IRF840
IRF840
IRF840
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
• Dynamic dV/dt Rating
VDS (V) 500 Available
RDS(on) (Ω) VGS = 10 V 0.85 • Repetitive Avalanche Rated
• Fast Switching
RoHS*
Qg (Max.) (nC) 63 COMPLIANT
Qgs (nC) 9.3 • Ease of Paralleling
Qgd (nC) 32 • Simple Drive Requirements
Configuration Single • Lead (Pb)-free Available
D
DESCRIPTION
TO-220
Third generation Power MOSFETs from Vishay provide the
designer with the best combination of fast switching,
ruggedized device design, low on-resistance and
G cost-effectiveness.
The TO-220 package is universally preferred for all
S commercial-industrial applications at power dissipation
D levels to approximately 50 W. The low thermal resistance
G S
and low package cost of the TO-220 contribute to its wide
N-Channel MOSFET acceptance throughout the industry.
ORDERING INFORMATION
Package TO-220
IRF840PbF
Lead (Pb)-free
SiHF840-E3
IRF840
SnPb
SiHF840
VGS
Top 15 V
10 V 150 °C
8.0 V 101
7.0 V
101 6.0 V
5.5 V
5.0 V
25 °C
Bottom 4.5 V
100
4.5 V
100 101 4 5 6 7 8 9 10
91070_01 VDS, Drain-to-Source Voltage (V) 91070_03 VGS, Gate-to-Source Voltage (V)
3.0
RDS(on), Drain-to-Source On Resistance
VGS ID = 8.0 A
Top 15 V VGS = 10 V
101 10 V 2.5
8.0 V
ID, Drain Current (A)
7.0 V
2.0
(Normalized)
6.0 V
5.5 V 4.5 V
5.0 V 1.5
Bottom 4.5 V
1.0
100 0.5
20 µs Pulse Width
TC = 150 °C
0.0
100 101 - 60 - 40 - 20 0 20 40 60 80 100 120 140 160
91070_02 VDS, Drain-to-Source Voltage (V) 91070_04 TJ, Junction Temperature (°C)
Fig. 2 - Typical Output Characteristics, TC = 150 °C Fig. 4 - Normalized On-Resistance vs. Temperature
2500
VGS = 0 V, f = 1 MHz
101
1500 Ciss
25 °C
1000
Coss
500
Crss
VGS = 0 V
0 100
100 0.4 0.6 0.8 1.0 1.2 1.4
101
91070_05 VDS, Drain-to-Source Voltage (V) 91070_07 VSD, Source-to-Drain Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage Fig. 7 - Typical Source-Drain Diode Forward Voltage
20 102
ID = 8.0 A Operation in this area limited
VGS, Gate-to-Source Voltage (V)
5 by RDS(on)
16 VDS = 400 V 10 µs
2
ID, Drain Current (A)
VDS = 250 V
10
VDS = 100 V 100 µs
12 5
2 1 ms
8
1
10 ms
5
4
TC = 25 °C
For test circuit 2 TJ = 150 °C
see figure 13 Single Pulse
0 0.1
2 5 2 5 2 5 2 5 2 5
0 15 30 45 60 75 0.1 1 10 102 103 104
91070_06 QG, Total Gate Charge (nC) 91070_08 VDS, Drain-to-Source Voltage (V)
Fig. 6 - Typical Gate Charge vs. Drain-to-Source Voltage Fig. 8 - Maximum Safe Operating Area
RD
VDS
VGS
8.0 D.U.T.
RG
+
- VDD
ID, Drain Current (A)
6.0 10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
4.0
Fig. 10a - Switching Time Test Circuit
2.0
VDS
90 %
0.0
25 50 75 100 125 150
Fig. 9 - Maximum Drain Current vs. Case Temperature Fig. 10b - Switching Time Waveforms
10
Thermal Response (ZthJC)
1
0 - 0.5
0.2
0.1 0.1 PDM
0.05
0.02 Single Pulse
0.01 t1
(Thermal Response)
10-2 t2
Notes:
1. Duty Factor, D = t1/t2
2. Peak Tj = PDM x ZthJC + TC
10-3
10-5 10-4 10-3 10-2 0.1 1 10 102
L
VDS VDS
Vary tp to obtain tp
required IAS
VDD
RG D.U.T. +
V DD
- VDS
IAS
10 V
tp 0.01 Ω
IAS
Fig. 12a - Unclamped Inductive Test Circuit Fig. 12b - Unclamped Inductive Waveforms
1200
ID
600
400
200
VDD = 50 V
0
25 50 75 100 125 150
Current regulator
Same type as D.U.T.
50 kΩ
QG
12 V 0.2 µF
10 V 0.3 µF
+
QGS QGD VDS
D.U.T. -
VG VGS
3 mA
Charge IG ID
Current sampling resistors
Fig. 13a - Basic Gate Charge Waveform Fig. 13b - Gate Charge Test Circuit
- +
-
RG • dV/dt controlled by RG +
• Driver same type as D.U.T. VDD
-
• ISD controlled by duty factor "D"
• D.U.T. - device under test
VGS = 10 V*
Reverse
recovery Body diode forward
current current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
VDD
Re-applied
voltage Body diode forward drop
Inductor current
Ripple ≤ 5 % ISD
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91070.
Disclaimer
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