Piezoelectric Sensors & Actuators: MECH 466 Microelectromechanical Systems
Piezoelectric Sensors & Actuators: MECH 466 Microelectromechanical Systems
Piezoelectric Sensors & Actuators: MECH 466 Microelectromechanical Systems
Microelectromechanical Systems
University of Victoria
Dept. of Mechanical Engineering
Lecture 12:
Piezoelectric Sensors & Actuators
Overview
Unstrained Strained
(no net charge change)
Unstrained Strained
(charges cause potential change)
© N. Dechev, University of Victoria 6
Origin of Phenomena of Piezoelectric Effect
x
!L
+++++++++++++++++++++
+V
*** as long as charge remains***
z
- - - - - - - - - - - - - - - - - - - -
x
!L
D = dT + !E
Where: D - Electrical Polarization (C/m2)
T - Stress Vector (N/m2)
d - Piezoelectric Coefficient Matrix
" - Electrical Permitivity Matrix (F/m) (*Note: this is NOT strain*)
E - Electric Field Vector (V/m)
&T1 #
$T !
& D1 # & d11 d12 d13 d14 d15 d16 # $ 2 ! &' 11 ' 12 ' 13 # & E1 #
$ D ! = $d $T !
$ 2 ! $ 21 d 22 d 23 d 24 d 25 d 26 !! $ 3 ! + $$' 21 ' 22 ' 23 !! $$ E 2 !!
T
$% D3 !" $% d 31 d 32 d 33 d 34 d 35 d 36 !" $ 4 ! $%' 31 ' 32 ' 33 !" $% E3 !"
$T5 !
$ !
$%T6 !"
& s1 # & S11 S12 S13 S14 S15 S16 # &T1 # , d11 d 21 d 31 )
$s ! $S * '
$ 2 ! $ 21 S 22 S 23 S 24 S 25 S 26 !! $$T2 !! * d12 d 22 d 32 '
& E1 #
$ s3 ! $ S 31 S 32 S 33 S 34 S 35 S 36 ! $T3 ! * d13 d 23 d 33 ' $ !
$ !=$ !$ ! + * ' E2
$ s 4 ! $ S 41 S 42 S 43 S 44 S 45 S 46 ! $T4 ! * d14 d 24 d 34 ' $ !
$ E3 !
$ s5 ! $ S 51 S 52 S 53 S 54 S 55 S 56 ! $T5 ! ** d15 d 25 d 35 '' % "
$ ! $ !$ !
%$ s 6 "! %$ S 61 S 62 S 63 S 64 S 65 S 66 "! %$T6 "! *+ d16 d 26 d 36 '(
s = dE
The units of the piezoelectric constant, dij, are the units of electric
displacement over the unit of the stress. Therefore:
FV
[ D] [! ][ E ] m m Columb
[d ij33 ] = = = =
[T ] [T ] N N
m2
Recall that:
V = Et
Where: V - Voltage
E - Electric Field
t - distance of interest through E
!
ZnO
- sputtered thin film
- d33=246 pC/N
Quartz
- bulk single crystal
- d33=2.33 pC/N
Diagram of a ‘Sputtering System’ for depositing
piezoelectric materials onto wafers, [Chang Liu]
Polyvinylidene fluoride (PVDF)
- polymer
- d33=1.59 pC/N.
Curie temperature
- temperature above which the piezoelectric property will be lost.
Material purity
- the piezoelectric constant is sensitive to the composition of the
material and can be damaged by defects.
Frequency response
- most materials have sufficient leakage and cannot “hold” a DC
force. The DC response is therefore not superior but can be
improved by materials deposition/preparation conditions.
1 2 slong (t p + t e )( A p E p Ae E e )
=
r 4( E p I p + E e I e )( A p E p + Ae E e ) + ( A p E p Ae E e )(t p + t e ) 2
Where: Ap and Ae are the cross-section areas of the piezoelectric and the elastic
layer, Ep and Ee are the Young’s modulus of the piezoelectric and the elastic layer,
and tp and te are the thickness of the piezoelectric and the elastic layer
Cr/Au
Si3N4
ZnO
Si3N4
Cr
Axis 3 of the deposited ZnO is normal to the front surface of the substrate it is
deposited on. A transverse force would produce a longitudinal tensile stress in
the piezoelectric element (along axis 1), which in turn produces an electric field
and output voltage along axis 3.
The stress along the length of the piezoresistor is actually not uniform and changes
with position. For simplicity, we assume the longitudinal stress is constant and
equals the maximum stress value at the base. The maximum stress induced
along the longitudinal direction of the cantilever is given by:
! 1,max = Mt /(2 I ) = Flt beam / 2 I beam
Please read the article titled: “The Daintiest Dynamos” for homework.