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ORCIDIsmed Hartanto
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2010 – 2019
- 2017
[c13]Seetal Potluri, Aaron Mathew, Rambabu Nerukonda, Ismed Hartanto, Shahin Toutounchi:
Cell-Aware ATPG to Improve Defect Coverage for FPGA IPs and Next Generation Zynq® MPSoCs. ATS 2017: 157-162
2000 – 2009
- 2007
- [c12]Jenny Fan, Xiao-Yu Li, Ismed Hartanto:
Using FPGA configuration memory to accelerate yield learning for advanced process. ATS 2007: 511-516 - 2002
- [c11]David B. Lavo, Ismed Hartanto, Tracy Larrabee:
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis. ITC 2002: 250-259 - 2001
- [j1]Ismed Hartanto, Srikanth Venkataraman, W. Kent Fuchs, Elizabeth M. Rudnick, Janak H. Patel, Sreejit Chakravarty:
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists. ACM Trans. Design Autom. Electr. Syst. 6(4): 471-489 (2001) - 2000
- [c10]Peter C. Maxwell, Ismed Hartanto, Lee Bentz:
Comparing functional and structural tests. ITC 2000: 400-407
1990 – 1999
- 1998
- [c9]David B. Lavo, Brian Chess, Tracy Larrabee, Ismed Hartanto:
Probabilistic mixed-model fault diagnosis. ITC 1998: 1084-1093 - 1997
- [c8]Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs:
Characterization and Implicit Identification of Sequential Indistinguishability. VLSI Design 1997: 376-380 - [c7]Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs:
Diagnostic Test Pattern Generation for Sequential Circuits. VTS 1997: 196-202 - 1996
- [c6]Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs:
Fault Diagnosis Using State Information. FTCS 1996: 96-103 - [c5]Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs:
Identification of unsettable flip-flops for partial scan and faster ATPG. ICCAD 1996: 63-66 - [c4]Ismed Hartanto, Vamsi Boppana, W. Kent Fuchs:
Diagnostic Fault Equivalence Identification Using Redundancy Information and Structural Analysis. ITC 1996: 294-302 - [c3]Vamsi Boppana, Ismed Hartanto, W. Kent Fuchs:
Full fault dictionary storage based on labeled tree encoding. VTS 1996: 174-179 - [c2]Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs:
Dynamic diagnosis of sequential circuits based on stuck-at faults. VTS 1996: 198-203 - 1995
- [c1]Srikanth Venkataraman, Ismed Hartanto, W. Kent Fuchs, Elizabeth M. Rudnick, Sreejit Chakravarty, Janak H. Patel:
Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists. DAC 1995: 133-138
Coauthor Index
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