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ORCIDMarcelo Lubaszewski
Marcelo Soares Lubaszewski
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2020 – today
- 2023
[c105]Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen:
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI 2023: 1-6- 2022
- [c104]Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen:
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS 2022: 1-6 - 2020
- [c103]João Carlos Britto Filho, Marcelo Lubaszewski:
A Highly Reliable Wearable Device for Fall Detection. LATS 2020: 1-7
2010 – 2019
- 2019
- [e2]João Antonio Martino, Marcelo Lubaszewski, Matteo Sonza Reorda:
Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design, SBCCI 2019, Sao Paulo, Brazil, August 26-30, 2019. ACM 2019, ISBN 978-1-4503-6844-5 [contents] - 2016
- [c102]E. Petitprez, Dalton M. Colombo
, Felipe M. Henes, Laurent Courcelle, R. Tararam, S. Jacobsen, R. Soares, C. Krug, Marcelo Lubaszewski:
Successful prototyping of complex integrated circuits with focused ion beam. SBCCI 2016: 1-5 - 2015
- [j31]Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen:
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55(12): 2833-2844 (2015) - [c101]Francisco O. O. Gomes, Luciano de Paula, Joao C. S. Santos, Laurent Courcelle, Daniel Piovani, Filipe Viera, Felipe M. Henes, Marcelo Lubaszewski:
A low-power RFID enabled temperature sensor for cold chain management. ISCAS 2015: 2113-2116 - [c100]Rafael Cantalice, Alexandre Simionovski, Fernando Paixão Cortes, Marcelo Lubaszewski:
Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications. SBCCI 2015: 22:1-22:5 - 2014
- [c99]Fernando da Rocha Paixão Cortes, Juan Pablo Martinez Brito, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski:
A power management system architecture for LF passive RFID tags. LASCAS 2014: 1-4 - [c98]Fernando Paixão Cortes, Juan Pablo Martinez Brito, Rafael Cantalice, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski:
A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing. IEEE RFID 2014: 60-66 - [c97]Alfredo Olmos, Juan Pablo Martinez Brito, Fabrício Jorge Antunes Ferreira, Fernando Chávez, Marcelo Soares Lubaszewski:
A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference. SBCCI 2014: 26:1-26:5 - 2013
- [c96]Alexandre M. Amory, Matheus T. Moreira, Ney Laert Vilar Calazans, Fernando Gehm Moraes, Cristiano Lazzari, Marcelo Soares Lubaszewski:
Evaluating the scalability of test buses. ISSoC 2013: 1-6 - [c95]Alexandre M. Amory, Edson I. Moreno, Fernando Moraes, Marcelo Lubaszewski:
Determining the test sources/sinks for NoC TAMs. ISVLSI 2013: 8-13 - [c94]Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski:
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI 2013: 188-193 - 2012
- [c93]Marcelo de Souza Moraes, Marcos Barcellos Hervé, Marcelo Lubaszewski:
Low pin count DfT technique for RFID ICs. DFT 2012: 31-36 - [c92]Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez:
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW 2012: 1-6 - 2011
- [j30]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider, Renato V. B. Henriques:
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. J. Electron. Test. 27(4): 551-564 (2011) - [j29]Marcos Barcellos Hervé, Marcelo de Souza Moraes, Pedro Almeida, Marcelo Lubaszewski, Fernanda Lima Kastensmidt, Érika F. Cota:
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers. J. Electron. Test. 27(5): 635-646 (2011) - [j28]Caroline Concatto, João Almeida, Guilherme Fachini, Marcos Hervé, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski:
Improving the yield of NoC-based systems through fault diagnosis and adaptive routing. J. Parallel Distributed Comput. 71(5): 664-674 (2011) - [j27]Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes:
A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms. J. Parallel Distributed Comput. 71(5): 675-686 (2011) - [j26]Renato P. Ribas, Simone Bavaresco, N. Schuch, Vinicius Callegaro, Marcelo Lubaszewski, André Inácio Reis:
Contributions to the evaluation of ensembles of combinational logic gates. Microelectron. J. 42(2): 371-381 (2011) - [c91]Alexandre M. Amory, Luciano Ost, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski:
Evaluating energy consumption of homogeneous MPSoCs using spare tiles. DATE 2011: 1164-1167 - [c90]Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski:
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW 2011: 1-6 - [c89]Alexandre M. Amory, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski:
Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time. International Symposium on Rapid System Prototyping 2011: 164-170 - [c88]Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes:
Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs. SBCCI 2011: 73-78 - 2010
- [c87]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS 2010: 261 - [c86]Tiago R. Balen, Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques. IOLTS 2010: 136 - [c85]Matheus Braga, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski:
Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects. ISCAS 2010: 4101-4104 - [c84]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Diversity TMR: Proof of concept in a mixed-signal case. LATW 2010: 1-6 - [c83]Luiz Fernando Gonçalves, Eduardo Luis Schneider, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel:
Fault prediction in electrical valves using temporal Kohonen maps. LATW 2010: 1-6 - [c82]Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski:
Concurrent test of Network-on-Chip interconnects and routers. LATW 2010: 1-6 - [c81]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI 2010: 134-139 - [c80]Mariza Botelho, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Érika F. Cota, Luigi Carro:
A broad strategy to detect crosstalk faults in network-on-chip interconnects. VLSI-SoC 2010: 298-303 - [c79]Marcelo Lubaszewski, Érika F. Cota:
Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. VTS 2010: 354
2000 – 2009
- 2009
- [j25]Marcelo Lubaszewski, Andrew Richardson, C. C. Su:
Guest editorial. Microelectron. J. 40(7): 1041 (2009) - [c78]Marcelo Lubaszewski:
Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? DFT 2009: 224-224 - [c77]Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé:
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. IOLTS 2009: 61-66 - [c76]Renato P. Ribas, Simone Bavaresco, Marcelo Lubaszewski, André Inácio Reis:
Efficient Test Circuit to Qualify Logic Cells. ISCAS 2009: 2733-2736 - [c75]Marcos Barcellos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski:
NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time. LATW 2009: 1-6 - [c74]Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth:
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW 2009: 1-6 - [c73]Marcos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski:
Diagnosis of interconnect shorts in mesh NoCs. NOCS 2009: 256-265 - [c72]Érika F. Cota, Luigi Carro, Felipe Pinto, Ricardo Augusto da Luz Reis, Marcelo Lubaszewski:
Resource-and-time-aware test strategy for configurable quaternary logic blocks. SBCCI 2009 - [c71]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Renato V. B. Henriques, Marcelo Lubaszewski:
Design of an embedded system for the proactive maintenance of electrical valves. SBCCI 2009 - 2008
- [j24]Érika F. Cota, Fernanda Gusmão de Lima Kastensmidt, Maico Cassel, Marcos Hervé, Pedro Almeida, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski:
A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. IEEE Trans. Computers 57(9): 1202-1215 (2008) - [j23]Bozena Kaminska, Marcelo Lubaszewski, José Machado da Silva:
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. VLSI Design 2008: 165673:1-165673:2 (2008) - [c70]Carlos Roberto Moratelli, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski:
A fault-tolerant, DFA-resistant AES core. ISCAS 2008: 244-247 - [c69]Felipe Ghellar, Marcelo Lubaszewski:
A novel AES cryptographic core highly resistant to differential power analysis attacks. SBCCI 2008: 140-145 - [e1]Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta:
Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008. ACM 2008, ISBN 978-1-60558-231-3 [contents] - 2007
- [j22]Marcelo Lubaszewski, Andrew Richardson, C. C. Su:
Guest Editorial. J. Electron. Test. 23(6): 469 (2007) - [j21]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007) - [j20]Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes:
Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. IET Comput. Digit. Tech. 1(3): 197-206 (2007) - [c68]Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell:
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197 - [c67]Érika F. Cota, Fernanda Lima Kastensmidt, Maico Cassel, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski:
Redefining and testing interconnect faults in Mesh NoCs. ITC 2007: 1-10 - [c66]Alexandre M. Amory, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes:
DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. VTS 2007: 435-440 - [i1]Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. CoRR abs/0710.4795 (2007) - 2006
- [c65]Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes:
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. ETS 2006: 213-218 - [c64]Carlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski:
A cryptography core tolerant to DFA fault attacks. SBCCI 2006: 190-195 - [c63]Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski:
Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213 - [c62]Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes:
Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319 - [c61]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - 2005
- [j19]Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell:
A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electron. Test. 21(1): 9-16 (2005) - [j18]Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21(2): 135-146 (2005) - [j17]Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36(12): 1112-1123 (2005) - [c60]Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. DATE 2005: 62-63 - [c59]Alexandre M. Amory, Eduardo Wenzel Brião, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes:
A scalable test strategy for network-on-chip routers. ITC 2005: 9 - [c58]Marcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski:
A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI 2005: 68-73 - [c57]Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394 - 2004
- [j16]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu:
Searching for Global Test Costs Optimization in Core-Based Systems. J. Electron. Test. 20(4): 357-373 (2004) - [j15]Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell:
A New FPGA for DSP Applications Integrating BIST Capabilities. J. Electron. Test. 20(4): 423-431 (2004) - [j14]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski:
Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004) - [c56]Marcelo Lubaszewski, José Luis Huertas:
Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials 2004: 183-212 - [c55]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902 - [c54]Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski:
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI 2004: 105-110 - [c53]Alexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes:
Reducing test time with processor reuse in network-on-chip based systems. SBCCI 2004: 111-116 - [c52]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388 - 2003
- [j13]L. Cassol, O. Betat, Luigi Carro, Marcelo Lubaszewski:
The SigmaDelta-BIST Method Applied to Analog Filters. J. Electron. Test. 19(1): 13-20 (2003) - [c51]Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski:
Power-aware NoC Reuse on the Testing of Core-based Systems. ITC 2003: 612-621 - [c50]José Vicente Calvano, Marcelo Lubaszewski:
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256 - [c49]Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis:
SIFU! - A Didactic Stuck-at Fault Simulator. MSE 2003: 93-94 - [c48]Érika F. Cota, Márcio Eduardo Kreutz, Cesar A. Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin:
The Impact of NoC Reuse on the Testing of Core-based Systems. VTS 2003: 128-133 - 2002
- [c47]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu:
Test Planning and Design Space Exploration in a Core-Based Environment. DATE 2002: 478-485 - [c46]Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell:
A New FPGA for DSP Applications Integrating BIST Capabilities. LATW 2002: 76-81 - [c45]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. LATW 2002: 83-85 - [c44]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves:
State Model Approach for Analog Fault Modeling. LATW 2002: 86-88 - [c43]Érika F. Cota, Luigi Carro, Alex Orailoglu, Marcelo Lubaszewski:
Generic and Detailed Search for TAM Definition in Core-Based Systems. LATW 2002: 160-164 - [c42]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski:
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW 2002: 174-179 - [c41]Felipe S. Marques, Vinícius P. Correia, A. Prado, Marcelo Lubaszewski, André Inácio Reis:
Testability Properties of BDDs. SBCCI 2002: 83-88 - [c40]José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski:
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206 - 2001
- [j12]Marcelo Lubaszewski, Víctor H. Champac:
Guest Editorial. J. Electron. Test. 17(2): 83-84 (2001) - [j11]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17(2): 121-138 (2001) - [j10]Érika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis:
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electron. Test. 17(2): 149-161 (2001) - [j9]Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski:
Concepção de Circuitos e Sistemas Integrados. RITA 8(1): 7-21 (2001) - [c39]Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski:
Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC 2001: 437-448 - [c38]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Filter Sensitivity Analysis Using the TRAM. LATW 2001: 80-83 - [c37]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing Testable Networks for Transfer Function Realization. LATW 2001: 84-87 - [c36]L. Cassol, Luigi Carro, Marcelo Lubaszewski:
The Sigma-Delta-Bist Method Applied to Linear Analog Circuits. LATW 2001: 126-130 - [c35]Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski:
An Analog-based Approach for MEMS Testing. LATW 2001: 200-203 - [c34]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski:
A Test Method for a Broad Class of DSP Circuits. LATW 2001: 214-219 - [c33]André C. Nácul, Luigi Carro, Daniel Janner, Marcelo Lubaszewski:
A BIST Procedure for Analog Mixers in Software Radio. SBCCI 2001: 103-108 - 2000
- [j8]Érika F. Cota, Marcelo Negreiros, Luigi Carro, Marcelo Lubaszewski:
A new adaptive analog test and diagnosis system. IEEE Trans. Instrum. Meas. 49(2): 223-227 (2000) - [j7]Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois:
Design of self-checking fully differential circuits and boards. IEEE Trans. Very Large Scale Integr. Syst. 8(2): 113-128 (2000) - [c32]Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell:
TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83 - [c31]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96- - [c30]Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski:
Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-230 - [c29]Margrit Reni Krug, Marcelo Lubaszewski, José Manuel Martins Ferreira, Gustavo Ribeiro da Costa Alves:
Implementing a Self-Checking PROFIBUS Slave. LATW 2000: 4-8 - [c28]Fernanda Gusmão de Lima, Eduardo D'Avila, Mauricio Moraes, Marcelo Lubaszewski, Ricardo Reis:
A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing. LATW 2000: 15-19 - [c27]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski:
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. LATW 2000: 84-87 - [c26]Luigi Carro, Michel Renovell, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs:
On the Temperature Dependencies of Analog BIST. LATW 2000: 88-93 - [c25]Érika F. Cota, Marcelo Lubaszewski, Raoul Velasco, Sana Rezgui:
Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults. LATW 2000: 134-139 - [c24]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
The Use of Macromodels on Op-Amp Circuits Fault Modeling. LATW 2000: 188-192 - [c23]Luigi Carro, Luciano Agostini, Roberto Pacheco, Marcelo Lubaszewski:
Using Reconfigurability Features to Break Down Test Costs: a Case Study. LATW 2000: 209-214 - [c22]André Inácio Reis, A. Prado, Marcelo Lubaszewski:
Testability Properties of Vertex Precedent BDDs. SBCCI 2000: 15-20 - [c21]Fernanda Gusmão de Lima, Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Ricardo Reis, Raoul Velazco, Sana Rezgui:
Designing a Radiation Hardened 8051-Like Micro-Controller. SBCCI 2000: 255-262 - [c20]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho:
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI 2000: 289-294 - [c19]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324
1990 – 1999
- 1999
- [c18]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski:
A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE 1999: 184-188 - [c17]Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. ITC 1999: 319-328 - [c16]Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
Design and Test of MEMs. VLSI Design 1999: 270- - 1998
- [j6]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12(1-2): 81-92 (1998) - [j5]Marcelo Lubaszewski, Bernard Courtois:
A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998) - [c15]Jaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis:
An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium 1998: 290-295 - [c14]Marcelo Lubaszewski:
Bridging the Gap between Microelectronics and Micromechanics Testing. Asian Test Symposium 1998: 513 - [c13]Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois:
Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-528 - [c12]Marcelo Lubaszewski, Michel Renovell, Salvador Mir, Florence Azaïs, Yves Bertrand:
A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal Testing. SBCCI 1998: 175-178 - [c11]Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson:
Testing MEMS. VTS 1998: 320-321 - 1997
- [j4]Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski:
A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comput. Soc. 4(2) (1997) - 1996
- [j3]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. 9(1-2): 43-57 (1996) - [j2]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Unified built-in self-test for fully differential analog circuits. J. Electron. Test. 9(1-2): 135-151 (1996) - [c10]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 - [c9]Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik:
Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC 1996: 254-258 - [c8]Marcelo Lubaszewski, Salvador Mir, Leandro Pulz:
ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603 - [c7]Fabrizio Francesconi, Valentino Liberali, Marcelo Lubaszewski, Salvador Mir:
Design of high-performance band-pass sigma-delta modulator with concurrent error detection. ICECS 1996: 1202-1205 - 1995
- [j1]Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Analog checkers with absolute and relative tolerances. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 607-612 (1995) - [c6]Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois:
Mixed-signal circuits and boards for high safety applications. ED&TC 1995: 34-41 - [c5]Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin. VTS 1995: 54-59 - 1994
- [c4]Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois:
Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490 - [c3]Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois:
Designing self-exercising analogue checkers. VTS 1994: 252-257 - 1993
- [c2]Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati:
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657 - 1992
- [c1]Marcelo Lubaszewski, Bernard Courtois:
On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
Coauthor Index
Tiago R. Balen
aka: Tiago Roberto Balen
aka: Tiago Roberto Balen
Fernanda Lima Kastensmidt
aka: Fernanda Gusmão de Lima Kastensmidt
aka: Fernanda Gusmão de Lima
aka: Fernanda Lima 0001
aka: Fernanda Gusmão de Lima Kastensmidt
aka: Fernanda Gusmão de Lima
aka: Fernanda Lima 0001
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