UNIMET8xxST D00008 M XXEN
UNIMET8xxST D00008 M XXEN
UNIMET8xxST D00008 M XXEN
UNIMET8xxST_D00008_01_M_XXEN/02.2016
Bender GmbH & Co. KG © Bender GmbH & Co. KG
P.O. Box 1161 • 35301 Gruenberg • Germany All rights reserved.
Londorfer Straße 65 • 35305 Gruenberg • Germany Reprinting only with permission
Tel.: +49 6401 807-0 • Fax: +49 6401 807-259 of the publisher.
E-mail: [email protected] • www.bender.de Subject to change!
UNIMET8xxST_D00008_01_M_XXEN/02.2016 3
Table of Contents
4 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Table of Contents
UNIMET8xxST_D00008_01_M_XXEN/02.2016 5
Table of Contents
8. Data ......................................................................................................................... 69
8.1 Standards .................................................................................................................................. 69
8.1.1 Application standards .......................................................................................................... 69
8.1.2 Design standards ................................................................................................................... 69
8.2 Terms and abbreviations .................................................................................................... 70
8.2.1 Terms used ............................................................................................................................... 70
8.2.2 Abbreviations used ............................................................................................................... 71
8.3 Test steps .................................................................................................................................. 73
8.4 Technical data ......................................................................................................................... 90
8.5 Ordering information ........................................................................................................... 92
INDEX ........................................................................................................................... 95
6 UNIMET8xxST_D00008_01_M_XXEN/02.2016
1. How to get the most out of this manual
Please read this operating manual before using the devices. This documentation must be kept in an
easily accessible location near to the device.
This manual has been compiled with great care. It may nevertheless contain errors and mistakes. The
Bender Group cannot accept any liability for injury to persons or damage to property resulting from
errors or mistakes in this manual.
Each of the registered trademarks which appears in this document remains the property of its owner.
For improved readability, the test systems UNIMET® 800ST and UNIMET® 810ST will also be referred
to as "UNIMET®".
UNIMET8xxST_D00008_01_M_XXEN/02.2016 7
How to get the most out of this manual
The signal word indicates that there is a high risk of danger, that will result in
death or serious injury if not avoided.
DANGER
This signal word indicates a medium risk of danger that can lead to death or se-
rious injury, if not avoided.
WARNING
This signal word indicates a low-level risk, that can result in minor or moder-
ate injury or damage to property, if not avoided.
CAUTION
This symbol denotes information intended to assist the user in making optimum
use of the product.
8 UNIMET8xxST_D00008_01_M_XXEN/02.2016
2. Safety instructions
2.1 Delivery
Inspect the dispatch and equipment packaging for damage, and compare the contents of the pack-
age with the delivery documents. Devices damaged in transit must not be used. In the event of dam-
age in transit, please contact Bender immediately.
Equipment may only be stored in areas where it is protected against dust, damp, spray water and
dripping water and where the specified storage temperatures can be assured.
The selling company's "General conditions of sale and delivery" always apply.
Bender would be happy to provide training in respect of the use of test equipment. Training for two
people is included in the purchase price of the test system. You can find the current dates on our
homepage http://www.bender.de -> Know-how-> Seminars.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 9
Safety instructions
For software products, the "Softwareklausel zur Überlassung von Standard-Software als Teil von
Lieferungen, Ergänzung und Änderung der Allgemeinen Lieferbedingungen für Erzeugnisse und
Leistungen der Elektroindustrie" (software clause in respect of the licensing of standard software as
part of deliveries, modifications and changes to general delivery conditions for products and servic-
es in the electrical industry) set out by the ZVEI (Zentralverband Elektrotechnik- und Elektronikindus-
trie e.V., the German Electrical and Electronic Manufacturers' association) also applies.
Delivery and payment conditions along with a copy of the software clause can be obtained from
Bender in printed or electronic format.
.
10 UNIMET8xxST_D00008_01_M_XXEN/02.2016
3. System description
UNIMET® has been designed solely for use with earthed systems. If the test system
is used other than as intended, i.e. on an IT system, the measured values of any
leakage currents will not be reproducible. The test result cannot be used.
If the corresponding software licence has been purchased, the operating software enables addition-
al tests according to IEC 60601-1 (med. electrical equipment) or DIN EN 61010-1 (electrical equip-
ment for laboratory use).
The operating software indicated on the cover page can be used with the UNIMET® 810ST, but also
with the existing UNIMET® 800ST. In this case, the following restrictions apply:
B 9602 8010
No restriction of the range of functions. Software licences for DIN EN
B 9602 8014, B 9602 8016
60601-1 and DIN EN 61010-1 can be installed.
B 9602 8017, B 9602 8018
B 9602 8000
Software licences for DIN EN 60601-1 and DIN EN 61010-1 cannot be
B 9602 8004, B 9602 8006
installed.
B 9602 8007, B 9602 8008
UNIMET8xxST_D00008_01_M_XXEN/02.2016 11
System description
The test results can be displayed on the screen, saved or printed out using an external printer. The
test results can be stored as PDF file and saved to a USB drive (USB stick) for any subsequent print-
outs.
In the event of unexpected results, the DUT can be inspected in more detail by carrying out a single
test. Tested devices can be saved under their device IDs in the "Device protocols" folder. The data
memory provides space for up to 10000 data records. Device IDs may only appear more than once if
they are assigned to different clients.
The date of the last test and the test interval are saved. If a device passes the test, the test date is up-
dated by the set test interval. Filter and sort functions (query filter) make selecting test data easy.
Test specifications and device protocols can be transferred to a PC software program (e.g.
UNIMET® 800ST Control Center) via the RS-232 interface or using a USB drive (USB stick). For recur-
rent tests, the data stored in the PC software are transferred back to the UNIMET®.
The RS-232 interface is also used for any subsequent updates of the internal operating software on
the test system.
The "Test engineer catalogue" folder can be beneficial if more than one person is working with the test
system. Test engineers already registered on the system are simply selected from this folder. There is
no need to re-enter the name of the test engineer. The "Test engineer names", "Test specifications" and
"Device protocols" folders share the same data memory. Accordingly, the number of test engineer
names is limited only by the size of the available memory.
The large colour display is backlit. Graphics illustrate how to connect the DUT. Operation is quick and
easy via the touchscreen. A standard keyboard (PS/2 or USB) can also be connected.
12 UNIMET8xxST_D00008_01_M_XXEN/02.2016
System description
Depending on the national language selected for the user interface, the appro-
priate standard appears on the display and the device protocol. Example:
German: DIN EN 62353 (VDE 0751-1)
English or other languages: IEC 62353
Differential measurement
Measurement
DIN EN 60601-1
DIN EN 61010-1
DIN EN 62353
(VDE 0750-1)
(VDE 0751-1)
(VDE 0411-1)
method
r.m.s.
DC
AC
PE resistance
(permanently installed
X X X X X
and transportable
equipment)
InsuIation resistance
X X X X
(Class I and Class II)
InsuIation resistance
X X
(applied part – PE)
InsuIation resistance
X X
(applied part- LN)
Equipment leakage
current - alternative
X X X
method
(Class I and Class II)
UNIMET8xxST_D00008_01_M_XXEN/02.2016 13
System description
Differential measurement
DIN EN 60601-1
DIN EN 61010-1
DIN EN 62353
(VDE 0750-1)
(VDE 0751-1)
(VDE 0411-1)
method
r.m.s.
DC
AC
Applied part leakage
current - alternative X X
method
Equipment leakage
current X X X X
(Class I and Class II)
PE current X X X X
Touch current X X X X X X
Touch voltage X X X
Mains voltage X X X X X
Current consumption X X X X X
Apparent power X X X X X
14 UNIMET8xxST_D00008_01_M_XXEN/02.2016
System description
1c
1a
1B
4 5
2
6 7 8
UNIMET8xxST_D00008_01_M_XXEN/02.2016 15
System description
3 4 5
6 7 8
2 1
1 Touchscreen for operator control and indication. For this purpose, a stylus is included in the scope of
supply.
2 Durable plastic enclosure, with pushbuttons for safe storage in the carrying bag.
4 Measuring terminals
- [B] (violet) for the connection of the single-pole test probe supplied with the product.
- [A] for active test probe TP800 with pushbutton (option).
- Socket [C] for equipotential bonding (e.g. connection for single-pole line extension with clip for the test-
ing of permanently installed equipment).
- Socket [D] for functional earth
5 Test socket: This is where the DUT's power supply cable is plugged in.
6 Connection to the supply voltage and power switch with thermo-magnetic circuit-breaker.
8 Interfaces:
- PS/2 Connection for external keyboard
- RS-485 Serial interface for Bender Service
- RS-232 interface, 9-pin, electrically isolated, for connection to a PC
- USB interface for connection to a printer, a USB stick, an external keyboard or a barcode scan-
ner (2 x host) and a PC (1 x device, for Bender Service only)
- Ethernet Network connection (optional)
16 UNIMET8xxST_D00008_01_M_XXEN/02.2016
4. Quick reference guide
The "Quick reference guide" chapter provides a brief overview of how the test sys-
tem works. We strongly recommend that you read the entire manual in order to
ensure that you can use all the functions of the test system.
CAUTION
The DUT has previously been tested (recurrent 1. Open the "Device protocols" folder. 62
test): 2. Select the "Device ID".
The DUT is listed in the "Device protocol" 3. Start the test with .
folder under its "Device ID.
You know the type of the DUT: 1. Open the "Test specifications" folder. 58
The "Name" of the test specification" appears 2. Select the "Name" of the test specifica-
in the "Test specifications" folder. tion.
3. Start the test with .
UNIMET8xxST_D00008_01_M_XXEN/02.2016 17
Quick reference guide
18 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Quick reference guide
UNIMET8xxST_D00008_01_M_XXEN/02.2016 19
Quick reference guide
20 UNIMET8xxST_D00008_01_M_XXEN/02.2016
5. Operation and setting
5.1 Commissioning
Before using devices that have been stored at low temperatures: Leave the devic-
es to stand for 3 to 4 hours at room temperature before connecting the power
supply. When the devices are moved from a cold to a warm environment, con-
densation will be evident on all parts. Putting damp devices into operation may
WARNING damage electrical components and there is a danger of electric shock on con-
tact.
1. Place the UNIMET® on an even surface with the coloured edges of the bag facing up. Open the
two covers (Velcro fasteners).
2. Connect the UNIMET® to the supply voltage using the power cable.
3. Switch the test system on using the power switch.
The test system requires approx. 20 seconds to start up and carry out self testing. The test system
tests the mains voltage. If the test system detects an IT system (e.g. in an operating theatre) or an er-
ror, a message will appear.
During self testing, the software, firmware and hardware versions are displayed, along with the serial
number.
If the mains voltage detected deviates from the set nominal voltage by more than 5 V, a message will
appear accordingly. The UNIMET® converts the measured current values into nominal voltage (see
also chapter "Nominal voltage" on page 36). Click "OK".
Start-up continues. The "Log in test engineer" window will now appear as appropriate for the con-
figuration (see "Test engineer names" on page 32). The test system's main folder appears next:
UNIMET8xxST_D00008_01_M_XXEN/02.2016 21
Operation and setting
Do not use a ballpoint pen, a pencil or other sharp objects to operate the touch
screen. This may damage or destroy the touch screen.
CAUTION
Always observe the specifications of the printer manufacturer to obtain a seamless printout with the
UNIMET®. Unfortunately, printing out with a multi-function device including fax, printer and scanner
is not possible.
If no suitable printer is available for direct connection to the UNIMET® you can
"print" the data as a PDF file to a USB stick. Afterwards, the USB stick can be
plugged into a PC to print out the data.
22 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
– Starting from the main folder, double-click to select each of the following:
> "System control" > "Windows system control" > "Printer".
Hint: If you cannot see the "System control" icon in the main folder, scroll down the bar on
the right-hand edge of the screen.
– Select "Adobe PDF file" from the list.
– Click "OK". The setting remains active until the next time the UNIMET® is switched off.
– Select "Save settings" from the "Windows system control" menu to save your settings per-
manently.
To carry out test according to the standard DIN EN 61010-1, the UNIMET® 800ST
always requires the test probe TP1010 (see "Ordering information" on page 92).
UNIMET8xxST_D00008_01_M_XXEN/02.2016 23
Operation and setting
1 4
2
3
5
1 Menu bar Used to log in test engineers, to select various screen configurations for
icons, to select the language and for information about the test system's
software and hardware.
2 Info window If you click on an icon from within the main window, an info window will
appear containing a brief description.
Messages are also displayed in this window, e.g. if the UNIMET® is run-
ning on an IT system or in the event of hardware problems being
detected.
3 Main window It provides access to the various UNIMET® folders and functions.
5 Status bar Provides information about the number of objects in the main window,
the test engineer logged on and the time of day.
24 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
Large icons Very transparent if only a limited number of objects are to be displayed. This screen
configuration is used predominantly in this operating manual.
List Improves the overview in the event of a large number of objects (e.g. selection from
a "Device protocols" folder containing a large number of entries).
Details Same properties as List, but with more information (e.g. measurement numbers in a
list of single tests).
Select All Used to select all entries in the "Test specifications" and "Device protocols" folders.
Invert selection Used to invert the selection of the highlighted entries in the "Test specifications" and
"Device protocols" folders.
English, Deutsch, Select language of user interface.
Italiano, Français
UNIMET8xxST_D00008_01_M_XXEN/02.2016 25
Operation and setting
1 3
2
8 4
5
7
6
1 Text box title
2 Text box
3 List for text box. Existing entries can be selected from the list to accelerate entry and avoid
errors.
8 Reject entry and close software keyboard without making changes (ESCAPE).
The following rules apply to all text boxes: Once a term has been entered, you will
need to use the list every time you enter this term subsequently. This is to ensure
that the same term is always written in an identical way. This is a basic require-
ment in order for term searches and selections to work (e.g. with the query filter;
see also "How to use the query filter" on page 30).
Examples of application:
All device protocols for the manufacturer Soundmaker need to be selected for a
test by the manufacturer's customer service department.
All device protocols for the client Dr. Koch need to be selected for a recurrent test
inhouse.
26 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
2 1
4
3
5
6 7
2 Current entry
3 Last entry
5 Previous entries
7 Accept entry
UNIMET8xxST_D00008_01_M_XXEN/02.2016 27
Operation and setting
5.2.5 Toolbar
The toolbar provides rapid access to UNIMET® functions. The buttons can be active or inactive, de-
pending on the available options. Inactive buttons are greyed out.
1 2 3
4
1 Back, closes the current folder. This icon will be active if, for example, you have double-
clicked to switch to the "Test specifications" or "Device protocols" folder. Click it to return to
the main folder.
2 The context menu will become active, for example, if you click on a test specification, a
device protocol or a test engineer and there are several possible operator actions. Click on
the icon (or press the corresponding button on the keyboard) to open the context menu list-
ing the possible operator actions.
Single-click on the required function; a help text will appear. Double-click to launch this
function.
3 If a larger number of test specifications and device protocols are available, the query filter
can be used to refine your search. Activate the filter to sort and filter test data.
4 Measuring instrument to quick-start a device test. The measuring instrument can be acti-
vated in the "Test specifications" or "Device protocol" folders, as well as for single tests, by
clicking on an icon. Click on the measuring instrument to start the device test or a single test
step.
5.2.5.1 How to use the context menu when only one entry is activated
Example:
1. Select a device ID under "Device protocols".
2. Click (context menu) in the toolbar.
3. Select one of the following operator actions by double-clicking on it:
28 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
5.2.5.2 How to use the context menu if more than one entry is activated
If the "Device protocols" folder contains a large number of device IDs, you can se-
lect the "List" or "Details" screen configuration to improve transparency. This set-
ting remains saved even after the test system is shut down.
To select specific device protocols for batch printing (print all), proceed as de-
scribed below.
Example:
1. Select several device IDs under "Device protocols". To select multiple device IDs, proceed as
follows:
Draw a frame around the selected icons with the stylus pen or
if you have a keyboard connected,
– press and hold down the shift button and click the first and last IDs in a group of device IDs
with the stylus pen.
– press and hold down the shift button and select a group of device IDs using the arrow but-
tons up/down.
– press and hold down the "Ctrl" button and click several individual device IDs with the
stylus.
Activated device IDs are displayed against a dark background.
2. Click (context menu) in the toolbar.
3. Select one of the following operator actions by double-clicking on it:
Another example application for the context menu appears in chapter "5.4.2.2 Logging in, changing
or deleting test engineers".
UNIMET8xxST_D00008_01_M_XXEN/02.2016 29
Operation and setting
2 4
3 5
1 Filter selection Three filter conditions can be selected. Only entries meeting all conditions (AND
by operation) are displayed.
- Fields tagged "Search for“ can be used for a full text search.
- With the test data circulation you can select test data received or sent from a
PC.
- The test date can be narrowed using relational operators (e.g. <, >, =, …).
- In other fields, one of the existing entries can be selected.
2 Sort view by Two sort criteria can be specified. Data is sorted first by priority 1, then by priority
2.
5 Delete all items Delete all filter conditions and sort criteria.
Example:
Numerous device IDs are saved in the "Device protocols" folder. Only device protocols relating to de-
vices due for testing in September 2016 need to be displayed. The device protocols are displayed
sorted by designation. Make the following settings:
30 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
UNIMET8xxST_D00008_01_M_XXEN/02.2016 31
Operation and setting
The "Test engineer names" folder is particularly useful if more than one person is working with the
test system. Test engineer names already registered on the system can be selected easily. There is no
need to re-enter the name of the test engineer. The "Test engineer names", "Test specifications" and
"Device protocols" folders share the same data memory. Accordingly, the number of test engineer
names is limited only by the size of the available memory. A name of a test engineer cannot be longer
than twenty characters.
If more than one person is working with the test system, there is a risk that users will forget to select
the name of the new test engineer. To avoid this, check the "Log in test engineer" box on every
restart. The "Log in test engineer" window will then appear every time the test system is powered up.
32 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
UNIMET8xxST_D00008_01_M_XXEN/02.2016 33
Operation and setting
You have to execute the function "Safe changes" to be secure that all the settings
in the "Windows system control" folder are stored permanently.
5.5.1.2 Display
► Select > "System control" > "Windows system control" > "Display".
Make the settings for the background, the appearance of the windows and the characteristics of the
display lighting here.
5.5.1.3 Printer
► Select > "System control" > "Windows system control" > "Printer".
The procedure for setting up an external printer is described in the chapter entitled "Connecting a
printer" on page 22. Also refer to "Print setup in PDF file" on page 22.
34 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
5.5.1.4 Date/time
► Select > "System control" > "Windows system control" > "Date/Time".
This window is used to set the date, time of day and time zone, as well as automatic changeovers to
and from summer/winter time.
You can move this window to reveal all standard functions it supports (e.g. the
"OK" button). To do this, click on the blue title bar and drag the window in the re-
quired direction.
5.5.1.6 Stylus
► Select > "System control" > Windows system control" > "Stylus".
In the "Stylus" window you can personalise the double-click action of the stylus. Double-click the
grid. This will teach the UNIMET® the rate at which you will perform the double-click action in the fu-
ture.
Select "Calibration" to calibrate the touchscreen for the stylus pen.
5.5.1.8 Keyboard
► Select > "System control" > "Windows system control" > "Keyboard".
The settings in this window only apply to an external hardware keyboard connected to a USB inter-
face or a PS/2 port. You can activate character repetition here, as well as changing the delay and rep-
etition rate.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 35
Operation and setting
36 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Operation and setting
5.5.4 Database
The UNIMET® uses a shared database for the "Test specifications", "Device protocols" and "Test engi-
neer names" folders. Deleting test data creates gaps which remain unfilled. Therefore, you should
compress the database regularly in order to make this space available for use. The UNIMET® takes ap-
proximately one minute to compress 1000 data records.
1. Select > "System control" > "Database".
2. Click "Compress test database…"
To copy the data saved on the USB stick back to the UNIMET®, proceed as follows:
1. Switch the UNIMET® off.
2. Connect the USB stick.
3. Switch the UNIMET® on.
4. In the window, specify whether the UNIMET® operating software and/or the test database (test
specifications and device protocols) should be copied back.
Start Starts data recovery.
Cancel Cancels recovery. - UNIMET® starts up. No data is copied from the USB stick to
the UNIMET®.
The baud rate and data bits on the test system and the PC (or in the PC software)
must always be set to the same value! In case of different settings, data transmis-
sion cannot be carried out.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 37
Operation and setting
5.5.7 Diagnostic
You need a test box TB3 for this function. Running a test with the TB3 test box will show whether the
test system needs to be returned to the factory for calibration. Testing with the TB3 test box is no
substitute for the recommended regular calibration procedure.
The TB3 simulates a standardised DUT. The UNIMET® runs a test sequence and evaluates the result
as "PASSED" or "FAILED". A description of how to connect and use the test box appears on the TB3's
instruction leaflet.
38 UNIMET8xxST_D00008_01_M_XXEN/02.2016
6. Testing and measuring
Classification
The UNIMET® allows tests to be carried out in accordance with the standards DIN EN 60601-1 (VDE
0750-1), DIN EN 62353 (VDE 0751-1), DIN VDE 0701-0702 (VDE 0701-0702) und EN 61010-1 (VDE
0411-1). For test specifications of DUTs not saved in the "Test specifications" folder so far, the re-
quired test steps and their limit values have to be determined in dialogue between the test engineer
and the UNIMET®. This classification is then saved as a test specification named accordingly in the
"Test specifications" folder, where it is available for all subsequent DUTs of the same type.
Test
Single test
Test steps can be called up in the form of single tests and repeated as often as required. If, for exam-
ple, a limit value is not complied with during a device test, the test step concerned can be examined
in more detail using a single test.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 39
Testing and measuring
6.2 Classification
► Select the applicable test standard from the main folder. Answer the questions that appear on
the screen.
The test system will identify the required test steps, their sequence and the limit values to be com-
plied with. Classification produces the test specification, which is saved to the "Test specifications"
folder.
Example:
Classification of medical electrical equipment (e.g. ultrasound device) according to IEC 62353:2007-05
This is a Class I device with two patient connections.
In the main folder, select "IEC 62353:2007-05“ and then "Class I".
The remainder of the classification procedure is carried out on tabs. The UNIMET® marks completed
tabs with the "√" symbol. Modify the settings on every tab to reflect the properties of the DUT.
Then click OK to accept your entries. To cancel classification, click X .
6.2.1 General
The following rules apply to all text boxes: Once a term has been entered, you will
need to use the list every time you enter this term subsequently. This is to ensure
that the same term is always written in an identical way. This is a basic require-
ment in order for term searches and selections to work (e.g. with the query filter;
see also "How to use the query filter" on page 30).
You must always enter a name. If you do not, you will not be able to save the classification. Example:
Ultrasound.
The manufacturer and designation describe the DUT in more detail. You must decide whether you
want to enter this information immediately or edit it at a later date. You also need to specify a test
interval for recurrent tests. Once a device has passed the test, the UNIMET® will calculate the date of
the next device test.
40 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
► When clicking on an entry, a short description appears in the info field at the bottom.
► Double-click on an entry to open the software keyboard and edit that entry (entries can also be
edited using an external keyboard).
UNIMET8xxST_D00008_01_M_XXEN/02.2016 41
Testing and measuring
6.2.5 Extras
The "Extras" tab combines a variety of settings.
► Click on an entry to show an explanatory comment in the info field at the bottom of the tab.
► Double-click on an entry to activate that function. Activated entries are identified by the "√"
symbol.
Depending on the selected test standard, the following settings are available.
All accessible conductive This function can be used if you know that all metal accessible parts of the
parts are connected to PE enclosure are connected to PE. During device testing, the test probe then only
has to be brought into contact with one metal point on the enclosure.
If not all metal parts of the enclosure are connected to PE, deactivate this
function. During device testing, an additional equipment leakage current test
resp. touch current test (Class II) is carried out. The semi-automatic test
sequence is classified automatically.
During device testing, proceed as follows:
During PE conductor testing, use the test probe to scan all parts of the enclo-
sure connected to PE. During equipment leakage current testing or touch cur-
rent testing (Class II), test all parts not connected to PE.
Warm-up and cool-down Once they have been switched on, an increasing number of DUTs need to
period complete a self-test and warm-up period, followed by a cool-down period
prior to shutting down. Examples include computers, processor-controlled
devices and laser equipment.
For these devices, the UNIMET® may only start the measurements once the
DUT has warmed up or "booted up". Otherwise, there is a risk that the parts of
the device to be tested will only have switched on partially or not at all, and
therefore will not be tested.
Once the measurements are complete, the UNIMET® may only turn off the
DUT once it has shut down or cooled down. Otherwise, on laser equipment,
there is the risk of overheating or, on a computer, of sectors of the hard disk
becoming unusable.
Display warning notice If this function is activated, a warning notice will appear prior to the DUT con-
nected to the mains voltage. Only once the message has been confirmed will
the mains voltage be connected. This prevents hazardous devices such as
grinders starting up unexpectedly.
Carry out insulation resist- During insulation measurement, a voltage of 500 V is applied between the
ance test step active conductors and earth. Insulation testing may damage sensitive devices.
(not applicable for tests acc. Only activate insulation measurement if permitted by the manufacturer's
to DIN EN 60601-1) instructions provided with the DUT.
Permit measurement with Permanently installed equipment with neutral conductor not protected by a
phase reversed fuse cannot be tested with phase reversed.
(only applicable for tests
acc. to DIN EN 60601-1)
42 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
25-A power source EPS800 Activate this option for carrying out a standard-compliant test of the protec-
connected tive earth resistance with 25 A. The external power source EPS800 is required
(only for tests in acc. with for these tests.
DIN EN 60601-1)
ME equipment/system with Detecting leakage currents from medical electrical equipment or systems
signal input or output parts whose signal input and output is connected to an external voltage.
(only for tests in acc. with
DIN EN 60601-1)
Functional earth is also con- The functional earth of the medical electrical equipment resp. the system is
nected connected to FE connection of the test device.
(for tests acc. to DIN EN
60601-1 only)
DUT can be disconnected If the DUT cannot be disconnected from the system, deactivate this option
from the system (limited equipment test).
(only for tests acc. to DIN
VDE 0701-0702)
If an error is detected during automatic testing, the test step concerned can be repeated. The UN-
IMET® will switch to manual mode for this test step.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 43
Testing and measuring
2 3 4 5
1 Current test steps in the visual inspection process. The first test step is selected (single-click).
Double-click to edit the test step.
3 A new test step is added below the existing test steps. The software keyboard opens automati-
cally for this purpose.
5 The default test steps associated with the relevant standard are activated. Any user-defined test
steps are deleted.
44 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
PASSED/ It is evaluated as "PASSED" or "FAILED". Text for display on the screen can
FAILED evaluation be entered.
No evaluation after entering The measured value entered is documented. The test step does not affect
the measured value the evaluation of the test result ("PASSED"/"FAILED").
Limit value evaluation The test step is evaluated against the limit values. The text displayed on
after entering the measured the screen should include the setpoint and the unit.
value
UNIMET8xxST_D00008_01_M_XXEN/02.2016 45
Testing and measuring
2. Enter a text to be displayed on the screen for this test step. Then click "OK".
2 3 4
1 Current test steps in the functional test process. The first test step is selected (single-click). Dou-
ble-click to edit the test step.
2 Saves the current test steps in the functional test process.
3 A new test step is added below the existing test steps. Configure the test step and enter the
associated text to be displayed on the screen.
4 Deletes the selected test step.
Display text/
Selected property minimum and maximum limit Description
value
46 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
Saving and testing The classification is saved under its name to the "Test specifications" folder.
Afterwards, the device test will be started.
Save The classification is saved under its name in the "Test specifications" folder.
Cancel The classification is not saved.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 47
Testing and measuring
Faulty DUTs may present dangerous touch currents on conductive parts during
the device test.
The UNIMET® will terminate test steps during which the leakage current is detect-
ed by means of "Direct measurement method" as soon as a measured value of >
WARNING
20 mA is reached.
The test system must not be used for measurements in electrical installations. It
is exclusively intended for devices and systems listed under "System description"
on page 11.
WARNING
During testing of the insulation resistance with DC 500 V, a direct touch current
of up to 2.5 mA may be conducted on faulty DUTs or in the event of direct contact
with the test probe. DIN EN 61010 permits a direct touch current of up to 15 mA.
CAUTION
The leakage current flowing during the test of a faulty DUT can cause the resid-
ual current protective device (RCD) to operate.
CAUTION
When leakage currents are measured during a test, the DUT must be set up in an
insulated state. This ensures that no leakage currents can flow via accidental
earth connections. Accessible conductive parts of the DUT and the measuring
CAUTION leads may be live. and therefore must not be touched.
48 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
UNIMET8xxST_D00008_01_M_XXEN/02.2016 49
Testing and measuring
In the wiring diagram, the test probe is connected to socket [A]. We are using the
TP800 active test probe (option).
The single-pole test probe supplied with the UNIMET® is connected to socket [B].
1
7
2 6
3 4 5
1 Test engineer logged on
2 Start device test
3 Test standard
4 Only if there is an applied part: Additional information about the applied part.
5 Test specification or device ID
6 Cancel device test
7 Wiring diagram
Proceed as follows:
1. Connect the DUT to the UNIMET®.
2. Then click the "Start" button.
50 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
Click "Proceed" to proceed with the electrical part of the device test.
The UNIMET® monitors compliance with the limit values throughout the device test.
If a limit value is violated during a test step, the test engineer can decide whether to abort the device
test or continue to its completion.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 51
Testing and measuring
7
1 6
2 5
3 4
1 Measured value. The background colour is
- green if the limit value is complied with
- red if the limit value is not complied with
- black if there is no limit value
2 Progress bar and test step counter
3 Space for "Next" button
(Only for manual and semi-automatic test sequences, or if the limit value was not observed and
the device test was not aborted).
4 Aborts the device test.
5 Number of the test step. Bender device test steps are numbered consecutively. Also refer to
chapter "8.3 Test steps".
6 Measured value unit
7 Name of the current test step
► In accordance with the classification, further tests during which the DUT is not in operation
(e.g. PE conductor test, insulation resistance test and equipment leakage current -alternative
measurement) are carried out after the PE conductor test.
52 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
Warm-up period
If the "Warm-up and cool-down period" was activated on the "Extras" tab during the classification proc-
ess, the UNIMET® will wait for the device to ramp up or reach readiness for operation. Once the DUT is
connected to the mains supply, the message "Warm-up phase" appears.
► Click "Next" to proceed with the device test.
Power consumption
The UNIMET® ST measures the power consumed by the DUT.
Please note that only DUTs with a power consumption of up to 16 A may be sup-
plied with power via the UNIMET® test socket. UNIMET® in specific national ver-
sions for Switzerland, Great Britain and the USA are only designed for a current
consumption of maximum 10 or 13 A (see ordering information). If DUTs with
too high power consumption are connected, the thermomagnetic circuit-break-
er installed in the power switch of the UNIMET® will trip. After disconnecting the
DUT, the test system can be switched on after a few seconds.
At a load current of less than 0.005 A, the UNIMET® will prompt you to confirm that the DUT is actually
switched on.
► This is the latest point at which you can switch the DUT on. Then click "Proceed".
Cool-down period
If the "Warm-up and cool-down period" function was activated on the "Extras" tab during the classifi-
cation process, once the last test step to be carried out with this phase relation has been completed,
the UNIMET® will wait for the DUT to ramp down.
► Click "Next" to proceed with the device test.
The UNIMET® then repeats the tests with the phase reversed. Here too, it will com-
ply with any settings made in relation to warm-up and cool-down period.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 53
Testing and measuring
Only DUTs which have successfully passed the electrical tests may be tested for
correct functioning.
DUTs can suddenly start while starting the functional test (example:
jigsaw). This can lead to damage and injuries.
WARNING ► Switch the DUT off before starting the functional test. First, select "Operat-
ing voltage ON". Then switch the DUT on again.
Operating voltage "ON" DUT is put into operation* via the test socket of the UNIMET®. Please note the
manufacturer's instructions when doing this.
Three-phase DUTs and DUTs with power consumption levels higher than 16 A
(resp.10 or13 A, see ordering information) cannot be supplied with power via
the test socket. Connect these DUTs directly to the designated mains voltage.
Operating voltage "OFF" The DUT is switched off*.
Proceed Proceed to the next test step.
PASSED The DUT has passed the test step.
FAILED The DUT has failed the test step. The entire device test is saved as "FAILED".
Complete Results are accepted. The functional test concludes.
Cancel The functional test is aborted. The entire device test is evaluated as "FAILED".
54 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
3 4 5 6 3 4 5 6
1 Overall result of the device test. The background colour is:
- green, if the device has passed the test,
- red, if the device has failed the test.
3 Starts the device test again. The existing device test is overwritten.
4 Saves the device test to the "Device protocols" folder. The values initially saved for this device ID
(reference values) are always retained. All subsequent device tests are overwritten by the more
recent device test in each case.
6 Quits the device test. If the device protocol has not been saved, a warning will appear.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 55
Testing and measuring
► Click on a test step to show details. The evaluation of the test step, the measured value and the
limit value are shown.
► The device ID is required for saving to the "Device protocols" folder. Other data such as serial
number, client, room, department, test costs, and a comment can also be entered. Enter at
least the device ID and click "Save device protocol". Click "Cancel" to exit the device test. If a
device passes the test, the test date is updated by the set test interval.
The following rules apply to all text boxes: Once a term has been entered, you will
need to use the list every time you enter this term subsequently. This is to ensure
that the same term is always written in an identical way. This is a basic require-
ment in order for term searches and selections to work (e.g. with the query filter;
see also "How to use the query filter" on page 30).
If the same device ID has been inadvertently assigned to two different clients, UNIMET® is able to de-
tect that these are two different DUTs. The device protocols for both DUTs are saved and adminis-
tered.
56 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
UNIMET8xxST_D00008_01_M_XXEN/02.2016 57
Testing and measuring
If the "Test specifications" folder contains a large number of names, you can se-
lect the "List" or "Details" screen configuration to improve transparency. This set-
ting remains saved even after the test system is shut down.
You can also improve transparency by using the query filter. An empty "Test
specifications" folder indicates that none of the entries meets the conditions set
in the query filter. Deactivate the query filter or select different settings for it.
6.5.2 How to start a device test from the "Test specifications" folder
► Click on the required test specification and proceed as follows:
– Click in the toolbar,
– or on (Context menu) in the toolbar,
then double-click "Start device test".
If a device has been tested and saved previously, you will need to start the recurrent testing from the
"Device protocols" folder.
The settings saved in a test specification are valid for all device protocols created
with this test specification. Changes to the test specification are applied to all as-
sociated device protocols with immediate effect.
When deleting a test specification, please remember that you are also deleting
all device protocols created with it from the "Device protocols" folder.
58 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
Use the "Context Menu" on the toolbar to edit the name of an existing test specification. Proceed as
follows:
1. Click on the name.
2. Click (Context menu) in the toolbar
3. Select required action
4. Select one of the following operator actions by double-clicking on it:
You can also modify a test specification by double-clicking on the name. Please bear in mind the re-
strictions listed below.
Start device test Starts the device test. Once the device test is complete, save the test result to
the "Device protocols" folder.
Test specification - Shows the settings for this test specification.
Properties If you need to make fundamental changes affecting test steps, you will
need to repeat the classification process. Here, you can only change the
functions listed below:
Tab Function
General - Name (only if not yet transferred to PC)
- Manufacturer
- Designation
- Test interval
Extras - Show warning notice
- Warm-up and cool-down period
Test sequence - Automatic
- Semi-automatic
- Manual
Test specification- Limit values for test steps can be modified and test steps can be added or
Test step editor deleted in the Test step editor (see page 60 for more detailed information)
Test specification(s) - Prints the selected test steps (all details of the test step) on a connected
Print printer or creates a PDF file.
Test specification(s) - Prints an overview of the selected test specifications on a connected printer or
Print overview creates a PDF file.
Test specification(s) - Exports the selected test specification to a USB drive (USB stick). A progress
XML-Export (USB) bar appears on the screen. The process can be aborted. The exported data can
be imported again.
Test specification(s )- Deletes the selected test specifications along with the associated device pro-
Delete tocols. A progress bar appears on the screen. The process can be aborted.
Exit The "context menu" function is exited.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 59
Testing and measuring
Running the modified test sequence can put test personnel (electric shock) and
the DUT (damage beyond repair) at risk. You should therefore first run a test se-
quence without the DUT and check whether all tests are completed as required.
Only at this point should you connect the DUT. During testing, do not touch any
WARNING
conductive metal parts of the DUT or test leads.
Proceed as follows:
1. Open the "Test specifications" folder.
2. Click on the required test specification.
3. Click (Context menu) in the toolbar and select
"Test specification - Test step editor".
► The settings on the "General", "Extras", and "Test sequence" tabs are made in the same way
as during the original classification process:
► The "Applied part" tab is used to add, edit and delete groups (application groups).
– Deleting a group: Single-click on the group to be deleted, then click "Delete".
– Editing a group: Double-click on one of the groups in the list to start editing it. Example:
Change group "Type B" to "Type BF".
– Creating a new group: Click "Create new". Select the type of the new group and the asso-
ciated sockets.
Example: "Type CF" with patient socket 3…6.
You also need to enter the test steps associated with this group. A group for
which no test steps have been entered will be deleted when the test specification
is saved.
A safer and quicker procedure is to make as many settings as possible during the
classification process and just make minor adjustments with the test step editor.
► Visual inspections can be added or deleted. Test steps for the functional test can be added or
deleted.
60 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
► The primary task of the test system is the electrical test. Test steps can be edited, deleted and
added via the "Test steps" tab.
– Deleting test steps: If, for example, you have doubts about running the insulation resist-
ance test, click on this test step, followed by the "Delete" button. The test step is deleted
with immediate effect.
– Editing test steps: Start the edit process of the limit value by double-clicking on the
required test step. Enter a new limit value using an external keyboard or via the numbers
and arrow buttons on the screen. Click OK to accept your entries. To abort the function,
click X .
– Filter selection by standards: Click "Standards". The currently selected filter will be indi-
cated. Example: Only test steps included in DIN EN 62353 will be indicated.
Click to display the list of available standards. Click on the respective standard or "Dis-
play all electrical test steps". Then click the "OK" button.
– Adding test steps: Click "Add". A list of available test steps appears. The available test steps
depend on the settings of the "Standards" button.
Click on the required test step. Then click on the "Limit value" text box. Enter a new limit
value using an external keyboard or via the numbers and arrow buttons on the screen. Con-
firm the new limit value by clicking the OK button, located between the arrow buttons.
Click OK at the top of the screen to accept your entries for this test step. To abort the function, click
X.
You must always enter an applicable limit value when creating new test steps. If
you do not, the default limit values, which are too strict, will lead to the DUT fail-
ing the test.
– Adding test steps for the applied part: Test steps have to be created for the new group
created under "Applied part". Go to the "Test Steps" tab and click "Add".
Under "Test Steps" add a test step (e.g. applied part leakage current) for the new group (i.e.
this applied part). Enter the associated limit value.
Click OK at the top of the screen. The "Assign group" window appears. Select the corre-
sponding group then click "OK".
Click OK to accept your entries. To abort the function, click X .
For each group, a new test step has to be added and the group then needs to be
assigned.
– Saving test specifications: Once you have made all the settings for this test specification,
click OK .
The test system will now check the new settings. The test steps are sorted into an appropri-
ate order for the test sequence. Groups of applied parts with no associated test steps are
deleted. The test specification is then saved with the new settings.
Modified test specifications are marked with the suffix "MOD." before the test standard.
Example: MOD. DIN EN 60601-1…
UNIMET8xxST_D00008_01_M_XXEN/02.2016 61
Testing and measuring
The content of the "Test specifications" folder can be transferred to an administration program in-
stalled on a PC. Likewise, data records selected in the administration program can be transferred to
the "Device protocols" folder. These functions are described in the PC software guide.
If the "Device protocols" folder contains a large number of device IDs, you can se-
lect the "List" or "Details" screen configuration to improve transparency. This set-
ting remains saved even after the test system is shut down.
You can also improve transparency by using the query filter. An empty "Device
protocols" folder indicates that none of the entries meets the conditions set in the
query filter. Deactivate the query filter or select different settings for it.
6.6.2 How to start a device test from the "Device protocols" folder
► Click the required device ID and proceed as follows:
– Click in the toolbar,
– or on (Context menu) in the toolbar,
then double-click "Start device test".
62 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
You can also modify a device protocol by double-clicking on the device ID. Please bear in mind the
restrictions listed below.
Start device test Starts the device test. Once the device test is complete, save the test result to
the "Device protocols" folder. This will overwrite the old device protocol.
Device protocol Shows the device properties and reference values.
properties If you need to make fundamental changes which could have an effect on the
test steps, you will need to repeat the classification process.
Here, you can only change the functions listed below:
Tab Function
Master data - >>Serial No.
- Manufacturer
- Designation
- Client
- Location
- Street
- Building
- Department
- Room
- Test costs
- Comment
- Date of next test
Device protocol(s)- Prints the selected device protocols (all details of the device protocol) on a
Print connected printer or creates a PDF file.
Device protocol(s)-Print Prints an overview of the selected device protocols on a connected printer or
overview creates a PDF file.
Device protocol(s)- Exports the selected device protocols to a USB drive (backup copy on USB
XML-Export (USB) stick). A progress bar appears on the screen. The process can be aborted. The
exported data can be imported again.
Device protocol(s)- Exports the selected device protocols to a USB drive (USB stick) as an Excel file.
CSV-Export (USB) A progress bar appears on the screen. The process can be aborted. The
exported data cannot be imported again. They can only be used as Excel files.
Device protocol(s)- Deletes the selected device protocols. A progress bar appears on the screen.
Delete The process can be aborted.
Exit The "context menu" function is exited.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 63
Testing and measuring
For safety reasons, the device aborts each single test after two minutes.
64 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Testing and measuring
Risk of incorrect measured values if zero balance has not been carried out
A zero balance of the UNIMET® has to be performed for the test probe or the
measuring lead. This ensures that the ohmic resistance of the test probe and/or
the measuring lead will not affect the PE conductor test result. You should repeat
this calibration procedure every time you connect a different test probe or meas-
uring lead to the test system.
A zero balance procedure can be saved for each measurement path of the PE
conductor testing (see chapter "5.5.2 ").
► Plug measuring lead (if applicable, with test terminal) into socket "C". Contact PE connector
with DUT.
► Plug the passive test probe into socket "B" or rather the active test probe into socket "A". Test
accessible metallic enclosure parts of the DUT.
► Plug the detachable power supply cord into the test socket of the UNIMET®.
► Plug adapters or measuring lead with test terminal into socket "C".
UNIMET8xxST_D00008_01_M_XXEN/02.2016 65
Testing and measuring
► Plug the power supply cable into the test socket of the UNIMET®.
► Plug the passive test probe into socket "B" or the active test probe into socket "A". Test accessi-
ble metallic enclosure parts of the DUT.
66 UNIMET8xxST_D00008_01_M_XXEN/02.2016
7. Maintenance and calibration
7.1 Calibration
Like any other test instrument, the UNIMET® requires a regular measured values check. The calibra-
tion interval is 36 months. The test system can only be calibrated and adjusted by Bender or centre
approved by Bender.
7.3 Maintenance
Other than the work carried out as part of periodic calibration, the test system requires no further
maintenance.
UNIMET8xxST_D00008_01_M_XXEN/02.2016 67
Maintenance and calibration
68 UNIMET8xxST_D00008_01_M_XXEN/02.2016
8. Data
8.1 Standards
8.1.1 Application standards
The UNIMET® carries out measurements and tests according to the following standards:
DIN EN 60601-1 (VDE 0750-1):2013-12
Medical electrical equipment - Part 1: General requirements for basic safety and essential per-
formance (IEC 60601-1:2005); German version: EN 60601-1:2006
DIN EN 62353 (VDE 0751-1):2008-08
"Medical electrical equipment - Recurrent test and test after repair of medical electrical equip-
ment (IEC 62353:2007); German version: EN 62353:2008"
DIN VDE 0701-0702 (VDE 0701-0702):2008-06
„Prüfung nach Instandsetzung, Änderung elektrischer Geräte - Wiederholungsprüfung elek-
trischer Geräte - Allgemeine Anforderungen für die elektrische Sicherheit“ (Inspection after
repair, modification of electrical appliances - Periodic inspection on electrical appliances - Gen-
eral requirements for electrical safety)
DIN EN 61010-1 (VDE 0411-1):2011-07
"Safety requirements for electrical equipment for measurement, control and laboratory use -
Part 1: General requirements (IEC 61010-1:2010 + Cor.:2011); German version EN 61010-1:2010"
UNIMET8xxST_D00008_01_M_XXEN/02.2016 69
Data
Terms Description
Detachable power Flexible cord intended to be connected to electrical equipment by means of a suita-
supply cord ble appliance coupler for mains supply purposes.
ME equipment Medical electrical equipment provided with not more than one connection to a par-
ticular supply mains and intended by its manufacturer to be used:
a) in diagnosis, treatment or monitoring of a patient; and has an applied part or
transfers energy to or from the patient or detects such energy transfer to or from the
patient; or
b) compensation or alleviation of disease, injury or disability
Applied part Part of ME equipment that in normal use necessarily comes into physical contact
with the patient for ME equipment or an ME system to perform its function…
F-type isolated Applied part in which the patient connections are isolated from other parts of the
(floating) applied ME equipment to such a degree that no current higher than the allowable applied
part part leakage current flows if an unattended voltage originating from an external
source is connected to the patient, and thereby applied between the patient con-
nection and earth.
Type B applied part Applied part complying with the specified requirements of DIN EN 60601-1 to pro-
vide protection against electric shock, particularly regarding allowable patient leak-
age current and patient auxiliary leakage current.
Type BF applied Type F applied part complying with the specified requirements of DIN EN 60601-1 to
part provide a higher degree of protection against electric shock than that provided by
Type B applied parts.
Type CF applied Type F applied part complying with the specified requirements of DIN EN 60601-1 to
part provide a higher degree of protection against electric shock than that provided by
Type BF applied parts.
Accessible part Part of electrical equipment other than applied part that can be touched by means
of the standard test finger (acc. to DIN EN 60601-1)
Direct cardiac Use of applied part that can come in direct contact with the patient's heart.
application
Electrically skilled Person with relevant education and experience to enable him or her to perceive risks
person and to avoid hazards which electricity can create.
Permanently Adjective meaning electrically connected to the supply mains by means of a perma-
installed nent connection that can only be detached by the use of a tool.
Class I equipment Adjective referring to electrical equipment in which protection against electric shock
does not rely on basic insulation only, but which includes an additional safety pre-
caution in that means are provided for accessible parts of metal or internal parts of
metal to be protectively earthed.
Class II equipment Adjective referring to electrical equipment in which protection against electric shock
does not rely on basic insulation only, but which additional safety precautions such
as double insulation or reinforced insulation are provided.
70 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
Terms Description
NEP Accessible metal parts not protectively earthed (non earthed parts)
Internally powered Adjective referring to electrical equipment that is able to operate from an internal
electrical power source.
Measuring device Measuring device. A measuring device must apply an impedance of a specific value
(MD) to the source of the leakage current. For alternating current, the measuring device
must have a specific frequency characteristic. The standard applicable to the DUT
will provide detailed information.
Mains Part (MP) Mains Part. Electrical circuit that is intended to be connected to the supply mains.
Abbreviation Meaning
UNIMET8xxST_D00008_01_M_XXEN/02.2016 71
Data
Abbreviation Meaning
72 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
1 PE resistance, enclosure PE
2 PE resistance, cord
UNIMET8xxST_D00008_01_M_XXEN/02.2016 73
Data
80 Load current
81 Operating voltage
82 Power consumption
74 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
92 Touch current NC AC
96 Touch current NC DC
UNIMET8xxST_D00008_01_M_XXEN/02.2016 75
Data
76 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
UNIMET8xxST_D00008_01_M_XXEN/02.2016 77
Data
78 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
526 Applied part leak. curr. NC DC Ph-r U-IO NEP FE->PE Ph-r
527 Applied part leak. curr. NC AC Ph-r U-IO NEP FE->PE Ph-r
UNIMET8xxST_D00008_01_M_XXEN/02.2016 79
Data
438 Applied part leak. curr. SFC DC NEP SC-O FE->PE Ph-r
439 Applied part leak. curr. SFC AC NEP SC-O FE->PE Ph-r
446 Applied part leak. curr. SFC DC NEP PE-O FE->PE Ph-r
447 Applied part leak. curr. SFC AC NEP PE-O FE->PE Ph-r
80 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
462 Applied part leak. curr. SFC DC U-IO SC-O FE->PE Ph-r
463 Applied part leak. curr. SFC AC U-IO SC-O FE->PE Ph-r
470 Applied part leak. curr. SFC DC U-IO PE-O FE->PE Ph-r
471 Applied part leak. curr. SFC AC U-IO PE-O FE->PE Ph-r
482 Applied part leak. curr. SFC DC Ph-r U-IO SC-O Ph-r
483 Applied part leak. curr. SFC AC Ph-r U-IO SC-O Ph-r
484 Applied part leak. curr. SFC DC Ph-r U-IO SC-O FE->PE
485 Applied part leak. curr. SFC AC Ph-r U-IO SC-O FE->PE
486 Applied part leak. curr. SFC DC Ph-r U-IO SC-O FE->PE Ph-r
487 Applied part leak. curr. SFC AC Ph-r U-IO SC-O FE->PE Ph-r
490 Applied part leak. curr. SFC DC Ph-r U-IO PE-O Ph-r
491 Applied part leak. curr. SFC AC Ph-r U-IO PE-O Ph-r
492 Applied part leak. curr. SFC DC Ph-r U-IO PE-O FE->PE
493 Applied part leak. curr. SFC AC Ph-r U-IO PE-O FE->PE
494 Applied part leak. curr. SFC DC Ph-r U-IO PE-O FE->PE Ph-r
495 Applied part leak. curr. SFC AC Ph-r U-IO PE-O FE->PE Ph-r
UNIMET8xxST_D00008_01_M_XXEN/02.2016 81
Data
506 Applied part leak. curr. SFC DC U-IO NEP SC-O Ph-r
507 Applied part leak. curr. SFC AC U-IO NEP SC-O Ph-r
508 Applied part leak. curr. SFC DC U-IO NEP SC-O FE->PE
509 Applied part leak. curr. SFC AC U-IO NEP SC-O FE->PE
510 Applied part leak. curr. SFC DC U-IO NEP SC-O FE->PE Ph-r
511 Applied part leak. curr. SFC AC U-IO NEP SC-O FE->PE Ph-r
514 Applied part leak. curr. SFC DC U-IO NEP PE-O Ph-r
515 Applied part leak. curr. SFC AC U-IO NEP PE-O Ph-r
516 Applied part leak. curr. SFC DC U-IO NEP PE-O FE->PE
517 Applied part leak. curr. SFC AC U-IO NEP PE-O FE->PE
518 Applied part leak. curr. SFC DC U-IO NEP PE-O FE->PE Ph-r
519 Applied part leak. curr. SFC AC U-IO NEP PE-O FE->PE Ph-r
528 Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O
529 Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O
530 Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O Ph-r
531 Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O Ph-r
532 Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O FE->PE
533 Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O FE->PE
534 Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O FE->PE Ph-r
535 Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O FE->PE Ph-r
536 Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O
537 Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O
538 Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O Ph-r
539 Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O Ph-r
540 Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O FE->PE
541 Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O FE->PE
542 Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O FE->PE Ph-r
543 Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O FE->PE Ph-r
82 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
557 Applied part leak. curr. SFC Ph-r U-AP FE->PE Ph-r
561 Applied part leak. curr. SFC U-AP NEP FE->PE Ph-r
563 Applied part leak. curr. SFC Ph-r U-AP NEP Ph-r
564 Applied part leak. curr. SFC Ph-r U-AP NEP FE->PE
565 Applied part leak. curr. SFC Ph-r U-AP NEP FE->PE Ph-r
566 Applied part leak. curr. int. power source SFC U-AP
577 Applied part leak. curr. SFC Ph-r U-NEP FE->PE Ph-r
578 Applied part leak. curr. int. power source SFC U-NEP
UNIMET8xxST_D00008_01_M_XXEN/02.2016 83
Data
84 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
726 Σ Applied part leak. curr. NC DC Ph-r U-IO NEP FE->PE Ph-r
727 Σ Applied part leak. curr. NC AC Ph-r U-IO NEP FE->PE Ph-r
638 Σ Applied part leak. curr. SFC DC NEP SC-O FE->PE Ph-r
UNIMET8xxST_D00008_01_M_XXEN/02.2016 85
Data
639 Σ Applied part leak. curr. SFC AC NEP SC-O FE->PE Ph-r
646 Σ Applied part leak. curr. SFC DC NEP PE-O FE->PE Ph-r
647 Σ Applied part leak. curr. SFC AC NEP PE-O FE->PE Ph-r
662 Σ Applied part leak. curr. SFC DC U-IO SC-O FE->PE Ph-r
663 Σ Applied part leak. curr. SFC AC U-IO SC-O FE->PE Ph-r
670 Σ Applied part leak. curr. SFC DC U-IO PE-O FE->PE Ph-r
671 Σ Applied part leak. curr. SFC AC U-IO PE-O FE->PE Ph-r
682 Σ Applied part leak. curr. SFC DC Ph-r U-IO SC-O Ph-r
683 Σ Applied part leak. curr. SFC AC Ph-r U-IO SC-O Ph-r
684 Σ Applied part leak. curr. SFC DC Ph-r U-IO SC-O FE->PE
685 Σ Applied part leak. curr. SFC AC Ph-r U-IO SC-O FE->PE
686 Σ Applied part leak. curr. SFC DC Ph-r U-IO SC-O FE->PE Ph-r
687 Σ Applied part leak. curr. SFC AC Ph-r U-IO SC-O FE->PE Ph-r
86 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
690 Σ Applied part leak. curr. SFC DC Ph-r U-IO PE-O Ph-r
691 Σ Applied part leak. curr. SFC AC Ph-r U-IO PE-O Ph-r
692 Σ Applied part leak. curr. SFC DC Ph-r U-IO PE-O FE->PE
693 Σ Applied part leak. curr. SFC AC Ph-r U-IO PE-O FE->PE
694 Σ Applied part leak. curr. SFC DC Ph-r U-IO PE-O FE->PE Ph-r
695 Σ Applied part leak. curr. SFC AC Ph-r U-IO PE-O FE->PE Ph-r
706 Σ Applied part leak. curr. SFC DC U-IO NEP SC-O Ph-r
707 Σ Applied part leak. curr. SFC AC U-IO NEP SC-O Ph-r
708 Σ Applied part leak. curr. SFC DC U-IO NEP SC-O FE->PE
709 Σ Applied part leak. curr. SFC AC U-IO NEP SC-O FE->PE
710 Σ Applied part leak. curr. SFC DC U-IO NEP SC-O FE->PE Ph-r
711 Σ Applied part leak. curr. SFC AC U-IO NEP SC-O FE->PE Ph-r
714 Σ Applied part leak. curr. SFC DC U-IO NEP PE-O Ph-r
715 Σ Applied part leak. curr. SFC AC U-IO NEP PE-O Ph-r
716 Σ Applied part leak. curr. SFC DC U-IO NEP PE-O FE->PE
717 Σ Applied part leak. curr. SFC AC U-IO NEP PE-O FE->PE
718 Σ Applied part leak. curr. SFC DC U-IO NEP PE-O FE->PE Ph-r
719 Σ Applied part leak. curr. SFC AC U-IO NEP PE-O FE->PE Ph-r
728 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O
729 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O
730 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O Ph-r
731 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O Ph-r
732 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O FE->PE
733 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O FE->PE
734 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP SC-O FE->PE Ph-r
735 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP SC-O FE->PE Ph-r
736 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O
UNIMET8xxST_D00008_01_M_XXEN/02.2016 87
Data
737 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O
738 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O Ph-r
739 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O Ph-r
740 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O FE->PE
741 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O FE->PE
742 Σ Applied part leak. curr. SFC DC Ph-r U-IO NEP PE-O FE->PE Ph-r
743 Σ Applied part leak. curr. SFC AC Ph-r U-IO NEP PE-O FE->PE Ph-r
757 Σ Applied part leak. curr. SFC Ph-r U-AP FE->PE Ph-r
761 Σ Applied part leak. curr. SFC U-AP NEP FE->PE Ph-r
763 Σ Applied part leak. curr. SFC Ph-r U-AP NEP Ph-r
764 Σ Applied part leak. curr. SFC Ph-r U-AP NEP FE->PE
765 Σ Applied part leak. curr. SFC Ph-r U-AP NEP FE->PE Ph-r
766 Σ Applied part leak. curr. int. power source SFC U-AP
777 Σ Applied part leak. curr. SFC Ph-r U-NEP FE->PE Ph-r
778 Σ Applied part leak. curr. int. power source SFC U-NEP
88 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
UNIMET8xxST_D00008_01_M_XXEN/02.2016 89
Data
90 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
Apparent power
Measuring range ............................................................................................................................................ 5…3600 VA
Frequency range ...............................................................................................................................................48…62 Hz
Intrinsic uncertainty.........................................................................................................................± 5 % v. M. ± 3 digits
General data
EMC...................................................................................................................................................................IEC 61326-1
Ambient temperature ......................................................................................................................................0…+40 °C
Storage temperature ................................................................................................................................... -10 …+70 °C
Relative humidity (up to 31 °C) .......................................................................................................................... max. 80%
Relative humidity (>31…40 °C) .....................................................................................decreasing linearly, max. 50%
........................................................................................................................................... Condensation must be avoided
Height above sea level ....................................................................................................................................max. 2000 m
Degree of protection, enclosure: IP40, connections: IP20
................................................................................................................................acc. to DIN VDE 0470 Part 1/EN 60529
Dimensions (without bag) ...................................................................................approx. 300x277x126 mm (W x D x H)
Weight (without accessories or bag) ...........................................................................................................approx. 3.5 kg
Calibration interval ..............................................................................................................................................36 months
of MV = of measured value
UNIMET8xxST_D00008_01_M_XXEN/02.2016 91
Data
92 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Data
UNIMET8xxST_D00008_01_M_XXEN/02.2016 93
Data
PK3 Test kit, various adapters for connecting med- B 9602 0004
ical electrical equipment to test systems
TP16 Cable drum with 16 m measuring lead B 9602 0054
TB3 Test box for testing test systems B 9602 0025
PAT Box For measuring of up to 10 patient connec- B 9602 0096
tions with UNIMET® 1100/800/400ST accord-
ing to IEC 62353
DS32A Three-phase adapter for testing medical elec- B 9602 0098
trical three-phase devices during operation
(acc. to DIN EN 62353, DIN VDE 0751-1, DIN
VDE 0701-0702)
TP1010 For measurement of equipment for labora- B 9602 0060
tory use with UNIMET® 800ST and
UNIMET® 1100ST or 1000ST
acc. to IEC 1010-1; EN 61010-1
94 UNIMET8xxST_D00008_01_M_XXEN/02.2016
INDEX
A - Delete 63 K
- edit 63
Accessories 15 Keyboard 23
- empty folder 62
Activating the functional test 60 - American 35
- exporting 63
Active test probe 16, 43, 50, 93
- Import 57
Adapter for non-heating appliances 15 L
- Print 63
Adding test steps 61
- Print overview 63 Languages 25
Application groups 60
- Start device test 62, 63 Leakage currents 11
Applied part 41, 60
Device settings 34 - dangerous 48
- Group 41, 60
Display light 34 Limit values 40
Area of application 9
Double-click 35 List 25
Areas of application 11
B E M
Editing test steps 61 Manufacturer's instructions 42
Background 34
Entry Measuring lead 15
Backup copy 37
- List 26 Method of measurement 41
Barcode scanner 23
EPS800 43
Battery
Equipment type 42
- Changing 67
Excel file 63
N
exporting 59, 63 Names 40, 58
C Extras 42 Nominal system voltage 36
Calibration 38 Null modem 15
Calibration certificate 15 F
Calibration interval 67
Functional test 45, 54
O
Carrying bag 15 Ordering information 92
Circuit-breaker 16 Overheating 49
- thermo-magnetic 53 G
Classification 39, 40 General 40
Client 12, 56, 63 Great Britain 49
P
Collective printout (print all) 29 Group Patient connections 41
Compressing the database 37 - Patient sockets 41, 60 PC software 58, 62
Connecting the DUT 50 PDF file 12, 55
Context menu 28, 29 - Print setup 22
Cool-down period 53
H PE conductor test 52, 64
cool-down period 42 Hardware keyboard 35 Permanently installed equipment 16
Country setting 35 Personnel 9
CSV-Export 63 I Phase position 42
Current consumption 49, 53, 54 Principle of operation 22
Icons 25
Printer 22, 34
Import 31
D Printer type 22
Initial test 49
Pushbutton 16
Damage in transit 9 InsuIation resistance 42
Date 31, 35, 39, 40 Interface 12
Date of next test 63 Interface cable 15 Q
Deleting test steps 61 Interfaces 16 Query filter 12, 24, 30, 58, 62
Details 25 IT system 11
Device functions 67
Device protocol
UNIMET8xxST_D00008_01_M_XXEN/02.2016 95
INDEX
96 UNIMET8xxST_D00008_01_M_XXEN/02.2016
Bender GmbH & Co. KG
P.O. Box 1161 • 35301 Gruenberg • Germany
Londorfer Straße 65 • 35305 Gruenberg • Germany
Tel.: +49 6401 807-0 • Fax: +49 6401 807-259
E-mail: [email protected] • www.bender.de