Fados9f1 User Manual
Fados9f1 User Manual
Fados9f1 User Manual
PRODUCT DESCRIPTION
FADOS9F1 Fault Detector & Oscilloscope 9 Functions in 1 have been especially
developed to determine and troubleshooting faults at all type electronic circuit boards by Prot
Ar-Ge Industrial Project Design R&D Ltd. Co. FADOS9F1 is basically computer-based VI tester
Voltage-Current (Signature Analysis) equipment.
FADOS9F1 has more 2 unique features from FADOS7F1. First feature is integrated DC power
source. It can be adjusted between 0-16V and 20-1500mA with power output; DC
voltage/current graph is created. Second unique feature is IR (infrared) non-touched
temperature sensor for detecting more heated components. Using together 2 new features, it is
possible to some of detecting failures to decreasing during 5-10 times. These features can be
used as new technique fault detection.
Signature Analysis is a power-off test method that is used to troubleshoot circuit boards.
FADOS9F1 works by applying a current-limited sine wave through a serial resistor point of
touched on circuit and Voltage-Current (Signature) graph is displayed on the computer screen.
In addition to this feature, computer software by analyzing signature graph to displays
Equivalent Circuit Diagram and Values of Electronic Components and these features used for
convenience to user in giving information for finding faulty easily.
By using Feature of Dual Channel VI test; signature of known good circuit boards and faulty or
suspect boards comparable with touch of same points at the same time and using this method,
faulty points out of tolerance can be quickly detected. All signature graphs are composed at 2,5
mV sensitivity and by taking 720 different measurement of signature. For this reason,
FADOS9F1 is very sensitive.
By the help of Memory Feature; it is possible to save the features (values and signature) of
good circuit board to memory for reference and then, to compare easily with faulty or suspects
circuit boards sensitively. By using feature of recording reference values, signatures to memory
and comparing data from memory, it can test easily circuit boards. It is possible to record data
with circuit boards picture. As a result; while comparing data from memory, it is possible to see
data on the picture which saved before.
In order to lower the loss of time during test procedure, it sounds different at compatible and
incompatible points. By this way, users make the comparison quickly without any need to look
at screen or circuit boards steadily and the sound feature can save you time when compared
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circuit boards. Users can compare the circuit boards with 3 different steps at the same time.
(Selected Current-Voltage-Frequency steps)
In addition to the basic features, FADOS9F1 VI Tester can also be used Dual-Channel
Oscilloscope, Square-Wave Generator and Analogue Voltage Output. By using Square-Wave
Signal Output, signal is applied to circuit boards; then, it is possible to see the other channel
and output signals at oscilloscope screen.
Technicians, engineers and hobbyists have found VI graph to be an effective and efficient
method for troubleshooting printed circuit boards. The signature comparison method is easy to
use and allows for immediate feedback that will assist you in locating faulty component. As you
gain some experience with VI graph you will realize that FADOS9F1 is an indispensable
troubleshooting tool. Usage is very easy and users will find the faults just by looking at graphs
without comparison.
When test Printed Circuit Assembly (PCA) with FADOS9F1, do not apply power to PCA. PCA and
the devices must be made high-voltage capacitor discharges. There is no risk of further damage
to the PCA while testing and troubleshooting.
FADOS9F1 is easy to carry since its small. It can be carried in a laptop briefcase. Including
many more features, it is like a Swiss knife of users dealing with electronics.
Usage Areas
ECU Automotive electronic circuit boards, servo-step motor drivers, circuit boards of medical
devices, military electronic circuit boards, computer and monitor circuit boards, television-audioradio circuit boards, circuit boards of textile machines, mobile phone electronic circuit boards
etc. (all type electronic circuit boards.)
Electronic Components Test: Resistors, Capacitors, Inductors, Diodes (General purpose,
Zener, High Voltage etc.) Transistors (NPN, PNP, JFET, MOSFET etc.), SCRs, TRIACs,
Optocouplers, Integrated Circuits (Digital, Analog) etc.
Unique Features
Integrated DC Power Source, IR (infrared) Sensor (Temperature Test), Equivalent Circuit
Diagram and Measuring Values of all Components features are unique in the World.
Integrated DC Power Source: It can be adjusted between 0-16V and 20-1500mA with power
output. It gives energy to circuit boards and creating Power DC Voltage-Current Graph.
IR (infrared) Sensor (Temperature Test): This feature is used for detecting more heated
components and draw out heat map of electronic card.
Equivalent circuit diagram and measuring values of all components features; as an example; if
resistor connected parallel to capacitor, it shows circuit diagram and value of them at the same
time.
SECURITY
1- FADOS9F1 is produced by using lead-free solder and designed in accordance CE
regulations; users must use the following usage rules.
2- Chassis must be isolated and grounded. Connect the chassis ground connection point of
the probe is the same as your computer, careful to avoid the potential difference.
Resistor: %2
Capacitor: %3
Note 1: These tolerances valid, if resistor curve makes angle between 10 and 80 degree to
horizontal axis. If resistor curve close to horizontal line, select Low Current Step and; if resistor
curve close to vertical line, select Middle or High Current Step for reducing mistake rate.
Note 2: These tolerance valid, if capacitor ellipse of width/length ratio is greater than 1/4. This
ratio is less than 1/4 and ellipses width - length is thin and long. In such a case; change
current step or/and frequency step for selecting step appropriate to components.
4- Oscilloscope voltage measurement tolerance: %0,5.
1 FADOS9F1 Product
1 IR Temperature Probe
2 Oscilloscope Probes
1 USB Cable
1 DC Cable
1 Power Adapter
1 Handbag
Test Resistance
Test Frequencies
:2
Hz
Low2 Frequency
:4
Hz
Low1 Frequency
: 12
Hz
Test Frequency
: 32.5 Hz
High Frequency
: 355.4 Hz
Number of Channels
Scan Mode
Other Feature
IR (Infrared) Sensor
C- PC OSCILLOSCOPE FEATURES:
Sampling Rate
: 400 K/S
Input Voltage
: Probe 1X: 5 V
Channel / ADC
: 2 Channel / 12 Bit
Sensitivity
: 2.5 mV
Image Rate
Instant Memory
: 64 Kbyte
Probe 10X: 50 V
: Channel 2
Output Voltage
: -5V.+5V (Adjustable)
Frequency (Digital)
Dimensions
Weight
CONTENTS
Page
PRODUCT DESCRIPTION ................................................................................. .2
USAGE AREAS ............................................................................................................... 3
ELECTRONIC COMPONENTS TEST ....................................................................................... 3
UNIQUE FEATURES ......................................................................................................... 4
SECURITY ............................................................................................................... 4
FADOS9F1 PERFORMANS AND MEASURUMENT TOLERANCE ................................. 5
PRODUCT OVERVIEW AND CONTENT .................................................................... 6
FADOS9F1 TECHNICAL SPECIFICATIONS ............................................................... 7
FADOS9F1 FAULT DETECTOR & OSCILLOSCOPE ..................................................... 9
INSTALLATION - DRIVER INSTALLATION .............................................................................. 11
CONNECT PROBES ......................................................................................................... 12
GENERAL USAGE INFORMATION .......................................................................... 12
POWER IR TEMPERATURE TEST ........................................................................ 14
POWER TEST DC VOLTAGE CURRENT GRAPH .................................................................. 16
COMPARISON POWER DC VI GRAPH WITH FAULTY BOARDS .................................................... 17
IR TEMPERATURE TEST ........................................................................................ 19
RECORD TEMPERATURE .................................................................................................. 19
TEMPERATURE CONTROL OF FAULTY BOARD ........................................................................ 20
MICRO - VOLT ............................................................................................................. 20
VI TEST PROGRAM FEATURES OF FAULT DETECTION PART .............................. 21
PASSIVE COMPONENTS R, L, C V/I GRAPH .......................................................... 23
RESISTOR VI GRAPH ..................................................................................................... 23
CAPACITOR VI GRAPH ................................................................................................... 24
CAPACITOR QUALITY TEST AND RC CIRCUIT ....................................................................... 25
SEMI CUNDOCTORS V/I GRAPH ........................................................................... 26
DIODE, ZENER DIODE VI GRAPH ...................................................................................... 26
TRANSISTOR TRIAC THYRISTOR FET IGBT VI GRAPH ................................................... 27
INTEGRATED CIRCUITS (ICs - SMD INTEGRATES) V/I GRAPH ............................ 28
ELECTRONIC CIRCUIT BOARD REGISTRATION MEMORY AND
COMPARISION FROM MEMORY ............................................................................ 29
RECORDING DATA WITH IMAGE........................................................................................ 30
COMPARISION TESTING COMPONENTS OF CIRCUIT BOARDS ............................ 31
3G 3 DIFFERENT GRAPHS DISPLAY ................................................................... 36
OSCILLOSCOPE PROGRAM FEATURES ............................................................... 37
RECOMMENDATIONS............................................................................................ 38
WARRANTY AND CONDITIONS............................................................................. 39
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Picture 2: FADOS9F1
FADOS9F1 includes 9 important functions:
1. Double Channel Fault Detection (Analog Signature Analysis - VI Graph)
Comparing good and faulty or suspect circuit boards without giving power to boards.
2. DC Power Supply Output with Adjustable Voltage and Current
For giving energy to circuit boards and creating Power DC Voltage-Current Graph.
3. Non Touched IR Temperature Sensor
For detecting more heated components and draw out heat map of circuit board.
4. Equivalent Circuit Diagram
Composing R, C, or Diode Circuit Diagram according to the point touched.
5. Measuring Value of Resistors, Capacitors, and Diodes
Feature of measuring the value of touched point.
6. Fault Detection by Comparison from Memory
By recording data of good circuit boards to memory, comparing faulty or suspects boards
from memory.
7. Double Channel Digital Oscilloscope
As occasion may require, device can be used as oscilloscope.
8. Square Wave Signal Output
Ch.1 is used as oscilloscope and Ch.2 is used as signal generator.
9. Analogue Voltage Output
Ch.1 is used as oscilloscope and Ch.2 gives analog voltage output.
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Click Start
Click Settings
3- Find Prot Ar-Ge FADOS9F1 Fault Detector inside Universal Serial Bus Controllers and
click right then, select update software driver.
4- Select (Search for the best driver location) and click browse, find FADOS9F1 Drivers
folder.
5- Click OK and install driver.
Note: Each product has different calibration settings, so that please do not lost program CD.
CONNECT PROBES:
Connect DC Power Cable (Red-Black Cable) to Power socket. Connect IR Sensor to IR Temp.
socket. Oscilloscope probes and Com probe (crocodile) can be connected each VI Tester
socket. Yellow ring probe is always Channel 1; Blue ring probe is always Channel 2. Crocodile
probe is always COM. USB cable for using communications between PC and FADOS9F1.
Connect Power Adapter to Power (18-20 VDC).
GENERAL USAGE INFORMATION
1. When run software, Power IR Temperature Test screen pop-up and if you click VI
Tester button or Oscilloscope open VI Tester or Oscilloscope screen.
While testing circuit board; firstly, user should test supply line at Power IR Test
function.
Firstly, create good circuit boards Power Voltage/Current Graph. Than save this graph
to memory.
Compare
faulty
or
suspect
circuit
boards
with
good
circuit
boards
Power
Voltage/Current Graph.
If more current is suffering from faulty card, it means that one or more components
suffers more current on the board, and therefore heats the electronic board. For finding
heated components, selects Temperature.
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If the faulty card is less current, in this case supply line is open circuit likely. Open
Oscilloscope Screen and find line which does not get energy and broken-line is easily
detected.
If the faulty and good board has same graphs; in this case open VI Test Screen and
finds faulty with it.
2. Open circuits graph is in the middle and horizontal position at Test-Fault Detect screen.
Current Voltage Graph (VI) makes angle according to the value of resistance, capacitor
is like circle and ellipse, short circuit is vertical position.
3. Middle current step if resistance values are high and VI graph is horizontal axis, you can
see more clearly high resistance value at low current step. If VI graph is more closer to
vertical axis, it means resistance value is low and values can be read more clearly at high
current step.
4. Usually, test capacitor at high frequency mode. If capacitor value is low, test at low
current step and if capacitor value is high, test high current step. If capacitor value is like
slim ellipse at high current step and vertical axis, you can see value of capacitor by
reducing frequency of the frequency step.
5. Good (solid) integrated pin (without pin of supply and ground) is usually like double
reverse diode. Resistor or capacitor effects even as graph, observed double reverse
diode. Some integrated output can be observed one diode. But, if you see pin of
integrated like resistor, it means integrated is faulty.
6. Capacity test especially determines quality of electrolytic capacitor. If this curve is
horizontal, capacitor is quality. Low quality capacitor curve according to horizontal makes
an angle. If angle is more, capacitor is faulty. Due to current this test may be misleading,
while testing a capacitor at circuit. Therefore considering this situation to test. For
capacitor quality, the best measurement in this product is done by looking at the
Capacity Resistance curve.
7. At fault detection important thing is graph display and interpret. First, try to find fault
with compare. In a short time you will learn difference between good and faulty or
suspect circuit board. The equivalent circuit and values are auxiliary elements. If you
always look equivalent circuit and values, it can take more times to detect fault. This
product interprets VI graph. The computer program composes equivalent circuit diagram
and shows values of components by interpreting graph.
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Power On
current is suffering from circuit board, adjusted current is limited by software and does
not allow more current to suffer the circuit board.
Power Off
Power Test
Power
Recording
Time
Auto Test
Temp. Zero
Voltage
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C and 10 C.
a new circuit.
Open Image
New Point
Connect to power cable to circuit boards supply. Red Cable (+), Black cable (-)
Click Power Test Button and creates faults circuit boards DC VI graph.
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IR TEMPERATURE TEST
Record Temperature
Connect DC cable to circuit boards supply. And Click Power On button for giving energy to
boards. Timer starts counting down from 120 seconds. Click Record button and open circuit
board image, which uploaded before. IR sensor is kept to a point on the table and click Temp
Zero button. The IR sensor measures the temperature of the component.
Bring on the IR sensor component and for measuring the temperature of components. And this
point is marked on the image of circuit board. When Timer is 0, record is done by clicking the
save button. Then the other components can save.
After waiting 120 seconds, it will be easy to detect more heated components and draw out heat
map of electronic card.
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Connect to Power Cable to faulty boards supply. Red Cable (+), Black cable (-)
Click Record button, selects IR-Temp data and click Open button.
Click Power Test button and wait 120 seconds for heating components. Measure the
temperature of first components, if temperature is same, click Next Point for testing
second data. Or, if you select auto test; and temperature is same, after 5 seconds
automatically opens other data.
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Comparison: If this option is selected, good (solid) and faulty or suspect circuit
boards are compared by touching probes to the same points of both circuit board.
Capacitor Test: Capacitor test determines quality of electrolytic capacitor.
TTT FET IGBT: If this option is selected, determines TTT, FET, IGBT etc. Type of
semi conductors.
Recording: Opens file form and records; or opens recorded file.
Grf: For 3 different steps, 3 different graphs are generated and fast passage is
possible at any time.
1G, 2G, 3G: 1, 2 or 3 graphs at different adjustments can be screened.
simultaneously.
Recording: Opens file form and records; or opens recorded file.
Circuit: Indicates name or code of point to be tested. Folder name in the system.
Point: Name or code of test point. Recorded as file name in the system.
: Goes to previous test point.
: Goes to next test point.
Test Point: Serial number of test point.
Auto Test: If tolerance of test point is lower than or equal to tolerance mentioned
below, it goes to next test point automatically.
Reference: Channel1 indicates good (solid) circuit;
Channel2 indicates faulty circuit or circuit to be tested.
When saved at memory, Reference=Channel1 is saved.
Values of circuits composed of resistance, capacitor, and
diode are displayed.
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Capacitor VI Graph
Due to their energy storage characteristics, reactive components produce a phase shift between
voltage and current flow. This is displayed as a circular or elliptical signature. Capacitor symbol
and value are seen at the bottom. Picture 15 - 16 displays capacitor typical signals and values
for the equivalent circuit. High capacitor generates vertical ellipse. For testing high capacitor
select high current and low frequency. Low capacitor generates horizontal ellipse. For testing
low capacitor (lower than 10 nF) select low current and high frequency.
Picture 20: Diode and Serial Diode - Resistor VI Graph, The Equivalent Circuit Diagram
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Picture 21: Diode VI Graph (Channel1), Zener Diode VI Graph (Channel2), Transmission Voltage
Transistor Triac Thyristor FET - IGBT VI Graph
Active components such as transistor, triac and FET can be tested by transmitting them while
both of two channels are used. A transistor contains two semiconductor junctions connected.
Transistors also must have emitter chassis. First, touch collector with a probe (Channel 1 probe
or Channel 2 probe). Collector must be at non-transmission position. Then, touch other probe
(Channel 1 probe or Channel 2 probe) base in order to provide transistor to start transmitting.
Transistor characteristics should be seen as at the screen.
Triac, Thyristor, Fet and IGBT can be tested in the same way.
If Thyristor,Triac, Transistor, FET, IGBT selection (T.T.T FET IGBT button) is applied, type of
component can be determined.
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to be tested with second channel. If it is same as the saved data or in tolerance values, it is
written Harmonious at screen. If it is out of tolerance values, it is written Disharmony,
percentage value is seen and wrong voice is heard.
When automatic test is activated, if a test point is harmonious, then it goes to next point
automatically. By this way, circuit boards can be tested faster with the help voices.
Note: Electronic circuit test points, we can only register with Channel 1. Using recording menu
to open as a reference test points by recorded Channel 1, using Channel 2 comparison data
with faulty or solid circuit.
computer.
First, open a new file by writing name or code of circuit board that will be saved. For uploading
image; click open image and select the circuit of the image and again click open for uploading
circuit boards image. Software changes automatically name of circuit boards Picture. For
example, Picture name is picture4.jpg and program changes the name automatically
image.jpg and adds folder. If you copy a picture in folder, you have to write name of Picture
image.jpg. Software checks only image.jpg or not in folder. If picture name is not
image.jpg, this function does not work. After uploaded image, you see circuit boards image
on the right. On the image +, buttons are for zoom. Click point on the image which you
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want to save than touch the point which is in the circuit board, will be saved by channel 1.
Then, press save button. When you compare data from memory; you can see data which you
saved before on the picture.
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RECOMMENDATIONS
1. Fault detection probes must be set to 1X at fault detection.
2. Test good (solid) circuit board channel 1, faulty or suspect circuit board channel 2. First
touch the channel 1 probe, and then touch channel 2 probes.
3. Fault detection is important to have same graphics at channel 1 and channel 2. The
circuit diagram and values are elements of help. The circuit diagram values are not for
measuring purposes, it is only for comparison purposes.
4. For fault detection, usually use middle current level. For high value resistor or low value
capacitor, select low current step.
5. When recording in the memory, click save button after touching good (solid) circuit
boards pins with channel 1. When the data open from memory, using Channel 2
comparison data with faulty, suspect or good (solid) circuit board.
6. Each product has different calibration settings which is include in CD, so that please do
not lost program CD.
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