Advanced Process Technology Dynamic DV/DT Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated
Advanced Process Technology Dynamic DV/DT Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated
Advanced Process Technology Dynamic DV/DT Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated
IRF3415
HEXFET® Power MOSFET
l Advanced Process Technology
D
l Dynamic dv/dt Rating VDSS = 150V
l 175°C Operating Temperature
l Fast Switching
RDS(on) = 0.042Ω
l Fully Avalanche Rated G
Description ID = 43A
S
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
Thermal Resistance
Parameter Typ. Max. Units
RθJC Junction-to-Case ––– 0.75
RθCS Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W
RθJA Junction-to-Ambient ––– 62
5/13/98
IRF3415
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 150 ––– ––– V VGS = 0V, ID = 250µA
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 0.17 ––– V/°C Reference to 25°C, ID = 1mA
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.042 Ω VGS = 10V, ID = 22A
VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250µA
gfs Forward Transconductance 19 ––– ––– S VDS = 50V, ID = 22A
––– ––– 25 VDS = 150V, VGS = 0V
IDSS Drain-to-Source Leakage Current µA
––– ––– 250 VDS = 120V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
IGSS nA
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -20V
Qg Total Gate Charge ––– ––– 200 ID = 22A
Qgs Gate-to-Source Charge ––– ––– 17 nC VDS = 120V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 98 VGS = 10V, See Fig. 6 and 13
td(on) Turn-On Delay Time ––– 12 ––– VDD = 75V
tr Rise Time ––– 55 ––– ID = 22A
ns
td(off) Turn-Off Delay Time ––– 71 ––– RG = 2.5Ω
tf Fall Time ––– 69 ––– RD = 3.3Ω, See Fig. 10
Between lead, D
LD Internal Drain Inductance ––– 4.5 –––
6mm (0.25in.)
nH G
from package
LS Internal Source Inductance ––– 7.5 –––
and center of die contact S
VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 22A, VGS = 0V
trr Reverse Recovery Time ––– 260 390 ns TJ = 25°C, IF = 22A
Qrr Reverse RecoveryCharge ––– 2.2 3.3 µC di/dt = 100A/µs
Notes:
Repetitive rating; pulse width limited by ISD ≤ 22A, di/dt ≤ 820A/µs, VDD ≤ V(BR)DSS,
max. junction temperature. ( See fig. 11 ) TJ ≤ 175°C
VDD = 25V, starting TJ = 25°C, L = 2.4mH Pulse width ≤ 300µs; duty cycle ≤ 2%.
RG = 25Ω, IAS = 22A. (See Figure 12)
IRF3415
7.0V 7.0V
6.0V 6.0V
5.5V 5.5V
5.5V
5.0V 5.5V
5.0V
BOTTOM 4.5V BOTTOM 4.5V
100 100
4.5V 4.5V
1000 3.0
ID = 37A
R DS(on) , Drain-to-Source On Resistance
I D , Drain-to-Source Current (A)
2.5
2.0
(Normalized)
TJ = 25 ° C
100 1.5
TJ = 175 ° C
1.0
0.5
V DS = 50V
20µs PULSE WIDTH VGS = 10V
10 0.0
4 5 6 7 8 9 10 -60 -40 -20 0 20 40 60 80 100 120 140 160 180
VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( oC)
6000 20
VGS = 0V, f = 1MHz ID = 22A
Ciss = Cgs + Cgd , Cds SHORTED VDS = 120V
Crss = Cgd VDS = 75V
4000
12
Ciss
3000
8
2000 Coss
Crss
4
1000
1000 1000
OPERATION IN THIS AREA LIMITED
BY RDS(on)
ISD , Reverse Drain Current (A)
100
I D , Drain Current (A)
100 10us
TJ = 175 o C
10 100us
TJ = 25 o C 10
1ms
1
TC = 25 o C 10ms
TJ = 175 o C
V GS = 0 V Single Pulse
0.1 1
0.2 0.6 1.0 1.4 1.8 1 10 100 1000
VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V)
50
RD
VDS
VGS
D.U.T.
40
RG
+
-VDD
I D , Drain Current (A)
30 10V
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
20
Fig 10a. Switching Time Test Circuit
10 VDS
90%
0
25 50 75 100 125 150 175
TC , Case Temperature ( °C)
10%
VGS
Fig 9. Maximum Drain Current Vs. td(on) tr t d(off) tf
Case Temperature
Fig 10b. Switching Time Waveforms
1
Thermal Response (Z thJC )
D = 0.50
0.20
0.1 0.10
P DM
0.05
t1
0.02 t2
SINGLE PULSE
0.01 (THERMAL RESPONSE)
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
1400
ID
RG D .U .T +
V 600
- DD
IA S A
20V
tp 0 .0 1 Ω 400
0
25 50 75 100 125 150 175
V (B R )D SS Starting TJ , Junction Temperature (oC)
tp
IAS
Current Regulator
Fig 12b. Unclamped Inductive Waveforms Same Type as D.U.T.
50KΩ
12V .2µF
QG .3µF
+
10 V V
QGS QGD D.U.T. - DS
VGS
VG
3mA
IG ID
Charge Current Sampling Resistors
Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit
IRF3415
+
- +
-
RG • dv/dt controlled by RG +
• Driver same type as D.U.T. VDD
-
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
VGS=10V *
Reverse
Recovery Body Diode Forward
Current Current
di/dt
D.U.T. VDS Waveform
Diode Recovery
dv/dt
VDD
Re-Applied
Voltage Body Diode Forward Drop
Inductor Curent
Ripple ≤ 5% ISD
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 5/98
This datasheet has been download from:
www.datasheetcatalog.com