Giulio Rosati, Alessandro Paccagnella:
A simple and accessible inkjet platform for ultra-short concept-to-prototype sEMG electrodes production. EMBC 2019: 5765-5768 - 2018
- [j11]Federica Resta, Simone Gerardin, S. Mattiazzo, Alessandro Paccagnella, Marcello De Matteis, Christian C. Enz, Andrea Baschirotto:
1GigaRad TID impact on 28 nm HEP analog circuits. Integr. 63: 306-314 (2018) - 2016
- [c19]Giulio Rosati, Matteo Scaramuzza, Elisabetta Pasqualotto, Alessandro De Toni, Alessandro Paccagnella:
Optimization of Cyclic Voltammetric Curve Parameters to Measure Lactate Concentration in Urine Samples. Sensors 2016: 103-110 - 2015
- [j10]Paola Zuppella, Elisabetta Pasqualotto, Sara Zuccon, Francesca Gerlin, Alain Jody Corso, Matteo Scaramuzza, Alessandro De Toni, Alessandro Paccagnella, Maria Guglielmina Pelizzo:
Palladium on Plastic Substrates for Plasmonic Devices. Sensors 15(1): 1138-1147 (2015) - [j9]Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella:
Impact of Bias Temperature Instability on Soft Error Susceptibility. IEEE Trans. Very Large Scale Integr. Syst. 23(4): 743-751 (2015) - [c18]Charalambos M. Andreou, Alessandro Paccagnella, Diego González Castaño, Faustino Gómez Rodríguez, Valentino Liberali, Alexander V. Prokofiev, Cristiano Calligaro, Arto Javanainen, Ari Virtanen, Daniel Nahmad, Julius Georgiou:
A subthreshold, low-power, RHBD reference circuit, for earth observation and communication satellites. ISCAS 2015: 2245-2248 - [c17]N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi:
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI 2015: 49-54 - 2014
- [c16]Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage:
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. ESSDERC 2014: 381-384 - [c15]Giovanni Bruni, Paolo Rech, Lucas A. Tambara, Gabriel L. Nazar, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Alessandro Paccagnella:
Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity. VLSI-SoC 2014: 1-6 - 2012
- [j8]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Carla Andreani, Giuseppe Gorini, C. D. Frost:
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52(1): 289-293 (2012) - [c14]Matteo Scaramuzza, Alberto Ferrario, Elisabetta Pasqualotto, Giulio Rosati, Alessandro De Toni, Marco Quarta, Alessandro Paccagnella, Carlo Reggiani:
Low-cost Enzyme-based Biosensor for Lactic Acid Amperometric Detection - Electrical Modeling and Validation for Clinical and Food Processing Applications. BIODEVICES 2012: 380-383 - [c13]Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella:
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT 2012: 121-125 - 2011
- [c12]Daniele Rossi, Martin Omaña, Cecilia Metra, Alessandro Paccagnella:
Impact of Aging Phenomena on Soft Error Susceptibility. DFT 2011: 18-24 - 2010
- [j7]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen:
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50(9-11): 1832-1836 (2010) - [j6]Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50(9-11): 1837-1841 (2010) - [c11]Paolo Rech, Michelangelo Grosso, Fabio Melchiori, Domenico Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda:
Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34
2000 – 2009
- 2009
- [c10]Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74 - [c9]Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 - 2008
- [c8]Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante:
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. IOLTS 2008: 135-140 - 2007
- [j5]Andrea Cester, A. Gasperin, Nicola Wrachien, Alessandro Paccagnella, Valentina Ancarani, Cosimo Gerardi:
Ionising radiation and electrical stress on nanocrystal memory cell array. Microelectron. Reliab. 47(4-5): 602-605 (2007) - [j4]Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47(9-11): 1349-1352 (2007) - [c7]Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante:
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT 2007: 79-86 - [c6]Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151 - 2006
- [j3]Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46(9-11): 1669-1672 (2006) - [j2]Francesca Danesin, Franco Zanon, Simone Gerardin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella:
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 46(9-11): 1750-1753 (2006) - [c5]G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi:
Erratic Effects of Irradiation in Floating Gate Memory Cells. IOLTS 2006: 51-56 - 2005
- [c4]G. Cellere, Alessandro Paccagnella, Angelo Visconti, Mauro Bonanomi:
Soft Errors induced by single heavy ions in Floating Gate memory arrays. DFT 2005: 275-284 - [c3]Monica Alderighi, A. Candelori, Fabio Casini, Sergio D'Angelo, Marcello Mancini, Alessandro Paccagnella, Sandro Pastore, Giacomo R. Sechi:
Heavy Ion Effects on Configuration Logic of Virtex FPGAs. IOLTS 2005: 49-53 - 2004
- [c2]M. Bellato, Paolo Bernardi, D. Bortolato, A. Candelori, M. Ceschia, Alessandro Paccagnella, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante, P. Zambolin:
Evaluating the Effects of SEUs Affecting the Configuration Memory of an SRAM-Based FPGA. DATE 2004: 584-589 - 2003
- [j1]S. Cimino, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Ionising radiation effects on MOSFET drain current. Microelectron. Reliab. 43(8): 1247-1251 (2003) - [c1]Massimo Violante, M. Ceschia, Matteo Sonza Reorda, Alessandro Paccagnella, Paolo Bernardi, Maurizio Rebaudengo, D. Bortolato, M. Bellato, P. Zambolin, A. Candelori:
Analyzing SEU Effects in SRAM-based FPGAs. IOLTS 2003: 119-123
Coauthor Index
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