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ORCIDStefan Holst
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2020 – today
- 2023
[j13]Shiling Shi, Stefan Holst, Xiaoqing Wen:
GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting. IEICE Trans. Inf. Syst. 106(10): 1694-1704 (2023)- [j12]Jin-Xian Liu
, Jenq-Shiou Leu, Stefan Holst:
Stock price movement prediction based on Stocktwits investor sentiment using FinBERT and ensemble SVM. PeerJ Comput. Sci. 9: e1403 (2023) - [c33]Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich:
Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm. DSN-W 2023: 195-198 - [c32]Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu:
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS 2023: 1-6 - [c31]Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich:
Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization. IOLTS 2023: 1-7 - [c30]Shiling Shi, Stefan Holst, Xiaoqing Wen:
Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. MCSoC 2023: 501-507 - 2022
- [j11]Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu:
Evaluation and Test of Production Defects in Hardened Latches. IEICE Trans. Inf. Syst. 105-D(5): 996-1009 (2022) - [c29]Florian Neugebauer, Stefan Holst, Ilia Polian:
On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks. ETS 2022: 1-6 - [c28]Kalyan Baital, Amlan Chakrabarti, Biswadeep Chatterjee, Stefan Holst, Xiaoqing Wen:
Power and Energy Safe Real-Time Multi-Core Task Scheduling. VLSID 2022: 16-21 - 2021
- [j10]Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. IEICE Trans. Inf. Syst. 104-D(6): 816-827 (2021) - [c27]Stefan Holst, Lim Bumun, Xiaoqing Wen:
GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators. ATS 2021: 127-132 - 2020
- [c26]Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10
2010 – 2019
- 2019
- [c25]Christian M. Fuchs, Pai H. Chou, Xiaoqing Wen, Nadia M. Murillo, Gianluca Furano, Stefan Holst, Antonis Tavoularis, Shyue-Kung Lu, Aske Plaat, Kostas Marinis:
A Fault-Tolerant MPSoC For CubeSats. DFT 2019: 1-6 - [c24]Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu:
STAHL: A Novel Scan-Test-Aware Hardened Latch Design. ETS 2019: 1-6 - [c23]Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich:
Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses. ITC 2019: 1-10 - [c22]Stefan Holst, Shiling Shi, Xiaoqing Wen:
Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test. PRDC 2019: 124-129 - 2018
- [c21]Yucong Zhang, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian:
Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing. ATS 2018: 149-154 - [c20]Stefan Holst, Ruijun Ma, Xiaoqing Wen:
The impact of production defects on the soft-error tolerance of hardened latches. ETS 2018: 1-6 - 2017
- [j9]Eric Schneider, Michael A. Kochte, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich:
GPU-Accelerated Simulation of Small Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(5): 829-841 (2017) - [c19]Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. ATS 2017: 145-150 - [c18]Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen:
Analysis and mitigation or IR-Drop induced scan shift-errors. ITC 2017: 1-8 - 2016
- [j8]Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara:
Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 99-A(12): 2310-2319 (2016) - [c17]Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte:
Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test. ATS 2016: 19-24 - [c16]Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen:
Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test. ATS 2016: 173-178 - 2015
- [j7]Stefan Holst, Michael E. Imhof, Hans-Joachim Wunderlich:
High-Throughput Logic Timing Simulation on GPGPUs. ACM Trans. Design Autom. Electr. Syst. 20(3): 37:1-37:22 (2015) - [c15]Koji Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jun Qian:
Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch. ATS 2015: 103-108 - [c14]Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich:
GPU-accelerated small delay fault simulation. DATE 2015: 1174-1179 - [c13]Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase:
A soft-error tolerant TCAM using partial don't-care keys. ETS 2015: 1-2 - 2014
- [j6]Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang:
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. IEICE Trans. Inf. Syst. 97-D(10): 2706-2718 (2014) - [c12]Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase:
Soft-error tolerant TCAMs for high-reliability packet classifications. APCCAS 2014: 471-474 - [c11]Eric Schneider, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich:
Data-parallel simulation for fast and accurate timing validation of CMOS circuits. ICCAD 2014: 17-23 - 2012
- [b1]Stefan Holst:
Efficient location-based logic diagnosis of digital circuits. University of Stuttgart, 2012 - [j5]Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test and Diagnosis for Graceful Degradation of NoC Switches. J. Electron. Test. 28(6): 831-841 (2012) - [c10]Stefan Holst, Eric Schneider, Hans-Joachim Wunderlich:
Scan Test Power Simulation on GPGPUs. Asian Test Symposium 2012: 155-160 - [c9]Claus Braun, Stefan Holst, Hans-Joachim Wunderlich, Juan Manuel Castillo-Sanchez, Joachim Gross:
Acceleration of Monte-Carlo molecular simulations on hybrid computing architectures. ICCD 2012: 207-212 - 2011
- [c8]Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich:
Embedded Test for Highly Accurate Defect Localization. Asian Test Symposium 2011: 213-218 - [c7]Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test for Graceful Degradation of NoC Switches. ETS 2011: 183-188
2000 – 2009
- 2009
- [j4]Stefan Holst, Hans-Joachim Wunderlich:
Adaptive Debug and Diagnosis Without Fault Dictionaries. J. Electron. Test. 25(4-5): 259-268 (2009) - [c6]Stefan Holst, Hans-Joachim Wunderlich:
A diagnosis algorithm for extreme space compaction. DATE 2009: 1355-1360 - [c5]Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Test Encoding for Extreme Response Compaction. ETS 2009: 155-160 - [c4]Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz:
Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184 - 2008
- [j3]Stefan Holst:
An a priori error estimate for a monotone mixed finite-element discretization of a convection-diffusion problem. Numerische Mathematik 109(1): 101-119 (2008) - [c3]Stefan Holst, Hans-Joachim Wunderlich:
Adaptive Debug and Diagnosis without Fault Dictionaries. ETS 2008: 199-204 - 2007
- [c2]Stefan Holst, Hans-Joachim Wunderlich:
Adaptive Debug and Diagnosis without Fault Dictionaries. ETS 2007: 7-12 - 2004
- [j2]Stefan Holst, Ansgar Jüngel, Paola Pietra:
An Adaptive Mixed Scheme for Energy-Transport Simulations of Field-Effect Transistors. SIAM J. Sci. Comput. 25(5): 1698-1716 (2004) - 2003
- [j1]Stefan Holst, Ansgar Jüngel, Paola Pietra:
A Mixed Finite-Element Discretization of the Energy-Transport Model for Semiconductors. SIAM J. Sci. Comput. 24(6): 2058-2075 (2003)
1990 – 1999
- 1999
- [c1]Karsten Bsufka, Stefan Holst, Torge Schmidt:
Realization of an Agent-Based Certificate Authority and Key Distribution. IATA 1999: 113-123
Coauthor Index
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