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ORCIDERMAVSS@DATE 2016: Dresden, Germany
- Adrian Evans, Stefano Di Carlo, Praveen Raghavan, Dimitris Gizopoulos:
Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. CEUR Workshop Proceedings 1566, CEUR-WS.org 2016
Regular papers
- Mohamed Selim, Eric Jeandeau, Cyril Desclèves:
Design-Reliability Flow and Advanced Models Address IC-Reliability Issues. 1-4 - Fabian Oboril, Mehdi Baradaran Tahoori:
Cross-Layer Approaches for an Aging-Aware Design Space Exploration for Microprocessors. 5-8 - Shengyu Duan, Basel Halak, Rick Wong, Mark Zwolinski:
NBTI Lifetime Evaluation and Extension in Instruction Caches. 9-12 - Dimitrios Rodopoulos, Philippe Roussel, Francky Catthoor, Yiannakis Sazeides, Dimitrios Soudris:
Approximating Standard Cell Delay Distributions by Reformulating the Most Probable Failure Point. 13-16 - Theodor Hillebrand, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Reliability-aware design method for CMOS circuits. 17-20 - Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel:
Early failure prediction by using in-situ monitors: Implementation and application results. 21-24 - Illani Mohd Nawi, Basel Halak, Mark Zwolinski:
Ageing Impact on a High Speed Voltage Comparator with Hysteresis. 25-29 - Abhijit K. Deb, Bart Vermeulen, Luc van Dijk:
Overview of Health Monitoring Techniques for Reliability. 30-33 - Haider Abbas, Mark Zwolinski, Basel Halak:
Static Aging Analysis Using 3-Dimensional Delay Library. 34-37 - Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel:
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. 38-40 - Alireza Namazi, Meisam Abdollahi:
LPVM: Low-Power Variation-Mitigant Adder Architecture Using Carry Expedition. 41-44
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